Nanotechnology Now

Our NanoNews Digest Sponsors
Heifer International

Wikipedia Affiliate Button

Home > Press > Nanometrics Announces the NanoSpec II Film Metrology System for Advanced Material Characterization

Abstract:
Nanometrics Incorporated (Nasdaq:NANO), a leading provider of advanced process control metrology and inspection systems, today announced the launch of its NanoSpec® II standalone metrology system, the latest model in its NanoSpec line of economic film metrology systems.

Nanometrics Announces the NanoSpec II Film Metrology System for Advanced Material Characterization

Milpitas, CA | Posted on December 2nd, 2014

With a streamlined design based on the long-proven NanoSpec tabletop architecture, the NanoSpec II standalone is a fully automated non-contact optical metrology system for advanced material characterization on substrates up to 200mm. For films analysis, the NanoSpec II enables process control metrology and characterization on full-stack, multi-layer films and optical constant variation monitoring. New system hardware and software enhancements make the NanoSpec II the industry's most powerful and cost-effective film metrology system in its class, ideally suited for industrial and research environments.

"Our latest NanoSpec II standalone and tabletop systems continue to leverage our broad field applications experience across all types of thin film applications," commented David Doyle, vice president of the Materials Characterization Group at Nanometrics. "The NanoSpec II enables production and R&D customers to tackle their most advanced thin film metrology applications, all at a lower cost of ownership." For owners interested in upgrading their legacy tools, the NanoSpec II can seamlessly convert and upgrade existing measurement recipes.

The new NanoSpec II system will be introduced at the upcoming SEMICON Japan 2014 event being held December 3-5, 2014 at the Tokyo Big Sight, Tokyo, Japan. Nanometrics will be at booth 4168 in Hall 4.

####

About Nanometrics Incorporated
Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, such as data storage components and discretes including high-brightness LEDs and power management components. Nanometrics' automated and integrated metrology systems measure critical dimensions, device structures, overlay registration, topography and various thin film properties, including film thickness as well as optical, electrical and material properties. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics' systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor market. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO.

For more information, please click here

Contacts:
Kevin Heidrich
VP, Marketing
408.545.6000

Copyright © Nanometrics Incorporated

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Self-driving microrobots December 10th, 2019

CEA-Leti Thin-Film Batteries Target Extended Applications and Improved Performance in Medical Implants: IEDM 2019 Paper Reports Millimeter-Scale TFBs Exhibit the Best Performance In Both Energy and Power Densities December 10th, 2019

Arrowhead Pharmaceuticals Closes Underwritten Public Offering with Gross Proceeds of $266.8 Million December 7th, 2019

'Buildings' in human bone may hold key to stronger 3D-printed lightweight structures December 6th, 2019

Imaging

Artificial cells act more like the real thing December 6th, 2019

Extracting hidden quantum information from a light source October 25th, 2019

Pinpointing biomolecules with nanometer accuracy October 21st, 2019

Novel nanoprobes show promise for optical monitoring of neural activity: New approach for studying neural circuits offers advantages over both microelectrodes and fluorescence-based optical techniques that require genetic modifications October 18th, 2019

Chip Technology

Scientists see defects in potential new semiconductor: Discovery could help in effort to make high-powered electronics more efficient December 5th, 2019

ACM Research Announces Global Commercial Availability of Environmentally Friendly, Cost-Effective Advanced Wafer Cleaning System: Ultra C Tahoe delivers single wafer cleaning performance with one-tenth of the sulfuric acid consumption December 3rd, 2019

Electro-optical device provides solution to faster computing memories and processors: First-of-a-kind electro-optical device provides solution to faster and more energy efficient computing memories and processors December 2nd, 2019

Growing nano-tailored surfaces using micellar brushes November 29th, 2019

Announcements

Self-driving microrobots December 10th, 2019

CEA-Leti Thin-Film Batteries Target Extended Applications and Improved Performance in Medical Implants: IEDM 2019 Paper Reports Millimeter-Scale TFBs Exhibit the Best Performance In Both Energy and Power Densities December 10th, 2019

Arrowhead Pharmaceuticals Closes Underwritten Public Offering with Gross Proceeds of $266.8 Million December 7th, 2019

'Buildings' in human bone may hold key to stronger 3D-printed lightweight structures December 6th, 2019

Tools

ACM Research Announces Global Commercial Availability of Environmentally Friendly, Cost-Effective Advanced Wafer Cleaning System: Ultra C Tahoe delivers single wafer cleaning performance with one-tenth of the sulfuric acid consumption December 3rd, 2019

Mirrorcle Technologies Unveils a 3D LiDAR System - “SyMPL” November 26th, 2019

Onto Innovation to Participate in the 8th Annual NYC Investor Summit 2019 November 21st, 2019

SET, Smart Equipment Technology, Introduces New Automatic Flip-Chip Bonder Dedicated to Device Production: Developed with CEA-Leti in IRT Nanoelec’s 3D Program, NEO HB Combines High Precision, Flexibility, and Short Cycle Time for Direct Hybrid Bonding November 21st, 2019

Events/Classes

"Inverse Design for Self-Assembly: Patchy Particles, Machine Learning, and the Truth about Entropy" December 3rd, 2019

Arrowhead Pharmaceuticals to Participate in Upcoming December 2019 Conferences November 26th, 2019

Arrowhead Pharmaceuticals Reports Fiscal Year 2019 Results November 25th, 2019

Onto Innovation to Participate in the 8th Annual NYC Investor Summit 2019 November 21st, 2019

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project