Nanotechnology Now

Image Metrology A/S

Image Metrology was founded in 1998. Today we are a world wide leading supplier of image processing software for "nano-microscopy".

Our mission is to provide our customers with state-of-the-art image processing software for microscopy including:

* Correction tools for creating the most accurate presentation of the "true" surface
* Automated analysis techniques assuring high accuracy, quality and cost efficiency
* Visualization and reporting tools enabling convincing and impressive communication of results

This mission is fulfilled by development of our main product the Scanning Probe Image Processor, SPIP™. SPIP™ supports a wide variety of microscope types and their file formats including Scanning Probe Microscopes (SPM), interference microscopes, Scanning Electron Microscopes (SEM), confocal microscopes and profilers.

Website

Lyngsø Alle 3A
Hørsholm DK-2970 Denmark
+45 () 469 234 00