Home > News > Nanometrology in Measurement Science and Technology
September 26th, 2005
Nanometrology in Measurement Science and Technology
Abstract:
The November issue of Measurement Science and Technology includes a special feature on Nanometrology edited by Dr M Postek of NIST, USA.
Source:
IoP
Bookmark:
Announcements
Glowing Plant Releases Maker Kit, Enabling Anyone to Make a Glowing Plant at Home: Glowing Plant seeks funds via crowdfunding and raises almost $400,000 May 23rd, 2013
IDTechEx launches online Market Intelligence Portal May 23rd, 2013
UofL scientists uncover how grapefruits provide a secret weapon in medical drug delivery May 22nd, 2013
Atomic-Scale Investigations Solve Key Puzzle of LED Efficiency: MIT and Brookhaven Lab scientists use electron microscopy imaging techniques to settle a solid-state controversy and raise new experimental possibilities May 22nd, 2013
Tools
Precision Positioning Systems go Nano: New Miniaturized Piezo-Motor Driven Nanopositioning Stage by PI May 22nd, 2013
Researchers Stitch Defects into the World’s Thinnest Semiconductor May 22nd, 2013
Whirlpools on the Nanoscale Could Multiply Magnetic Memory: At the Advanced Light Source, Berkeley Lab scientists join an international team to control spin orientation in magnetic nanodisks May 22nd, 2013
Atomic-Scale Investigations Solve Key Puzzle of LED Efficiency: MIT and Brookhaven Lab scientists use electron microscopy imaging techniques to settle a solid-state controversy and raise new experimental possibilities May 22nd, 2013