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Home > News > Nanoindenter cuts up nanowires

October 14th, 2003

Nanoindenter cuts up nanowires

Abstract:
Researchers from the University of South Carolina, US, have combined an atomic force microscope (AFM) with a nanoindenter to measure the mechanical properties of silver nanowires. The technique could also have applications in manufacturing nanodevices as it can permanently change the shape of the nanowires.

Source:
Nanotechweb

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