Nanotechnology Now

• About Us
  
  • Advertising
  • Our Mission
  • Our Team
  • Comments
  • Friends
  • Contact
• Nanotechnology
• News
  
  • Current News
  • Press Releases
  • Submit Press
  • Press kit
  • Interviews
• Columns
• Products
  
  • Our Products
  • Books
  • Featured Books
• Directories
  
  • Companies/Academic
  • Events
  • Glossary
  • Best Of
• Career Center
• Nano-Social Network
• Nano Consulting
• My Account

Home > News > Test tools face nanotech challenge

November 14th, 2005

Test tools face nanotech challenge

Abstract:
Characterising nanodevices like carbon nanotubes (CNTs) and single electron transistors (SETs) presents special challenges in R&D settings. Testing these kinds of devices in a manner that will not introduce measurement errors and characterising their electrical performance without damaging or destroying them can be especially challenging. Pulse mode measurement techniques offer the best alternative to traditional DC current-voltage (I-V) characterisation because they prevent the joule heating that might otherwise damage or destroy the device under test (DUT) or skew the results, making them meaningless.

Source:
electronicsweekly.com

Bookmark:

Related News Press

Tools

Colored diamonds are a superconductor’s best friend March 6th, 2014

Take Your Best Shot! JEOL Launches SEM/TEM Image Contest March 6th, 2014

Nanopositioning Stage & Digital Controller for Imaging, Surface Metrology and Microscopy Available from PI March 6th, 2014

Elmarco Enabled Industrial Electrospinning Technology for Laboratories: Elmarco introduces NS LAB, the electrospinning research tool designed for the needs of universities and research institutes March 6th, 2014

	The latest news from around the world, FREE

Premium Products
	Only the news you want to read!  Learn More
	University Technology Transfer & Patents  Learn More
	Full-service, expert consulting  Learn More

Nanotechnology Now Featured Books