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After several years of industry discussion, development, and proof-of-concept, the SEMI Wait Time Waste Metrics and Methods Task Force — led by SEMATECH and consisting of key industry stakeholders — has successfully developed a method that defines time elements to classify the state of each wafer and wafer batch throughout the manufacturing process. The method, validated by participating SEMATECH and SEMI member companies, is in procedural review for publication as a SEMI standard.
"The ability to parse cycle time into measurable pieces, or time elements, allows manufacturers to determine how long a particular event takes, and then focus in on opportunities to reduce cycle time," said Jackie Ferrell, Equipment and Factory Productivity project manager at SEMATECH. "This project along with SEMI's standards initiative collaboratively addresses the industry's waste and reduction needs and is one of SEMATECH's many projects that support the need for efficient and automated ways of converting the volumes of data in our fabs to actionable information."
In the semiconductor manufacturing process, there is a significant opportunity to increase equipment utilization and improve overall factory performance. By reducing unnecessary wait-time out of the manufacturing process, fabs will be able to add valuable hours of production time per day - a significant cost savings of potentially $100M for each day of cycle time.
The wait time waste method takes a user-specified time period, breaks it down into contiguous time segments and categorizes each time segment as a type of active or wait time. Factory events and context data are used to delineate the time segments.
The primary standard method provides a common approach to product time measurement that can be compared from one production line to another. The secondary standard method specifies a detailed approach to apply the product time measurement to 300 mm production equipment.
Device makers will be able to use this method to find hidden waste within their equipment and fab operations. Equipment and automated material handling system suppliers will also be able to use this method for equipment characterization and optimization, and work with device makers on analysis and potential solutions. In-house systems and commercial software products and services based on standardized metrics enable fab-wide solutions that will significantly reduce the time and cost to identify waste.
For more information on SEMATECH's Equipment and Factory Productivity Wait Time Waste project, contact Jackie Ferrell at .
For over 25 years, SEMATECH®, the international consortium of leading semiconductor device, equipment, and materials manufacturers, has set global direction, enabled flexible collaboration, and bridged strategic R&D to manufacturing. Through our unwavering commitment to foster collaboration across the nanoelectronics industry, we help our members and partners address critical industry transitions, drive technical consensus, pull research into the industry mainstream, improve manufacturing productivity, and reduce risk and time to market. Information about SEMATECH can be found at www.sematech.org. Twitter: www.twitter.com/sematech
SEMI is the global industry association serving the nano- and micro-electronic manufacturing supply chains. Our 2,000 member companies are the engine of the future, enabling smarter, faster and more economical products that improve our lives. Since 1970, SEMI has been committed to helping members grow more profitably, create new markets and meet common industry challenges. SEMI maintains offices in Bangalore, Beijing, Berlin, Brussels, Grenoble, Hsinchu, Moscow, San Jose, Seoul, Shanghai, Singapore, Tokyo, and Washington, D.C. For more information, visit www.semi.org.
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