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Home > Directory > Imaging and microscopy > FSI TISNCM

FSI TISNCM

Surface investigation at the nanometer scale including topography and mechanical properties (hardness, elastic modulus, fracture toughness, delamination, etc.) of both bulk materials and thin films. Development of equipment and techniques in the field of scanning probe microscopy and nanoindentation. Development of novel construction materials and nanomaterials with unique properties. Products made of different types of diamond (indentors, substrates, plates, blades, windows, anvils, temperature and radiation sensors).

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Troitsk, Moscow Region 142190 Russia
(499) 272 23 14 *240

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