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Home > News > nPoint Introduces Enhanced Scanning Control Mode

March 1st, 2004

nPoint Introduces Enhanced Scanning Control Mode

Abstract:
nPoint, Inc., the global leader in ultra-precision motion and control nanopositioners for nanoscale research and
manufacturing, has announced an enhanced scanning control mode for nanopositioning stages that incorporates digital signal processing (DSP) for precision response at high scan speeds. Nanopositioners are key components in scanning probe microscopes (SPMs) including atomic force microscopes (AFMs) and related instruments used in nanotechnology. The enhanced scanning control mode is part of the overall nanopositioner controller.

Source:
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