Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > News > Applied makes 65-nm X-architecture test chip

February 25th, 2004

Applied makes 65-nm X-architecture test chip

Applied Materials Inc., working with Cadence Design Systems, Inc., has made a 65-nm test chip using diagonal as well as traditional right-angle Manhattan interconnects. The test chips “provides further confirmation of the manufacturing readiness and scalability of X Architecture designs for future process nodes," said John T.C. Lee, general manager of Applied Materials' Maydan Technology Center.


Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Chip Technology

GLOBALFOUNDRIES Launches RF Ecosystem Program to Accelerate Time-to-Market for Wireless Connectivity, Radar and 5G Applications: RFWave™ Partner Program expands the ecosystem and enables faster product deployment on GF’s RF technology platforms March 20th, 2018

Unexpected effect could lead to lower-power memory, computing devices March 17th, 2018

Plasmons triggered in nanotube quantum wells: Rice, Tokyo Metropolitan scientists create platform for unique near-infrared devices March 16th, 2018

Jim Barnhart Joins Nanometrics as Senior Vice President of Operations March 15th, 2018

The latest news from around the world, FREE

  Premium Products
Only the news you want to read!
 Learn More
Full-service, expert consulting
 Learn More

Nanotechnology Now Featured Books


The Hunger Project