Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > News > Applied makes 65-nm X-architecture test chip

February 25th, 2004

Applied makes 65-nm X-architecture test chip

Applied Materials Inc., working with Cadence Design Systems, Inc., has made a 65-nm test chip using diagonal as well as traditional right-angle Manhattan interconnects. The test chips “provides further confirmation of the manufacturing readiness and scalability of X Architecture designs for future process nodes," said John T.C. Lee, general manager of Applied Materials' Maydan Technology Center.


Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Chip Technology

Nanoantenna lighting-rod effect produces fast optical switches October 24th, 2016

Unusual quantum liquid on crystal surface could inspire future electronics October 22nd, 2016

Scientists find technique to improve carbon superlattices for quantum electronic devices: In a paradigm shift from conventional electronic devices, exploiting the quantum properties of superlattices holds the promise of developing new technologies October 20th, 2016

Exploring defects in nanoscale devices for possible quantum computing applications October 19th, 2016

The latest news from around the world, FREE

  Premium Products
Only the news you want to read!
 Learn More
University Technology Transfer & Patents
 Learn More
Full-service, expert consulting
 Learn More

Nanotechnology Now Featured Books


The Hunger Project