Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > News > Thin-film polymers buckle up for measurement

July 16th, 2004

Thin-film polymers buckle up for measurement

Researchers at the National Institute of Standards and Technology and IBM Research, both in the US, have measured the stiffness of extremely thin polymer films by causing the films to buckle. Their new SIEBIMM (strain-induced elastic buckling instability for mechanical measurements) technique takes just a couple of seconds, is relatively cheap and doesn't require material-specific modelling.


Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press


Imaging technique pulls plasmon data together: Rice University scientists' hyperspectral method analyzes many plasmonic nanoparticles in an instant March 16th, 2018

Movable silicon 'lenses' enable neutrons to see new range of details inside objects March 15th, 2018

Jim Barnhart Joins Nanometrics as Senior Vice President of Operations March 15th, 2018

Department of Materials Test Engineering (WPT) at TU Dortmund University uses Deben CT5000TEC stage to perform X-ray micro-tomography experiments for better understanding of damage progression in composite materials March 13th, 2018

The latest news from around the world, FREE

  Premium Products
Only the news you want to read!
 Learn More
Full-service, expert consulting
 Learn More

Nanotechnology Now Featured Books


The Hunger Project