Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > News > Applied makes 65-nm X-architecture test chip

February 25th, 2004

Applied makes 65-nm X-architecture test chip

Abstract:
Applied Materials Inc., working with Cadence Design Systems, Inc., has made a 65-nm test chip using diagonal as well as traditional right-angle Manhattan interconnects. The test chips “provides further confirmation of the manufacturing readiness and scalability of X Architecture designs for future process nodes," said John T.C. Lee, general manager of Applied Materials' Maydan Technology Center.

Source:
EETimes

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Chip Technology

Nanometrics to Announce Third Quarter Financial Results on October 30, 2018 October 10th, 2018

Graphene controls surface magnetism at room temperature October 8th, 2018

UCI scientists push microscopy to sub-molecular resolution: Carbon monoxide used to measure electric forces in single chemical compound October 2nd, 2018

Machine learning helps improving photonic applications September 28th, 2018

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project