Home > News > Test tools face nanotech challenge
November 14th, 2005
Test tools face nanotech challenge
Abstract:
Characterising nanodevices like carbon nanotubes (CNTs) and single electron transistors (SETs) presents special challenges in R&D settings. Testing these kinds of devices in a manner that will not introduce measurement errors and characterising their electrical performance without damaging or destroying them can be especially challenging. Pulse mode measurement techniques offer the best alternative to traditional DC current-voltage (I-V) characterisation because they prevent the joule heating that might otherwise damage or destroy the device under test (DUT) or skew the results, making them meaningless.
Source:
electronicsweekly.com
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