Nanotechnology Now







Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > Nanometrics’ IMPULSE Integrated Metrology System Selected by Leading Foundry for Advanced 2x nm Etch Control

Abstract:
Nanometrics Incorporated (NASDAQ: NANO), a leading provider of advanced process control metrology and inspection systems, today announced its IMPULSE® integrated metrology (IM) system, along with its industry-leading NanoDiffract® software for optical critical dimension (OCD) metrology, have been selected by a leading foundry for deployment into advanced 2x nm volume production for front-end-of-line etch process control.

Nanometrics’ IMPULSE Integrated Metrology System Selected by Leading Foundry for Advanced 2x nm Etch Control

Milpitas, CA | Posted on May 7th, 2012

"Nanometrics has worked closely with this leading foundry and a prominent etch OEM platform provider to demonstrate superior process control for key layers and structures with our integrated IMPULSE OCD system and NanoDiffract software. We are pleased to have our comprehensive solution for Process Control Metrology selected for proliferation into volume production for our customer's second generation 2x nm products," commented Steve Bradley, Director of Integrated Metrology at Nanometrics. "Next-generation device manufacturing requires reduced critical dimension (CD) variances within-wafer, wafer-to-wafer, and lot-to-lot, and the IMPULSE system provides unprecedented control of the CDs most closely associated with end device performance and yield."



This selection includes a multi-system follow-on order that represents the first phase of purchases for the deployment of Nanometrics IM solutions into this customer's most advanced 2x nm volume production line.



The IMPULSE system for OCD has been qualified and integrated on multiple platforms from the leading etch companies for transistor, contact and interconnect applications. Beyond etch integrations, Nanometrics' IM solutions are available in configurations to support control of other key fab processes, including CMP, lithography and CVD, and for both thin film and OCD applications. When integrated onto the Lynx platform, in combination with other Nanometrics metrology and inspection systems, device manufacturers can address the most challenging process control applications with the lowest cost of ownership. Nanometrics' customers have the option of deploying integrated metrology in conjunction with automated standalone systems, the Lynx™ Cluster Metrology Platform and the NanoCD™ Suite for a complete fab-wide metrology process control solution.

####

About Nanometrics Incorporated
Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics. Nanometrics’ automated and integrated systems address numerous process control applications, including critical dimension and film thickness measurement, device topography, defect inspection, overlay registration, and analysis of various other film properties such as optical, electrical and material characteristics. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics’ systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO.

For more information, please click here

Contacts:
Company Contact:
Kevin Heidrich
VP, Marketing & Business Development
408-545-6000 x13211


Investor Relations Contact:

Claire McAdams
Headgate Partners LLC
530.265.9899

Copyright © Nanometrics Incorporated

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Iranian Scientists Use MOFs to Eliminate Dye Pollutants January 29th, 2015

Made-in-Singapore rapid test kit detects dengue antibodies from saliva: IBN's MedTech innovation simplifies diagnosis of infectious diseases January 29th, 2015

'Bulletproof' battery: Kevlar membrane for safer, thinner lithium rechargeables January 28th, 2015

Spider electro-combs its sticky nano-filaments January 28th, 2015

Chip Technology

Researchers Make Magnetic Graphene: UC Riverside research could lead to new multi-functional electronic devices January 27th, 2015

Nanometrics to Present at the Stifel 2015 Technology, Internet and Media Conference January 27th, 2015

New pathway to valleytronics January 27th, 2015

Entanglement on a chip: Breakthrough promises secure communications and faster computers January 27th, 2015

Announcements

Iranian Scientists Use MOFs to Eliminate Dye Pollutants January 29th, 2015

Made-in-Singapore rapid test kit detects dengue antibodies from saliva: IBN's MedTech innovation simplifies diagnosis of infectious diseases January 29th, 2015

'Bulletproof' battery: Kevlar membrane for safer, thinner lithium rechargeables January 28th, 2015

Spider electro-combs its sticky nano-filaments January 28th, 2015

Tools

Joint international research project leads to a breakthrough in terahertz spectroscopy January 28th, 2015

JPK opens new expanded offices in Berlin to meet the growing demand for products worldwide January 28th, 2015

Pittcon News: Renishaw adds to the comprehensive imaging options available with its inVia confocal Raman microscope January 27th, 2015

Nanometrics to Present at the Stifel 2015 Technology, Internet and Media Conference January 27th, 2015

New-Contracts/Sales/Customers

Industrial Nanotech, Inc. Announces New OEM Customer January 27th, 2015

DELMIC reports on applications of their SPARC technology at the Chalmers University of Technology in Gothenburg, Sweden December 16th, 2014

Industrial Nanotech, Inc. Expands Government and Defense Projects December 10th, 2014

Iran Exports Nanodrugs to Syria November 24th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2015 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE