- About Us
- Nano-Social Network
- Nano Consulting
- My Account
Anasys Instruments, the company that pioneered nanoscale thermal analysis and nanoscale IR spectroscopy using an AFM, is pleased to announce that Dr. Bruce Chase is presenting an invited talk entitled "Structure and Orientation in Electrospun Nanofibers" at the 2012 Pittsburgh Conference, as part of the Organized Contributed Session on Analytical Applications of Broadly Tunable Lasers. The presentation will include spatially resolved measurements of molecular orientation obtained by a technique combining atomic force microscopy and infrared spectroscopy (AFM-IR). The measurements were performed in collaboration with Anasys Instruments using an AFM-IR instrument incorporating arbitrary polarization angle control. "By measuring the infrared absorption of a sample locally as a function of polarization angle, we can identify regions of a sample that have a high degree of molecular orientation," says Anasys CTO Craig Prater. "Controlling molecular orientation is a critically important technology for improving the performance of polymers—with the polarization control capability we provide a new ability to observe molecular orientation with high spatial resolution."
Dr. Chase's presentation will contain important insights on molecular orientation of electrospun PVDF fibers. This is an important research area because of the vast applications of electrospun fibers ranging from textiles and advanced composites to biomedical applications such as tissue engineering scaffolds and artificial blood vessels. Speaking about the results, Professor Chase said that "Our ability to produce enhanced material properties in electrospun fibers is critically dependent on understanding molecular level structure at the nanoscale. The NanoIR results have given us a first look at chain orientation of individual fibers."
Dr. Chase is a Research Professor in the Department of Materials Science and Engineering at the University of Delaware and the Chief Technical Officer of Pair Technologies, LLC. He retired from DuPont in 2009 as a DuPont Fellow and Chair of the DuPont Fellows Forum. His co-authors on this paper are Professor John Rabolt, Karl W. and Renate Boer Professor of Materials Science at the University of Delaware and Xiaoqian Ma, whose doctoral dissertation this research falls under and Dr. Qichi Hu from Anasys who performed the measurements.
About Anasys Instruments
Anasys Instruments Corporation was founded in 2005 by an experienced team of AFM industry pioneers and scientists with the goal of creating innovative analytic tools that enable a better understanding of structure, property, and function at the nanoscale. The Santa Barbara, California-based company has already developed and introduced three award-winning technologies: nanoscale thermal analysis (nano-TA), transition temperature microscopy (TTM), and nanoscale infrared spectroscopy (nanoIR).
For more information, please click here
Anasys Instruments Corporation
121 Gray Avenue, Suite 100
Tel: +1 (805) 730-3310
Talking Science Limited
39 de Bohun Court
Essex CB10 2BA
Tel: +44 (0) 1799 521881
Mob: +44 (0) 7843 012997
Copyright © Anasys InstrumentsIf you have a comment, please Contact us.
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
|Related News Press|
News and information
Explaining how 2-D materials break at the atomic level January 20th, 2017
Distinguishing truth under the surface: electrostatic or mechanic December 31st, 2016
Nanomechanics Inc. Continues Growth in Revenue and Market Penetration: Leading nanoindentation company reports continued growth in revenues and distribution channels on national and international scales December 27th, 2016
Nanometrics to Present at the 19th Annual Needham Growth Conference December 22nd, 2016