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Home > News > Thin-film polymers buckle up for measurement

July 16th, 2004

Thin-film polymers buckle up for measurement

Abstract:
Researchers at the National Institute of Standards and Technology and IBM Research, both in the US, have measured the stiffness of extremely thin polymer films by causing the films to buckle. Their new SIEBIMM (strain-induced elastic buckling instability for mechanical measurements) technique takes just a couple of seconds, is relatively cheap and doesn't require material-specific modelling.

Source:
Nanotechweb

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