Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > JEOL Introduces New Versatile FE-SEM Series for Sub-Nanometer Imaging and Analysis of Nanostructures and Magnetic Samples

Abstract:
JEOL launches a new series of Field Emission Scanning Electron Microscopes (FE-SEM) that offer expanded imaging and analysis capabilities customizable to performance requirements. The JEOL JSM-7100F series offers sub-1 nm imaging capabilities and analytical characterization at the sub-100nm scale, accomplished through the combination of large beam currents with a small probe size at any accelerating voltage.

JEOL Introduces New Versatile FE-SEM Series for Sub-Nanometer Imaging and Analysis of Nanostructures and Magnetic Samples

Peabody, MA | Posted on April 17th, 2012

Designed for the budget-conscious lab, the JSM-7100F model is a highly versatile, easy-to-use analytical field emission SEM that offers a new level of expanded performance. Through the unique 'in-lens field emission gun', the SEM delivers ≥ 200 nA of beam current to the sample. An aperture angle control lens (ACL) automatically optimizes both small probe current spot size for high resolution imaging and spot shape for high beam current, high resolution microanalysis, while a beam deceleration mode curtails charging on nonconductive specimens such as ceramics, semiconductors and polymers.

For advanced high resolution capabilities, the JSM-7100FT model features a newly redesigned hybrid lens and through-the lens detectors with energy filter. The superior electron optics design of this SEM column enables high resolution imaging of nanostructures and specimen surface details for any material type, including magnetic samples. With the integration of in-the-lens acceleration and deceleration of the electron beam, low kV aberrations are reduced, yielding higher resolution at the lowest accelerating voltages. Additionally, JEOL's proven beam deceleration mode (GB Mode) decreases charging while imaging non-conductive specimens, improves spot size at low kV, and enhances surface topography.

This new series of Field Emission SEMs offers increased versatility for multiple analytical techniques and imaging and analysis of non-conductive samples. Each microscope model features a turbo molecular pump (TMP) and a rapid specimen exchange airlock to assure a clean vacuum environment is always maintained.

Optional Low Vacuum Operation

The optional LV function (up to 300 Pa) offers additional versatility to both JSM-7100F and JSM-7100FT. The LV function is fully controlled through the microscope user interface and allows all LV orifices to be retracted without breaking vacuum for unrestricted low magnification imaging and maximum beam current (200 nA) in high vacuum. The LV system is equipped with a solid-state BSE detector.

Adaptable for Multiple Analytical Techniques

The JSM-7100F series is equipped with a large specimen chamber that accommodates a wide variety of detectors and accessories simultaneously and without compromising the performance of one another, including: multiple EDS, WDS, STEM, BSE, CL and IR camera. The system can also be equipped with a variety of sub stages including tensile, heating and cooling stages for in situ experimentation.

Enhanced Productivity

JEOL is renowned for its easy to use SEM operating software, graphical user interface, and productivity-enhancing functions. Stored images retain operating conditions and stage coordinates serving effectively as individual recipe functions, which is ideal in the multi-user environment. All image archiving, searching, measurement, report generation, filtering, and montaging can be conducted from the image database.

####

About JEOL USA, Inc.
JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.

JEOL USA, Inc., a wholly owned subsidiary of JEOL, Ltd., Japan, was incorporated in the United States in 1962. The company has 13 regional service centers that offer unlimited emergency service and support in the U.S.

For more information, please click here

Contacts:
Pamela Mansfield
Marketing Communications
JEOL USA
978.536.2309

Copyright © JEOL USA, Inc.

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Iranian Researchers Synthesize Stable Ceramic Nanopowders at Room Temperature September 20th, 2014

Arrowhead to Present at BioCentury's NewsMakers in the Biotech Industry Conference September 19th, 2014

SouthWest NanoTechnologies (SWeNT) Receives NIST Small Business Innovation Research (SBIR) Phase 1 Award to Produce Greater than 99% Semiconducting Single-Wall Carbon Nanotubes September 19th, 2014

Toward optical chips: A promising light source for optoelectronic chips can be tuned to different frequencies September 19th, 2014

Imaging

IEEE International Electron Devices Meeting To Celebrate 60th Anniversary as The Leading Technical Conference for Advanced Semiconductor Devices September 18th, 2014

FEI Opens New Technology Center in Czech Republic: FEI expands its presence in Brno with the opening of a new, larger facility September 18th, 2014

New NPZ100-403 Piezo Stage from nPoint Inc. September 17th, 2014

New non-invasive technique could revolutionize the imaging of metastatic cancer September 17th, 2014

Announcements

Iranian Scientists Separate Zinc Ion at Low Concentrations September 20th, 2014

Arrowhead to Present at BioCentury's NewsMakers in the Biotech Industry Conference September 19th, 2014

SouthWest NanoTechnologies (SWeNT) Receives NIST Small Business Innovation Research (SBIR) Phase 1 Award to Produce Greater than 99% Semiconducting Single-Wall Carbon Nanotubes September 19th, 2014

Toward optical chips: A promising light source for optoelectronic chips can be tuned to different frequencies September 19th, 2014

Tools

IEEE International Electron Devices Meeting To Celebrate 60th Anniversary as The Leading Technical Conference for Advanced Semiconductor Devices September 18th, 2014

FEI Opens New Technology Center in Czech Republic: FEI expands its presence in Brno with the opening of a new, larger facility September 18th, 2014

New NPZ100-403 Piezo Stage from nPoint Inc. September 17th, 2014

Researchers Create World’s Largest DNA Origami September 11th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE