Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > Extrel MAX-UF Series, Ultra-Fast Scanning Mass Spectrometers

Abstract:
The Extrel MAX Series quadrupole mass spectrometers from Henniker Scientific now feature dual, interchangeable analog and digital pulse ion counting pre-amplification stages that deliver individual data point acquisition at just 80 microseconds per sample.

Extrel MAX-UF Series, Ultra-Fast Scanning Mass Spectrometers

Warrington, UK | Posted on December 5th, 2011

Full range measurement over 10 decades is now possible with fractional mass unit detail at scan speeds in excess of 1000amu/sec, addressing a diverse range of fast transient studies in atomic and molecular physics and chemistry research.

Based around the industry leading 19mm triple filter quadrupole technology, each instrument is configurable with more than 25 ion source versions, choice of ion optics and energy filters for combined mass and energy analysis of positive and negative ions, and single or compound molecular beam inlet pressure reduction stages that span a wide pressure range from XHV to atmospheric pressure and above.

Mass range options extend to 16,000 amu for nano-cluster experiments, whereas high resolution versions are routinely capable of separating helium and deuterium. Partial pressures in the 10E-16mbar range can be measured with parts per billion abundance sensitivity and long term stability.

####

For more information, please click here

Contacts:
Henniker Scientific Ltd
Cavendish House Birchwood Park Warrington WA3 6BU UK
Tel: +44 (0) 1925 811254
Fax: +44 (0) 1925 800035

Copyright © Henniker Scientific Ltd

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Zap! Graphene is bad news for bacteria: Rice, Ben-Gurion universities show laser-induced graphene kills bacteria, resists biofouling May 22nd, 2017

Leti Will Demo World’s-first WVGA 10-µm Pitch GaN Microdisplays for Augmented Reality Video at Display Week in Los Angles: Invited Paper also Will Present Leti’s Success with New Augmented Reality Technology That Reduces Pixel Pitch to Less than 5 Microns May 22nd, 2017

Sensors detect disease markers in breath May 19th, 2017

Graphene-nanotube hybrid boosts lithium metal batteries: Rice University prototypes store 3 times the energy of lithium-ion batteries May 19th, 2017

Announcements

Zap! Graphene is bad news for bacteria: Rice, Ben-Gurion universities show laser-induced graphene kills bacteria, resists biofouling May 22nd, 2017

Leti Will Demo World’s-first WVGA 10-µm Pitch GaN Microdisplays for Augmented Reality Video at Display Week in Los Angles: Invited Paper also Will Present Leti’s Success with New Augmented Reality Technology That Reduces Pixel Pitch to Less than 5 Microns May 22nd, 2017

Sensors detect disease markers in breath May 19th, 2017

Graphene-nanotube hybrid boosts lithium metal batteries: Rice University prototypes store 3 times the energy of lithium-ion batteries May 19th, 2017

Tools

Plasmon-powered upconversion nanocrystals for enhanced bioimaging and polarized emission: Plasmonic gold nanorods brighten lanthanide-doped upconversion superdots for improved multiphoton bioimaging contrast and enable polarization-selective nonlinear emissions for novel nanoscal May 19th, 2017

The brighter side of twisted polymers: Conjugated polymers designed with a twist produce tiny, brightly fluorescent particles with broad applications May 16th, 2017

Racyics Launches ‘makeChip’ Design Service Platform for GLOBALFOUNDRIES’ 22FDX® Technology: Racyics will provide IP and design services as a part of the foundry’s FDXcelerator™ Partner Program May 11th, 2017

UnitySC Announces Wafer Thinning Inspection System; Win from Power Semiconductor IDM for Automotive: Leading IDM Selects New 4See Series Automated Defect Inspection Platform for Power Semiconductor Automotive Applications May 11th, 2017

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project