Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Bruker Introduces New LumiMap Electroluminescence Tool for Optical and Electrical Characterization on Epi Wafers for HB-LEDs: New Technology Delivers Fast and Repeatable Measurements for Epi Process Quality Control

Abstract:
Today at the 15th China International Optoelectronic Exposition (CIOE 2013), Bruker introduced the new LumiMap™ Electroluminescence System for uncompromised HB-LED epi wafer process metrology. LumiMap joins a suite of other successful Bruker HB-LED epi metrology tools, and it incorporates many of the advanced features of Bruker's flagship metrology products. Proprietary, patent-pending features of the new system include the durable conducting probe, a unique wafer edge contact solution, and advanced I-V curve modeling for accurate and repeatable forward voltage value measurement. These features enable LumiMap to deliver the most accurate and repeatable forward and reverse IV characteristics, spectral intensity, wavelength and spectral width measurements on 2- to 6-inch epi wafers, with a wide range of current settings.

Bruker Introduces New LumiMap Electroluminescence Tool for Optical and Electrical Characterization on Epi Wafers for HB-LEDs: New Technology Delivers Fast and Repeatable Measurements for Epi Process Quality Control

Shenzhen, China | Posted on September 5th, 2013

"LumiMap provides more accurate and reliable electrical and optical epi wafer measurements than the traditional indium dot method," said Dr. Ryan Lee, Executive VP and CTO of Foshan Nationstar Optoelectronics Co. Ltd. "A reliable electro-luminescence quality check immediately after MOCVD will help us further improve epi wafer yield and reduce costs."

"Bruker is pleased to bring a new technology solution to HB-LED manufacturing, rounding out our other HB-LED metrology technologies in 3D optical microscopy, atomic force microscopy and XRD/XRF for PSS wafers and epi wafer multi-quantum layer characterization," said Dr. Xiaomei Li, Vice President of Segment Marketing of the Bruker Nano Surfaces division. "LumiMap ideally serves stringent HB-LED manufacturing cost reduction goals at a time when the industry is poised for unprecedented growth."
"LumiMap electroluminescence technology fills the current lack of fast, non-destructive, reliable and repeatable optical and electrical measurement solutions to improve epi wafer yield and LED device quality at the epi wafer stage," added Robert M. Loiterman, Executive Vice President and General Manager of Bruker's Stylus and Optical Metrology Business. "With LumiMap, the HB-LED industry can now get accurate electrical and optical feedback in minutes rather than days, reducing scrap events and operating costs."

####

About Bruker Corporation
Bruker is a leading provider of high-performance scientific instruments and solutions for molecular and materials research, as well as for diagnostics, industrial and applied analysis.

About LumiMap

LumiMap is a value-oriented alternative to conventional, multistep, operator-dependent indium dot methods of epi (made by epitaxial growth) wafer characterization. The system features rapid, non-destructive, no post measurement chemical cleaning, software-controlled measurement locations, and repeatable optical and electrical measurement capabilities through forming a temporary LED (light-emitting diode) device on an epi wafer. The results obtained by LumiMap are well correlated with those on the final HB-LED (high brightness LED) device, providing an early warning of process shifts, which in turn reduces the risk of expensive scrap events and improves yields. Simple wafer exchange and intuitive software provides the industry’s easiest to use interface for production quality control, as well as epi process development. The long measurement lifetime of the proprietary conducting probe meets the strictest industry cost of ownership requirements.

For more information, please click here

Contacts:
Stephen Hopkins
Marketing Communications
Bruker Nano Surfaces
T: +1 (520) 741-1044 x1022

Copyright © Bruker Corporation

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Wear-resistant ceramic powder maximises component lifespan in high-stress applications: Innovnano’s nanostructured 3YSZ offers improved tribological performance for manufacturing components September 18th, 2014

IEEE International Electron Devices Meeting To Celebrate 60th Anniversary as The Leading Technical Conference for Advanced Semiconductor Devices September 18th, 2014

FEI Opens New Technology Center in Czech Republic: FEI expands its presence in Brno with the opening of a new, larger facility September 18th, 2014

Biosensors Get a Boost from Graphene Partnership: $5 Million Investment Supports Dozens of Jobs and Development of 300mm Fabrication Process and Wafer Transfer Facility September 18th, 2014

The Pocket Project will develop a low-cost and accurate point-of-care test to diagnose Tuberculosis: ICN2 holds a follow-up meeting of the Project on September 18th - 19th September 18th, 2014

Display technology/LEDs/SS Lighting/OLEDs

IEEE International Electron Devices Meeting To Celebrate 60th Anniversary as The Leading Technical Conference for Advanced Semiconductor Devices September 18th, 2014

Chip Technology

IEEE International Electron Devices Meeting To Celebrate 60th Anniversary as The Leading Technical Conference for Advanced Semiconductor Devices September 18th, 2014

‘Small’ transformation yields big changes September 16th, 2014

Excitonic Dark States Shed Light on TMDC Atomic Layers: Berkeley Lab Discovery Holds Promise for Nanoelectronic and Photonic Applications September 11th, 2014

Researchers Create World’s Largest DNA Origami September 11th, 2014

Announcements

Wear-resistant ceramic powder maximises component lifespan in high-stress applications: Innovnano’s nanostructured 3YSZ offers improved tribological performance for manufacturing components September 18th, 2014

IEEE International Electron Devices Meeting To Celebrate 60th Anniversary as The Leading Technical Conference for Advanced Semiconductor Devices September 18th, 2014

FEI Opens New Technology Center in Czech Republic: FEI expands its presence in Brno with the opening of a new, larger facility September 18th, 2014

Biosensors Get a Boost from Graphene Partnership: $5 Million Investment Supports Dozens of Jobs and Development of 300mm Fabrication Process and Wafer Transfer Facility September 18th, 2014

Tools

IEEE International Electron Devices Meeting To Celebrate 60th Anniversary as The Leading Technical Conference for Advanced Semiconductor Devices September 18th, 2014

FEI Opens New Technology Center in Czech Republic: FEI expands its presence in Brno with the opening of a new, larger facility September 18th, 2014

New NPZ100-403 Piezo Stage from nPoint Inc. September 17th, 2014

Researchers Create World’s Largest DNA Origami September 11th, 2014

Events/Classes

IEEE International Electron Devices Meeting To Celebrate 60th Anniversary as The Leading Technical Conference for Advanced Semiconductor Devices September 18th, 2014

PEN Inc. Chairman, Scott Rickert, Will Webcast a Live Company Update September 25, 1 PM EDT September 17th, 2014

Dolomite to launch Meros TCU-100 temperature controller at Lab-on-a-Chip & Microarray World Congress September 15th, 2014

Seeking Nanoscale Defenses for Biological and Chemical Threats: WPI co-organizes a NATO workshop to improve the detection and decontamination of biological and chemical agents September 13th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE