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Home > News > Applied makes 65-nm X-architecture test chip

February 25th, 2004

Applied makes 65-nm X-architecture test chip

Abstract:
Applied Materials Inc., working with Cadence Design Systems, Inc., has made a 65-nm test chip using diagonal as well as traditional right-angle Manhattan interconnects. The test chips “provides further confirmation of the manufacturing readiness and scalability of X Architecture designs for future process nodes," said John T.C. Lee, general manager of Applied Materials' Maydan Technology Center.

Source:
EETimes

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