Nanotechnology Now







Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > FEI Announces New Helios NanoLab 450 F1 DualBeam for Semiconductor Failure Analysis: New DualBeam from FEI delivers faster, more accurate answers for new processes, materials and complex device geometries.

Abstract:
FEI (NASDAQ: FEIC) today announced its new Helios NanoLab™ 450 F1 DualBeam™ system designed to provide semiconductor manufacturers with faster, better images of their most advanced device architectures. A new STEM (scanning transmission electron microscope) detector delivers improved contrast between materials, and the new flip stage and rotating nanomanipulator support advanced preparation techniques for complex device architectures, such as finFETs and three-dimensional (3D) memory structures. Ultimately, faster, better answers cut development costs, accelerate process ramps, and get new products to market sooner.

FEI Announces New Helios NanoLab 450 F1 DualBeam for Semiconductor Failure Analysis: New DualBeam from FEI delivers faster, more accurate answers for new processes, materials and complex device geometries.

Hillsboro, OR | Posted on November 12th, 2012

"The F1 combines our best new technologies into an industry leading DualBeam for semiconductor failure analysis," states Rudy Kellner, vice president and general manager of FEI's Electronics Business Unit. "The new STEM detector lets the operator know precisely when the sample is thin enough, and in many cases, the images can eliminate the need for standalone TEM analysis altogether. In fact, as samples get thinner there are advantages to working at lower beam energies where interactions with the sample are stronger. The new EasyLift nanomanipulator and flip stage let the operator maneuver the sample quickly and easily for inverted thinning, to monitor end-pointing from both sides of a section, or to section a 3D device at almost any angle."

Dual beam instruments combine an SEM (scanning electron microscope) for imaging and a FIB (focused ion beam) for milling and deposition. Dual beams also provide STEM imaging capability by adding a detector for collecting transmitted electrons below the sample. An increasingly important application of dual beam instruments is the preparation of the ultra thin samples required for TEM analysis. This need for high-resolution TEM analysis has grown dramatically in recent years as many devices structures have shrunk beyond the resolving power of SEM.

The Helios NanoLab 450 F1 is the most recent addition to FEI's line of DualBeam systems. It combines the industry's highest resolution SEM and FIB for high quality imaging and fast, precise milling and deposition, and adds capabilities specifically designed for semiconductor failure analysis applications. The new STEM detector delivers higher resolution and better material contrast. The FlipStage™ 3 quickly flips the sample between thinning and STEM viewing positions and a new rotation axis permits viewing from either side of the section. The EasyLift™ nanomanipulator provides precise motorized sample manipulation, including rotation, to support automated "lift-out" and advanced preparation procedures, such as inverted thinning. The MultiChem™ gas injector system provides unprecedented flexibility in gas assisted milling and deposition, while also cutting maintenance costs with pre-filled crucibles.

For more information, please visit: www.fei.com/helios.

####

About FEI Company
FEI (Nasdaq: FEIC) is a leading diversified scientific instruments company. It is a premier provider of electron- and ion-beam microscopes and solutions for nanoscale applications across many industries: industrial and academic materials research, life sciences, semiconductors, data storage, natural resources and more. With more than 60 years of technological innovation and leadership, FEI has set the performance standard in transmission electron microscopes (TEM), scanning electron microscopes (SEM) and DualBeams™, which combine a SEM with a focused ion beam (FIB). Headquartered in Hillsboro, Ore., USA, FEI has over 2,200 employees and sales and service operations in more than 50 countries around the world. More information can be found at: www.fei.com.



FEI Safe Harbor Statement

This news release contains forward-looking statements that include statements regarding the performance capabilities and benefits of the Helios NanoLab 450 F1 DualBeam systems. Factors that could affect these forward-looking statements include but are not limited to failure of the product or technology to perform as expected and achieve anticipated results, unexpected technology problems and challenges, changes to the technology, the inability of FEI, its suppliers or project partners to make the technological advances required for the technology to achieve anticipated results, the inability of customers to develop and deploy the expected new applications and our ability to manufacture, ship and deliver the tools or software as expected. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.

For more information, please click here

Contacts:
For more information contact:

Sandy Fewkes
(media contact)
MindWrite Communications, Inc
+1 408 224 4024


FEI
Fletcher Chamberlin
(investors and analysts)
Investor Relations
+1 503 726 7710

Copyright © FEI Company

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Roll up your screen and stow it away? Tel Aviv University researchers develop molecular backbone of super-slim, bendable digital displays March 30th, 2015

Princess Margaret scientists convert microbubbles to nanoparticles: Harnessing light to advance tumor imaging, provide platform for targeted treatment March 30th, 2015

Wrapping carbon nanotubes in polymers enhances their performance: Scientists at Japan's Kyushu University say polymer-wrapped carbon nanotubes hold much promise in biotechnology and energy applications March 30th, 2015

Tokyo Institute of Technology research: Catalyst redefines rate limitations in ammonia production March 30th, 2015

Imaging

'Atomic chicken-wire' is key to faster DNA sequencing March 30th, 2015

FEI Technology Award of the German Neuroscience Society Goes to Benjamin Judkewitz of the University of Berlin: Bi-annual award honors excellence in brain research during the German Neuroscience Society’s Annual Meeting, held 18-21 March 2015 March 26th, 2015

Square ice filling for a graphene sandwich March 26th, 2015

Renishaw reports on the use of Raman spectroscopy at CNRS Orléans to study materials under extreme conditions March 25th, 2015

Chip Technology

Next important step toward quantum computer: Scientists at the University of Bonn have succeeded in linking 2 different quantum systems March 30th, 2015

State-of-the-art online system unveiled to pinpoint metrology software accuracy March 27th, 2015

SUNY POLY CNSE to Host First Ever Northeast Semi Supply Conference (NESCO) Conference Will Connect New and Emerging Innovators in the Northeastern US and Canada with Industry Leaders and Strategic Investors to Discuss Future Growth Opportunities in NYS March 25th, 2015

NXP and GLOBALFOUNDRIES Announce Production of 40nm Embedded Non-Volatile Memory Technology: Co-developed technology to leverage GLOBALFOUNDRIES 40nm process technology platform March 24th, 2015

Announcements

Princess Margaret scientists convert microbubbles to nanoparticles: Harnessing light to advance tumor imaging, provide platform for targeted treatment March 30th, 2015

Wrapping carbon nanotubes in polymers enhances their performance: Scientists at Japan's Kyushu University say polymer-wrapped carbon nanotubes hold much promise in biotechnology and energy applications March 30th, 2015

Tokyo Institute of Technology research: Catalyst redefines rate limitations in ammonia production March 30th, 2015

Next important step toward quantum computer: Scientists at the University of Bonn have succeeded in linking 2 different quantum systems March 30th, 2015

Tools

'Atomic chicken-wire' is key to faster DNA sequencing March 30th, 2015

LAMDAMAP 2015 hosted by the University March 26th, 2015

FEI Technology Award of the German Neuroscience Society Goes to Benjamin Judkewitz of the University of Berlin: Bi-annual award honors excellence in brain research during the German Neuroscience Society’s Annual Meeting, held 18-21 March 2015 March 26th, 2015

Square ice filling for a graphene sandwich March 26th, 2015

Industrial

Industrial Nanotech, Inc. Announces Next Large Order from the Oil and Gas Industry March 26th, 2015

Young NTU Singapore spin-off clinches S$4.3 million joint venture with Chinese commercial giant March 23rd, 2015

Nanodevice Invented in Iran to Detect Hydrogen Sulfide in Oil, Gas Industry March 20th, 2015

Industrial Production of Nano-Based PVC Products in Iran March 20th, 2015

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2015 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE