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Home > Press > Oxford Instruments Asylum Research in Conjunction with the MRS OnDemand® Webinar Series Presents: “Beyond Topography: New Advances in AFM Characterization of Polymers” May 28, 2015

he bulk properties of polymer blends are determined by the amount, distribution, and properties of their components. This sample is a blend of natural rubber, polybutadiene rubber, and zinc oxide. The elastic response distinguishes all three materials, but the zinc oxide inclusions (circles) stand out more clearly by their much lower loss tangent, 5 μm scan. Images courtesy of Dr. Anna Kepas-Suwara, Tun Abdul Razak Research Centre, UK.
he bulk properties of polymer blends are determined by the amount, distribution, and properties of their components. This sample is a blend of natural rubber, polybutadiene rubber, and zinc oxide. The elastic response distinguishes all three materials, but the zinc oxide inclusions (circles) stand out more clearly by their much lower loss tangent, 5 μm scan.

Images courtesy of Dr. Anna Kepas-Suwara, Tun Abdul Razak Research Centre, UK.

Abstract:
Oxford Instruments Asylum Research in conjunction with the Materials Research Society (MRS) will host the webinar “Beyond Topography: New Advances in AFM Characterization of Polymers”, May 28, 2015 at 11:00am EDT. Presenters include Dr. Donna Hurley, founder of Lark Scientific and former NIST project leader, and Anna Kepas-Suwara, Sr. Materials Scientist, of Tun Abdul Rezak Research Centre (TARRC). This webinar will provide an overview of the AFM’s powerful capabilities for polymers characterization and will cover AFM methods for fast topographic imaging, even in liquids and at high temperatures; recent advances in viscoelastic measurements; nanomechanical mapping of rubber blends, and AFM techniques to probe electrical and functional behavior.

Oxford Instruments Asylum Research in Conjunction with the MRS OnDemand® Webinar Series Presents: “Beyond Topography: New Advances in AFM Characterization of Polymers” May 28, 2015

Santa Barbara, CA | Posted on May 5th, 2015

“Whether investigating fundamental research principles or engineering a specific product, AFM is a important tool for evaluating polymers and polymer blends,” said Ben Ohler, Director of Marketing at Asylum Research. “Though a great deal can still be learned from basic topographic and phase imaging with AFM, recent advances in technology have led to significant advances in characterizing nanoscale mechanical properties (storage modulus and loss tangent), operating in controlled environments (e.g. temperature control or solvents), and high speed imaging of dynamic processes. This webinar will be educational for scientists in academia and industry who want to learn more about the latest applications of AFM to polymer science.”

Registration for the webinar can be found at http://www.prolibraries.com/mrs/events/afmcp

####

About Oxford Instruments Asylum Research, Inc.
Oxford Instruments Asylum Research is the technology leader in atomic force microscopy for both materials and bioscience research. Asylum Research AFMs are used for a wide variety of nanoscience applications in material science, physics, polymers, chemistry, tribology, biomaterials, and bioscience, including emerging applications in energy storage and generation, low-dimensional materials, and biophysics.

Asylum’s MFP-3D family of AFMs includes four different models that span a wide range of performance, applications, and budgets. The new MFP-3D Infinity is the flagship of the family, offering the highest performance, simplest operation, and widest range of capabilities. The MFP-3D Classic, the original MFP- 3D offered for mid-range budgets, provides high performance and versatility that exceeds most AFMs. The MFP-3D Origin is the most affordable model, offering the same performance as the MFP-3D Classic with many accessories and an easy upgrade path to advanced capabilities. Finally, the MFP-3D-BIO integrates with an inverted light microscope to support biological and photonic applications.

Cypher is the highest resolution fast scanning AFM and is available in two configurations, the Cypher S and the Cypher ES Environmental AFM. They provide low-drift closed loop imaging for the most accurate images and measurements possible today, >20X faster imaging with small cantilevers, exceptional ease of use, and integrated thermal, acoustic and vibration control – all in a small footprint. Cypher AFMs routinely achieve higher resolution than other AFMs, as demonstrated by single point atomic defects in crystal lattices and imaging of the DNA double helix.

The Cypher ES adds gas and liquid environmental control, temperature control, and enhanced chemical compatibility to the extraordinary performance of the Cypher S.

In addition to the best AFMs, Asylum Research also offers unmatched customer support that is free for the lifetime of the AFM and industry-leading warranties for the lowest cost of ownership of any AFM. Asylum has sales, applications and service staff in offices in the United States, Germany, United Kingdom, Japan, France, China and Taiwan and global distribution.

About Oxford Instruments plc


Oxford Instruments designs, supplies and supports high-technology tools and systems with a focus on research and industrial applications. Innovation has been the driving force behind Oxford Instruments' growth and success for over 50 years, and its strategy is to effect the successful commercialisation of these ideas by bringing them to market in a timely and customer-focused fashion.

The first technology business to be spun out from Oxford University, Oxford Instruments objective is to be the leading provider of new generation tools and systems for the research and industrial sectors with a focus on nanotechnology. Its key market sectors include nano-fabrication and nano-materials. The company’s strategy is to expand the business into the life sciences arena, where nanotechnology and biotechnology intersect.

This involves the combination of core technologies in areas such as low temperature, high magnetic field and ultra high vacuum environments; Nuclear Magnetic Resonance; x-ray, electron, laser and optical based metrology; atomic force microscopy; optical imaging; advanced growth, deposition and etching.

Oxford Instruments aims to pursue responsible development and deeper understanding of our world through science and technology. Its products, expertise, and ideas address global issues such as energy, environment, security and health.

For more information, please click here

Contacts:
Terry Mehr
Manager
Marketing Communications
805-696-6466

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