Home > News > Thin-film polymers buckle up for measurement
July 16th, 2004
Thin-film polymers buckle up for measurement
Researchers at the National Institute of Standards and Technology and IBM Research, both in the US, have measured the stiffness of extremely thin polymer films by causing the films to buckle. Their new SIEBIMM (strain-induced elastic buckling instability for mechanical measurements) technique takes just a couple of seconds, is relatively cheap and doesn't require material-specific modelling.
WITec to host the 11th Confocal Raman Imaging Symposium from September 29th - October 1st in Ulm, Germany July 28th, 2014
FEI adds Phase Plate Technology and Titan Halo TEM to its Structural Biology Product Portfolio: New solutions provide the high-quality imaging and contrast necessary to analyze the 3D structure of molecules and molecular complexes July 28th, 2014
Bruker Announces Acquisition of High-Speed, 3D Super-Resolution Fluorescence Microscopy Company Vutara July 28th, 2014
Malvern Instruments completes acquisition of MicroCal and announces purchase of Archimedes product from Affinity Biosensors July 25th, 2014