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New generation image analysis system for the fully automated characterization of particle shape and size
Malvern Instruments will launch a new generation image analysis system for the fully automated characterization of particle shape and size at Pittcon 2005 (27 Feb – 1 Mar 2005; Orlando, USA). The company will also exhibit systems from its comprehensive range of analytical instruments for particle size measurement and rheological applications. These will include the Zetasizer Nano for the characterization of nano-sized particles, proteins, and molecules in solution; the industry-leading Mastersizer 2000 laser-diffraction-based particle size analyzer; and the Gemini stress and strain controlled rheometer.
New product launch – FPIA-3000
Malvern’s FPIA-3000 new generation image analysis system for the fully automated characterization of particle shape and size builds on the success of the existing FPIA-2100 flow cytometry-based analyzer, adding new features and extending the range of applications.
Particle shape analysis has become a critical parameter in many industrial processes. This has fuelled demand for increasingly sensitive analytical systems that can be used to detect very subtle variations in particle size and shape.in a quick, easy and routine manner.
Key amongst the new features of the FPIA-3000 is its ability to measure across a wide particle size range. The standard instrument configuration allows the characterization of particles from 1.5 to 160 microns. High and low magnification options cover the ranges 0.8 to 80 microns and 12 to 300 microns respectively. Sample volumes as low as 1ml can be used and every single particle image is now stored for future reference and analysis. Powerful new software brings access to a whole range of new shape and size parameters, such as particle width, length, aspect ratio and convexity, as well as improved threshold control that allows more sensitive edge detection for use with transparent particles for example.
The FPIA-3000 operates using the same proven principles as its predecessor, measuring particles suspended in aqueous and non-aqueous liquid media. Using a CCD camera and strobe illumination, the system produces images of each suspended particle. Samples pass through a sheath flow cell that transforms the particle suspension into a narrow, flat flow, ensuring that the largest area of the particle is oriented towards the camera and that all particles are in focus. Measurement is complete in just two and a half minutes.
Zetasizer Nano – latest software packages
The Zetasizer Nano is becoming the system of choice in a wide range of nano-particle applications, from the routine characterization of proteins to the investigation of new and exciting particulates at the leading edge of materials research and development. Full details of the latest software packages, the complete range of options, and new resources for protein researchers on Malvern’s website will be available.
Gemini rheometer – advanced, modular, compact
The recently introduced Gemini is an advanced, modular and compact rheometer with 'fluids to solids' capability. Optimized for strain-and stress-controlled operation, it has wide application in research and product development.
Mastersizer 2000 – industry leading
The Malvern Mastersizer 2000 laser difrraction based particle size analyzer can be used to characterize emulsions, suspensions and dry powders, measuring particles across a broad size range from 0.02 to 2000 mm. It is fully automated with a comprehensive software package that allows the rapid development of standard operating procedures (SOPs) and customized results presentation. The system is completely flexible with a wide range of sample dispersion units that are easy to install and use, making even switching between wet and dry measurements a moment’s task.
Malvern technical and applications experts will be on the booth to discuss the latest developments for all the company’s systems and advise on individual materials characterization requirements.
For full product details and access to Malvern’s extensive web-based education and training resources visit www.malvern.co.uk
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
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