Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > Premium Glass Refractive Index Measurements with CRAIC Technologies

Abstract:
rIQ™ from CRAIC Technologies is designed to help the forensic scientist measure the refractive index of glass quickly, accurately and easily using the ASTM E1967 methodology.

Premium Glass Refractive Index Measurements with CRAIC Technologies

San Dimas, CA | Posted on May 29th, 2014

CRAIC Technologies, Inc., the world's leading innovator of UV-visible-NIR microscopy solutions, joins with Laboratory Imaging, s.r.o., a leading specialist in imaging software solutions for microscopy, to introduce rIQ™ : the intelligent solution for the analysis of glass trace evidence. rIQ™, which stands for Refractive Index Quantification, is the result of a collaboration between CRAIC Technologies and Laboratory Imaging. rIQ™ combines sophisticated image analysis software, advanced optical design and standard reference materials to enable criminalists in modern forensic laboratories to measure the refractive index of multiple glass fragments simultaneously, quickly and with the highest accuracy.

"The partnership between CRAIC Technologies and Laboratory Imaging is yielding great success. CRAIC Technologies expertise in optics combined with Laboratory Imaging's decades of experience with microscope imaging software is advancing the state-of-the-art in several fields. rIQ™ is the result of this partnership and it promises to take the technique of forensic refractive index determination to the next level" states Dr. Paul Martin, President of CRAIC Technologies. "Glass fragments are common at crimes scenes. rIQ™ enables the forensic scientist to measure and compare the refractive index of the smallest fragments of glass with an incredibly high degree of accuracy. And when combined with CRAIC Technologies microscope spectrophotometers and microcolorimeters, the transmission and fluorescence spectral characteristics of glass evidence can also be determined quickly and accurately and all with the same instrument."

rIQ™ is an automated system that uses the thermal immersion method, as defined by the standard ASTM E1967, to measure the refractive index of microscopic glass fragments. The system, which incorporates many years of experience with the analysis of glass, allows the user to analyze the refractive index of multiple glass fragments simultaneously and with sophisticated analytical techniques. Statistical analysis methods can also be applied to the data and the instrument is also designed to be user friendly with a short learning curve.

rIQ™ is offered as a standalone package, as an add-on package to CRAIC Technologies microspectrophotometers or as an upgrade package for older units already in the field. A standalone package consists of a phase contrast microscope, a high resolution digital camera, the optical interface, a thermal stage, the controlling electronics and the rIQ™ software. The add-on package can be integrated with many CRAIC Technologies microspectrophotometers models, both past and present, to allow them to measure the color, absorbance microspectra™, fluorescence microspectra™ and the refractive index of the smallest of glass fragments.

For more information about rIQ™ for the analysis of the refractive index of glass, visit microspectra.com/products/riq .

####

About CRAIC Technologies, Inc.
CRAIC Technologies, Inc. is a global technology leader focused on innovations for microscopy and microspectroscopy in the ultraviolet, visible and near-infrared regions. CRAIC Technologies creates cutting-edge solutions, with the very best in customer support, by listening to our customers and implementing solutions that integrate operational excellence and technology expertise. CRAIC Technologies provides answers for customers in forensic sciences, biotechnology, semiconductor, geology, nanotechnology and materials science markets who demand quality, accuracy, precision, speed and the best in customer support.

For more information, please click here

Contacts:
CRAIC Technologies, Inc.

+1-310-573-8180

Copyright © CRAIC Technologies, Inc.

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Small but heading for the big time: Nanobiotix half year results for the six months ended 30 June 2015, in line with expectations: Major clinical achievements and corporate developments August 28th, 2015

A new technique to make drugs more soluble August 28th, 2015

Nanocatalysts improve processes for the petrochemical industry August 28th, 2015

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

National Space Society Welcomes Janet Ivey As New NSS Governor: Janet Ivey of Janet's Planet is NOW IN ORBIT as a member of the Board of Governors of the National Space Society August 27th, 2015

Imaging

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

50 Years of Scanning Electron Microscopy from ZEISS: ZEISS celebrates the birth of the first commercial scanning electron microscope in 1965 August 26th, 2015

Announcing Oxford Instruments and School of Physics signing a Memorandum of Understanding August 26th, 2015

Announcements

Small but heading for the big time: Nanobiotix half year results for the six months ended 30 June 2015, in line with expectations: Major clinical achievements and corporate developments August 28th, 2015

A new technique to make drugs more soluble August 28th, 2015

Nanocatalysts improve processes for the petrochemical industry August 28th, 2015

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

Tools

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

Nanometrics to Participate in the Citi 2015 Global Technology Conference August 26th, 2015

50 Years of Scanning Electron Microscopy from ZEISS: ZEISS celebrates the birth of the first commercial scanning electron microscope in 1965 August 26th, 2015

Announcing Oxford Instruments and School of Physics signing a Memorandum of Understanding August 26th, 2015

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic