Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > FEI Introduces New Correlative Workflow Solution for Life Sciences: MAPS software combines the advantages of both light and electron microscopy for cellular biology research.

Abstract:
FEI (NASDAQ: FEIC), a leading instrumentation company providing imaging and analysis systems for research and industry, today announced a new correlative workflow solution for research scientists. FEI's MAPS (Modular Automated Processing System) provides a fast and efficient correlative workflow that enables researchers to see both large scale context and small scale detail in one overview. The first application of the MAPS software is for cell biologists, where the system's capabilities improve the typical workflow in a cell biology microscopy laboratory. The solution was introduced at the American Society for Cell Biology Annual Meeting, taking place December 3-7, 2011 in Denver.

FEI Introduces New Correlative Workflow Solution for Life Sciences: MAPS software combines the advantages of both light and electron microscopy for cellular biology research.

Denver, CO | Posted on December 5th, 2011

MAPS provides an easy-to-use workflow to import and correlate an image from any type or brand light microscope with the ultrastructure obtained from an FEI scanning electron microscope (SEM) or DualBeam™ (focused ion beam/SEM) system. Researchers can then quickly navigate to a region of interest identified in the light image, bringing to bear the full resolving power of the electron microscope to reveal ultrastructural detail. MAPS also enables the assembly of high-resolution, large-field images by automatically acquiring a grid of smaller electron microscope image tiles and stitching them together in a composite image that can reveal large scale relationships and organization, while still preserving full resolution detail throughout.

"The functionality and automation within MAPS is new to the industry," noted Dominique Hubert, vice president and general manager for the Life Sciences Business Unit of FEI. "We can work with digital images from any light microscope, so light microscopists can now leverage the SEM's high resolving power to see biological details in a new way. MAPS offers electron microscopists a rapid navigation technique that will enable them to save time when finding regions of interest before zooming in for ultrastructural details. The wide field and high resolution of the stitched images provide an innovative combination of contextual information and ultrastructural detail."

"In addition to the life sciences, we see potential benefits of MAPS in others industries, such as oil & gas, mining, electronics and materials science," said Hubert.

The MAPS software is available now for current FEI SEM and DualBeam systems. For more information, visit www.fei.com/maps or stop by booth 109 at the American Society for Cell Biology show.

####

About FEI Company
FEI (Nasdaq: FEIC) is a leading diversified scientific instruments company. It is a premier provider of electron- and ion-beam microscopes and solutions for nanoscale applications across many industries: industrial and academic materials research, life sciences, semiconductors, data storage, natural resources and more. With more than 60 years of technological innovation and leadership, FEI has set the performance standard in transmission electron microscopes (TEM), scanning electron microscopes (SEM) and DualBeams™, which combine a SEM with a focused ion beam (FIB). Headquartered in Hillsboro, Ore., USA, FEI has over 2,000 employees and sales and service operations in more than 50 countries around the world. More information can be found at: www.fei.com.

FEI Safe Harbor Statement

This news release contains forward-looking statements that include statements regarding the performance capabilities and benefits of the MAPS solution. Factors that could affect these forward-looking statements include but are not limited to failure of the product or technology to perform as expected and achieve anticipated results, unexpected technology problems and our ability to manufacture, ship and deliver the tools or software as expected. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.

For more information, please click here

Contacts:
Sandy Fewkes
(media contact)
MindWrite Communications, Inc
+1 408 224 4024


FEI Company
Fletcher Chamberlin
(investors and analysts)
Investor Relations
+1 503 726 7710

Copyright © FEI Company

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Imaging

Atom-thick CCD could capture images: Rice University scientists develop two-dimensional, light-sensitive material December 20th, 2014

News and information

Atom-thick CCD could capture images: Rice University scientists develop two-dimensional, light-sensitive material December 20th, 2014

Oregon researchers glimpse pathway of sunlight to electricity: Collaboration with Lund University uses modified UO spectroscopy equipment to study 'maze' of connections in photoactive quantum dots December 19th, 2014

Instant-start computers possible with new breakthrough December 19th, 2014

Aculon Hires New Business Development Director December 19th, 2014

Software

Spectral Surface Mapping with Microscopic Resolution: CRAIC Technologies introduces Spectral Surface Mapping™ (S2M™) software November 18th, 2014

FEI Releases New Electronics Failure Analysis Applications for Helios NanoLab DualBeam Portfolio: Dx gas chemistry enables rapid delayering of ICs, while AutoLX advanced automation simplifies sample preparation for transmission electron microscopy November 3rd, 2014

QuantumWise guides the semiconductor industry towards the atomic scale October 24th, 2014

Strengthening thin-film bonds with ultrafast data collection October 23rd, 2014

Announcements

Atom-thick CCD could capture images: Rice University scientists develop two-dimensional, light-sensitive material December 20th, 2014

Oregon researchers glimpse pathway of sunlight to electricity: Collaboration with Lund University uses modified UO spectroscopy equipment to study 'maze' of connections in photoactive quantum dots December 19th, 2014

Instant-start computers possible with new breakthrough December 19th, 2014

Aculon Hires New Business Development Director December 19th, 2014

Tools

Atom-thick CCD could capture images: Rice University scientists develop two-dimensional, light-sensitive material December 20th, 2014

Oregon researchers glimpse pathway of sunlight to electricity: Collaboration with Lund University uses modified UO spectroscopy equipment to study 'maze' of connections in photoactive quantum dots December 19th, 2014

Switching to spintronics: Berkeley Lab reports on electric field switching of ferromagnetism at room temp December 17th, 2014

ORNL microscopy pencils patterns in polymers at the nanoscale December 17th, 2014

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE