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Home > Press > Launch Next Generation Phenom Desktop SEM

Next Generation Phenom Systems
Next Generation Phenom Systems

Abstract:
With the introduction of the next generation Phenom ProX desktop SEM Phenom-World confirms its position in the top of the high-end table top for SEM imaging and analysis. With a magnification range up to 100,000x and resolution of 17nm the Phenom ProX delivers more detailed information than ever before.

Launch Next Generation Phenom Desktop SEM

Eindhoven, The Netherlands | Posted on June 26th, 2013

All-in-one system

All Phenom-World scanning electron microscopes are intuitive to use, compact, fast to create results and built to high quality standards. The most extended solution in the range is the next generation Phenom ProX. The advanced system identifies different elements in a specimen by using the integrated Element Identification software with a specially designed EDS detector. With new techniques and software-developments, the magnification range has been extended from max. 45,000x to 100,000x magnification. Combined with a resolution of 17nm, the next generation Phenom ProX is a valuable instrument for a wide variety of applications.

Fully integrated EDS solution

The specially designed and fully integrated EDS detector combined with integrated software package makes the Phenom ProX the most extended solution for fast and user friendly imaging and analysis. The EDS-technique analyzes X-rays generated by the electrons from the electron beam interacting with the sample. The Phenom CeB6 electron source generates the highest number of X-rays in its market segment. The fully integrated Element Identification software package allows users to identify any hidden elements within a sample via the point-and-shoot functionality. Additionally, the software can be expanded with a combined Elemental Mapping and Line Scan option.

Elemental Mapping reveals the distribution of elements within the sample. The selected elements can be mapped at a user-specified pixel resolution and acquisition time. Elements can be added or removed at any time during or after the mapping process. Line Scan allows analysis over a selected line.The results can easily be exported and reported.

Emile Asselbergs, CEO Phenom-World about the third generation Phenom desktop SEM:
"A spirit of innovation and focus has brought spectacular growth to our company in the years that lay behind us. Now we are very happy to be able to bring our customers even more resolving power and magnification in the Phenom-way: A very crisp image, ultimate ease-of-use, productivity, reliability at a very reasonable price. With the release of this next generation ProX, Phenom-World confirms its top position in table top SEM. We are convinced that our customers will love this next Phenom".

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About Phenom-World
Phenom-World is a leading global supplier of desktop scanning electron microscopes and imaging solutions for sub-micron scale applications. Our SEM-based systems are used in a broad range of markets and applications.

We continuously invest, develop and integrate our products to help our customers improve their return on investment, time to data, and increase system functionality.

We help our customers with excellent and fast results from the micro and nano world by ensuring worry-free imaging and analysis.

For more information, please click here

Contacts:
Lorelei de Boer
Marketing Programs Coordinator
PhenomWorld
Dillenburgstraat 9E | 5652 AM Eindhoven | The Netherlands
P +31 (0)40 259 73 66
F +31 (0)40 259 73 70
www.phenom-world.com |

Copyright © Phenom-World

If you have a comment, please Contact us.

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