- About Us
- Career Center
- Nano-Social Network
- Nano Consulting
- My Account
NT-MDT announced the release of the SOLVER Nano Scanning Probe Microscope (SPM). The SOLVER Nano is an affordable SPM with advanced measurement capabilities. The SOLVER Nano offers research capability at a low cost of ownership.
NT-MDT announces that it has released the SOLVER Nano SPM. The Solver Nano is an SPM that offers advanced features and capability for users with research needs or for new SPM users in an ergonomic compact design at an affordable price.
The SOLVER Nano is a complete SPM, offering Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM) techniques. Notable features include advanced software, digital control electronics, easy to align AFM probe holder design and optional educational measuring head for teaching purposes.
The system comes with many advanced imaging modes built in including Scanning Kelvin Probe Microscopy (SKM), Magnetic Force Microscopy (MFM), Scanning Spreading Resistance Imaging (SSRM), Piezo Force Microscopy (PFM) and 100 micron x 100 micron closed-loop high resolution scanner. Due to ScanScaler TM option the same scanner can be easily adjusted for atomic level resolution.
The SOLVER Nano complements NT-MDT's complete line of AFM products, by offering advanced research capability in an affordable, compact and easy to use SPM system.
Our mission is to enable researchers, engineers and developers to conduct nanoscale research by creating ever more perfect nanotechnology instrumentation. Along the way, we maintain a global perspective, always taking into consideration the needs of student in the classroom, the researcher at the cutting edge in the laboratory, and the practicalities of industrial R&D.
For more information, please click here
NT-MDT Co. Building 100
Zelenograd, Moscow 124482, Russia
Phone: +7 (499) 735-7777
Fax: +7 (499) 735-6410
Copyright © NT-MDTIf you have a comment, please Contact us.
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
|Related News Press|
News and information
FEI Launches Helios G4 DualBeam Series for Materials Science: The Helios G4 DualBeam Series features new capabilities to enable scientists and engineers to answer the most demanding and challenging scientific questions June 27th, 2016