Nanotechnology Now







Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > Launch of a new powerful tool for particles and powders inspection - ParticleMetric software

Abstract:
With the introduction of the ParticleMetric software, the visualization and analysis of particles are easier than ever before with the Phenom desktop SEM. The combination of speed, ease of use and superb imaging quality of the Phenom with the imaging and particle analysis of ParticleMetric creates a powerful tool for inspecting a wide range of particle and powder samples.

Launch of a new powerful tool for particles and powders inspection - ParticleMetric software

Eindhoven, The Netherlands | Posted on November 12th, 2013

Visualisation and analysis

The Phenom desktop SEM with ParticleMetric software allows easy generation and analysis of SEM images. The integrated ParticleMetric software allows the user to gather morphology and particle size data for many submicron particle applications. The fully automated measurements of ParticleMetric allow a level of visual exploration beyond optical microscopy that can lead to new discoveries and innovations in powder design, development, and quality control.
Dry powder particle dispersion

The ParticleMetric software application is integrated in the Pro Suite, offering a complete solution for particle analysis. The user can define particle features like diameter and circularity to select the desired type of samples. ParticleMetric can identify phenomena such as broken particles, agglomerates and foreign particles.

With the Nebula ITM, a standard method for uniform dry powder dispersion on SEM stubs becomes available. The Nebula I ensures best sample preparation by obtaining a mono layer of particles avoiding particle clusters while maintaining the structure of fragile particles. This dry powder disperser is easy to use and allows the user to extract the best results in combination with the ParticleMetric software. The unique combination of ParticleMetric and the Nebula I allows the user to gather and analyze particle size and morphology data.

Richard Geschiere, VP Sales Phenom-World about ParticleMetric:
"With the introduction of ParticleMetric we feel the ever increasing demand for particle characterization can be met. Combined with the ease of use of the Phenom desktop SEM and the in-house developed and produced particle disperser, we offer our customers a very powerful solution for inspection and analysis of powders and particles."

####

About Phenom-World BV
Phenom-World is a leading global supplier of desktop scanning electron microscopes and imaging solutions for sub-micron scale applications. Our SEM-based systems are used in a broad range of markets and applications.

We continuously invest, develop and integrate our products to help our customers improve their return on investment, time to data, and increase system functionality.

We help our customers with excellent and fast results from the micro and nano world by ensuring worry-free imaging and analysis.

For more information, please click here

Contacts:
Dillenburgstraat 9E
5652 AM Eindhoven The Netherlands
Phone: +31 (0)40 259 7360
Fax: +31 (0)40 259 7370

Copyright © Phenom-World BV

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Toyocolor to Launch New Carbon Nanotube Materials at nano tech 2015 January 24th, 2015

NANOPOSTER 2015 - 5th Virtual Nanotechnology Conference - call for abstracts January 24th, 2015

Nanosensor Used for Simultaneous Determination of Effective Tea Components January 24th, 2015

The latest fashion: Graphene edges can be tailor-made: Rice University theory shows it should be possible to tune material's properties January 24th, 2015

Software

FLEX™ from CRAIC Technologies: a Flexible UV-visible-NIR Microspectrophotometer Concept January 2nd, 2015

Spectral Surface Mapping with Microscopic Resolution: CRAIC Technologies introduces Spectral Surface Mapping™ (S2M™) software November 18th, 2014

FEI Releases New Electronics Failure Analysis Applications for Helios NanoLab DualBeam Portfolio: Dx gas chemistry enables rapid delayering of ICs, while AutoLX advanced automation simplifies sample preparation for transmission electron microscopy November 3rd, 2014

QuantumWise guides the semiconductor industry towards the atomic scale October 24th, 2014

Announcements

Toyocolor to Launch New Carbon Nanotube Materials at nano tech 2015 January 24th, 2015

NANOPOSTER 2015 - 5th Virtual Nanotechnology Conference - call for abstracts January 24th, 2015

Nanosensor Used for Simultaneous Determination of Effective Tea Components January 24th, 2015

The latest fashion: Graphene edges can be tailor-made: Rice University theory shows it should be possible to tune material's properties January 24th, 2015

Tools

Graphene brings quantum effects to electronic circuits January 22nd, 2015

EnvisioNano: An image contest hosted by the National Nanotechnology Initiative (NNI) January 22nd, 2015

New Molecular Beam Epitaxy deposition equipment at the ICN2 January 22nd, 2015

New method to generate arbitrary optical pulses January 21st, 2015

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2015 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE