Nanotechnology Now







Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > Bruker Introduces New LumiMap Electroluminescence Tool for Optical and Electrical Characterization on Epi Wafers for HB-LEDs: New Technology Delivers Fast and Repeatable Measurements for Epi Process Quality Control

Abstract:
Today at the 15th China International Optoelectronic Exposition (CIOE 2013), Bruker introduced the new LumiMap™ Electroluminescence System for uncompromised HB-LED epi wafer process metrology. LumiMap joins a suite of other successful Bruker HB-LED epi metrology tools, and it incorporates many of the advanced features of Bruker's flagship metrology products. Proprietary, patent-pending features of the new system include the durable conducting probe, a unique wafer edge contact solution, and advanced I-V curve modeling for accurate and repeatable forward voltage value measurement. These features enable LumiMap to deliver the most accurate and repeatable forward and reverse IV characteristics, spectral intensity, wavelength and spectral width measurements on 2- to 6-inch epi wafers, with a wide range of current settings.

Bruker Introduces New LumiMap Electroluminescence Tool for Optical and Electrical Characterization on Epi Wafers for HB-LEDs: New Technology Delivers Fast and Repeatable Measurements for Epi Process Quality Control

Shenzhen, China | Posted on September 5th, 2013

"LumiMap provides more accurate and reliable electrical and optical epi wafer measurements than the traditional indium dot method," said Dr. Ryan Lee, Executive VP and CTO of Foshan Nationstar Optoelectronics Co. Ltd. "A reliable electro-luminescence quality check immediately after MOCVD will help us further improve epi wafer yield and reduce costs."

"Bruker is pleased to bring a new technology solution to HB-LED manufacturing, rounding out our other HB-LED metrology technologies in 3D optical microscopy, atomic force microscopy and XRD/XRF for PSS wafers and epi wafer multi-quantum layer characterization," said Dr. Xiaomei Li, Vice President of Segment Marketing of the Bruker Nano Surfaces division. "LumiMap ideally serves stringent HB-LED manufacturing cost reduction goals at a time when the industry is poised for unprecedented growth."
"LumiMap electroluminescence technology fills the current lack of fast, non-destructive, reliable and repeatable optical and electrical measurement solutions to improve epi wafer yield and LED device quality at the epi wafer stage," added Robert M. Loiterman, Executive Vice President and General Manager of Bruker's Stylus and Optical Metrology Business. "With LumiMap, the HB-LED industry can now get accurate electrical and optical feedback in minutes rather than days, reducing scrap events and operating costs."

####

About Bruker Corporation
Bruker is a leading provider of high-performance scientific instruments and solutions for molecular and materials research, as well as for diagnostics, industrial and applied analysis.

About LumiMap

LumiMap is a value-oriented alternative to conventional, multistep, operator-dependent indium dot methods of epi (made by epitaxial growth) wafer characterization. The system features rapid, non-destructive, no post measurement chemical cleaning, software-controlled measurement locations, and repeatable optical and electrical measurement capabilities through forming a temporary LED (light-emitting diode) device on an epi wafer. The results obtained by LumiMap are well correlated with those on the final HB-LED (high brightness LED) device, providing an early warning of process shifts, which in turn reduces the risk of expensive scrap events and improves yields. Simple wafer exchange and intuitive software provides the industry’s easiest to use interface for production quality control, as well as epi process development. The long measurement lifetime of the proprietary conducting probe meets the strictest industry cost of ownership requirements.

For more information, please click here

Contacts:
Stephen Hopkins
Marketing Communications
Bruker Nano Surfaces
T: +1 (520) 741-1044 x1022

Copyright © Bruker Corporation

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

GS7 Graphene Sensor maybe Solution in Fight Against Cancer January 25th, 2015

Toyocolor to Launch New Carbon Nanotube Materials at nano tech 2015 January 24th, 2015

NANOPOSTER 2015 - 5th Virtual Nanotechnology Conference - call for abstracts January 24th, 2015

Nanosensor Used for Simultaneous Determination of Effective Tea Components January 24th, 2015

Display technology/LEDs/SS Lighting/OLEDs

Transparent artificial nacre: A brick wall at the nanoscale January 22nd, 2015

New conductive coatings for flexible touchscreens – presentation at nano tech 2015 in Japan January 22nd, 2015

Nano - "Green" metal oxides ... January 13th, 2015

GraphExeter defies the Achilles heel of 'wonder material' graphene January 8th, 2015

Chip Technology

The latest fashion: Graphene edges can be tailor-made: Rice University theory shows it should be possible to tune material's properties January 24th, 2015

New method to generate arbitrary optical pulses January 21st, 2015

New signal amplification process set to transform communications, imaging, computing: UC San Diego researchers discover a mechanism to amplify signals in optoelectronic systems that is far more efficient than standard processes January 21st, 2015

Solving an organic semiconductor mystery: Berkeley Lab researchers uncover hidden structures in domain interfaces that hamper performance January 16th, 2015

Announcements

GS7 Graphene Sensor maybe Solution in Fight Against Cancer January 25th, 2015

Toyocolor to Launch New Carbon Nanotube Materials at nano tech 2015 January 24th, 2015

NANOPOSTER 2015 - 5th Virtual Nanotechnology Conference - call for abstracts January 24th, 2015

Nanosensor Used for Simultaneous Determination of Effective Tea Components January 24th, 2015

Tools

Graphene brings quantum effects to electronic circuits January 22nd, 2015

EnvisioNano: An image contest hosted by the National Nanotechnology Initiative (NNI) January 22nd, 2015

New Molecular Beam Epitaxy deposition equipment at the ICN2 January 22nd, 2015

New method to generate arbitrary optical pulses January 21st, 2015

Events/Classes

Toyocolor to Launch New Carbon Nanotube Materials at nano tech 2015 January 24th, 2015

NANOPOSTER 2015 - 5th Virtual Nanotechnology Conference - call for abstracts January 24th, 2015

New conductive coatings for flexible touchscreens – presentation at nano tech 2015 in Japan January 22nd, 2015

Teijin to Participate in Nano Tech 2015 January 22nd, 2015

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2015 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE