Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > News > Software corrects chip errors early

May 10th, 2004

Software corrects chip errors early

Microchip miniaturization is making quality control-related measurement of features during the production process increasingly difficult. New National Institute of Standards and Technology software and research results should help manufacturers reduce errors in measuring microchip features which today measure less than 37 nanometers in width and are expected to shrink to 25 nanometers by 2007.


Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Chip Technology

Nanoantenna lighting-rod effect produces fast optical switches October 24th, 2016

Unusual quantum liquid on crystal surface could inspire future electronics October 22nd, 2016

Scientists find technique to improve carbon superlattices for quantum electronic devices: In a paradigm shift from conventional electronic devices, exploiting the quantum properties of superlattices holds the promise of developing new technologies October 20th, 2016

Exploring defects in nanoscale devices for possible quantum computing applications October 19th, 2016


Nanosciences: Genes on the rack October 21st, 2016

Smashing metallic cubes toughens them up: Rice University scientists fire micro-cubes at target to change their nanoscale structures October 20th, 2016

EM Resolutions announce the availability of Kleindiek Nanotechnik’s new cryo microgripper for cryo-FIB lift-out October 18th, 2016

The University of Applied Sciences in Upper Austria uses Deben tensile stages as an integral part of their computed tomography research and testing facility October 18th, 2016

The latest news from around the world, FREE

  Premium Products
Only the news you want to read!
 Learn More
University Technology Transfer & Patents
 Learn More
Full-service, expert consulting
 Learn More

Nanotechnology Now Featured Books


The Hunger Project