Nanotechnology Now

• About Us
  
  • Advertising
  • Our Mission
  • Our Team
  • Comments
  • Friends
  • Contact
• Nanotechnology
• News
  
  • Current News
  • Press Releases
  • Submit Press
  • Press kit
  • Interviews
• Columns
• Products
  
  • Our Products
  • Books
  • Featured Books
• Directories
  
  • Companies/Academic
  • Events
  • Glossary
  • Best Of
• Career Center
• Nano-Social Network
• Nano Consulting
• My Account

Home > News > Mass detection enters attogram regime

February 26th, 2004

Mass detection enters attogram regime

Abstract:
Physicists in the US have weighed objects with a mass of just 10^-18 grams (attograms) for the first time. Harold Craighead and colleagues at Cornell University made their measurements on small gold dots using a nanoelectromechanical device. The new sensitivity far exceeds the best previous result, which was on the femtogram (10^-15 grams) scale. The team hopes their device will be able to detect and identify tiny chemical and biological species, such as viruses. (more on earlier article)

Source:
Nanotechweb

Bookmark:

Related News Press

Discoveries

Gold nanocrystal vibration captured on billion-frames-per-second film May 23rd, 2013

Whirlpools on the Nanoscale Could Multiply Magnetic Memory: At the Advanced Light Source, Berkeley Lab scientists join an international team to control spin orientation in magnetic nanodisks May 22nd, 2013

Bacterial spare parts filter antibiotic residue from groundwater May 22nd, 2013

UofL scientists uncover how grapefruits provide a secret weapon in medical drug delivery May 22nd, 2013

Tools

Heinrich Rohrer dies at 79; a father of nanotechnology: With IBM colleague Gerd Binnig, Rohrer invented the scanning tunneling microscope, which can show individual atoms on a surface and move them around May 23rd, 2013

Gold nanocrystal vibration captured on billion-frames-per-second film May 23rd, 2013

Precision Positioning Systems go Nano: New Miniaturized Piezo-Motor Driven Nanopositioning Stage by PI May 22nd, 2013

Researchers Stitch Defects into the World’s Thinnest Semiconductor May 22nd, 2013