Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > Spectroscopy of Microscopic Features of Very Large Samples-The Solution From CRAIC Technologies

Abstract:
The 20/30 XL™ is able to take spectra and images of microscopic features of very large objects from the deep UV to the near infrared. Because of the flexible instrument design, the is no upper limit to the sample size which makes this instrument perfect for everything from quality control of the largest flat panel displays to film thickness of 300 mm wafers to the non-destructive analysis of great artworks.

Spectroscopy of Microscopic Features of Very Large Samples-The Solution From CRAIC Technologies

San Dimas, CA | Posted on August 28th, 2013

CRAIC Technologies, the world's leading innovator of UV-visible-NIR microspectroscopy solutions, is proud to introduce the 20/30 XL™ UV-visible-NIR microspectrophotometer. The 20/30 XL™ microspectrophotometer is designed to non-destructively analyze microscopic features of very large samples when integrated into large scale sample handling machinery. With a spectral range from the deep ultraviolet to the near infrared, analysis of samples can be done by absorbance, reflectance, Raman, luminescence and fluorescence with unparalleled speed and accuracy. The system can also be configured to image microscopic sample areas in the UV and NIR regions in addition to high resolution color imaging. Due to its flexible design which gives it the ability to analyze the largest samples, applications are numerous and include mapping color and intensity variations of flat panel displays, film thickness measurements across the entire surface of 300 mm wafers, scanning the surfaces of hard disks for defects to the analysis of entire paintings with high spatial resolution. With the ability to spectral analyze and image microscopic samples, very large devices and everything in between, the 20/30 XL™ microspectrophotometer is the cutting-edge micro-analysis tool for laboratories and manufacturing facilities.

"CRAIC Technologies has been an innovator in the field of UV-visible-NIR microanalysis since its founding. We have helped to advance the field of microscale analysis with innovative instrumentation, software, research and teaching. The 20/30 XL™ microspectrophotometer was born out of demand from our industrial customers to be able to analyze microscopic features of very large samples" states Dr. Paul Martin, President of CRAIC Technologies. "As such, we have listened to our customers and created the 20/30 XL™, a system backed by years of experience in designing, building and the using of this type of instrumentation for spectroscopic and image analysis. It is a tool that can be used both in the research laboratory or on the production floor."

The 20/30 XL™ microspectrophotometer integrates advanced spectrophotometers with a sophisticated UV-visible-NIR range microscope and powerful, easy-to-use software. This flexible instrument is designed to attach to large frames that can accomodate large scale samples. It is then able to acquire data from microscopic features of very large samples by absorbance, reflectance, Raman, fluorescence and other types of emission spectroscopy. By including high-resolution digital imaging, the user is also able to use the instrument as a ultraviolet or infrared microscope. Touch screen controls, sophisticated software, calibrated variable apertures and other innovations all point to a new level of sophistication for microanalysis. With high sensitivity, durable design, ease-of-use, multiple imaging and spectroscopic techniques, automation and the support of CRAIC Technologies, the 20/30 XL™ is more than just a quality control measurement tool…it is the solution to your analytical challenges.

####

About CRAIC Technologies
CRAIC Technologies, Inc. is a global technology leader focused on innovations for microscopy and microspectroscopy in the ultraviolet, visible and near-infrared regions. CRAIC Technologies creates cutting-edge solutions, with the very best in customer support, by listening to our customers and implementing solutions that integrate operational excellence and technology expertise. CRAIC Technologies provides answers for customers in forensic sciences, biotechnology, semiconductor, geology, nanotechnology and materials science markets who demand quality, accuracy, precision, speed and the best in customer support.

For more information, please click here

Contacts:
CRAIC Technologies, Inc.

+1-310-573-8180

Copyright © CRAIC Technologies

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Crystalline Fault Lines Provide Pathway for Solar Cell Current: New tomographic AFM imaging technique reveals that microstructural defects, generally thought to be detrimental, actually improve conductivity in cadmium telluride solar cells September 26th, 2016

Researchers at the Catalan Institute of Nanoscience and Nanotechnology show that bending semiconductors generates electricity September 26th, 2016

Chains of nanogold – forged with atomic precision September 23rd, 2016

Tattoo therapy could ease chronic disease: Rice-made nanoparticles tested at Baylor College of Medicine may help control autoimmune diseases September 23rd, 2016

Imaging

Oxford Instruments is ‘Bringing the Nanoworld Together’ in India once again - 22 - 23 November 2016 | IISc Bangalore September 21st, 2016

Bruker Introduces Complete Commercial AFM-Based SECM Solution: PeakForce SECM Mode Enables Previously Unobtainable Electrochemical Information September 20th, 2016

Iran to hold intl. school on application of nanomaterials in medicine September 20th, 2016

Oxford Instruments Asylum Research Announces New SurfRider Econo Board Probes for Routine AFM Measurements September 19th, 2016

Display technology/LEDs/SS Lighting/OLEDs

New perovskite research discoveries may lead to solar cell, LED advances September 12th, 2016

Silicon nanoparticles instead of expensive semiconductors: Within an international collaboration, physicists of the Moscow State University replace expensive semiconductors with affordable silicon nanoparticles for display production September 9th, 2016

Low-cost and defect-free graphene: FAU researchers make key break-through September 7th, 2016

Lowering the cost and environmental footprint of white LEDs September 1st, 2016

Chip Technology

Researchers at the Catalan Institute of Nanoscience and Nanotechnology show that bending semiconductors generates electricity September 26th, 2016

Mexican scientist in the Netherlands seeks to achieve data transmission ... speed of light September 20th, 2016

Towards Stable Propagation of Light in Nano-Photonic Fibers September 20th, 2016

PHENOMEN is a FET-Open Research Project aiming to lay the foundations a new information technology September 19th, 2016

Announcements

Crystalline Fault Lines Provide Pathway for Solar Cell Current: New tomographic AFM imaging technique reveals that microstructural defects, generally thought to be detrimental, actually improve conductivity in cadmium telluride solar cells September 26th, 2016

Researchers at the Catalan Institute of Nanoscience and Nanotechnology show that bending semiconductors generates electricity September 26th, 2016

Chains of nanogold – forged with atomic precision September 23rd, 2016

Tattoo therapy could ease chronic disease: Rice-made nanoparticles tested at Baylor College of Medicine may help control autoimmune diseases September 23rd, 2016

Tools

Oxford Instruments is ‘Bringing the Nanoworld Together’ in India once again - 22 - 23 November 2016 | IISc Bangalore September 21st, 2016

Bruker Introduces Complete Commercial AFM-Based SECM Solution: PeakForce SECM Mode Enables Previously Unobtainable Electrochemical Information September 20th, 2016

Oxford Instruments Asylum Research Announces New SurfRider Econo Board Probes for Routine AFM Measurements September 19th, 2016

Electron beam microscope directly writes nanoscale features in liquid with metal ink September 16th, 2016

Human Interest/Art

Weizmann Institute of Science Presents: Weizmann Wonder Wander - 4G - is Online June 21st, 2016

Call for NanoArt and Art-Science-Technology Papers June 9th, 2016

Scientists propose non-animal tools for assessing the toxicity of nanomaterials: Particle and Fibre Toxicology publishes recommendations from expert group meeting April 26th, 2016

Are humans the new supercomputer?Today, people of all backgrounds can contribute to solving serious scientific problems by playing computer games. A Danish research group has extended the limits of quantum physics calculations and simultaneously blurred the boundaries between mac April 14th, 2016

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic