Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > Agilent Technologies’ New Nanoindentation Technique Enables Faster, Easier Evaluation of ‘Creep’ for Materials Science Applications

Abstract:
Agilent Technologies Inc. (NYSE: A) today announced a new method for evaluating the slow deformation of materials under small stresses (a phenomenon known as "creep") via the use of instrumented indentation.

Agilent Technologies’ New Nanoindentation Technique Enables Faster, Easier Evaluation of ‘Creep’ for Materials Science Applications

Santa Clara, CA | Posted on December 1st, 2011

Available exclusively on the Agilent Nano Indenter G200 platform, the new technique is simpler, faster and easier than uniaxial creep testing. It can be used to map the spatial distribution of creep capacity in complex materials and is insensitive to thermal drift.

"This innovative nanoindentation method further extends the already impressive utility of our Nano Indenter G200 platform," said Jeff Jones, general manager for Agilent's nano measurement facility in Chandler, Ariz. "The unique new capability will immediately improve testing protocols and increase the use and speed of measurement for our customers in materials research and development."

The experimentally robust test method allows researchers to measure strain-rate sensitivity, the most important quantification of creep. It overcomes problems associated with long testing times by imposing small strain rates only when the applied force is large. Values acquired on standard references with the new technique are in agreement with values obtained by others on similar materials utilizing both instrumented indentation and uniaxial creep testing. The easy-to-use method is implemented in the Agilent NanoSuite software package for the G200.

The world's most accurate, flexible and user-friendly instrument for nanoscale mechanical testing, the G200 utilizes electromagnetic actuation to achieve unparalleled dynamic range in force and displacement. The G200 enables measurement of Young's modulus and hardness in compliance with ISO 14577, as well as measurement of deformation over six orders of magnitude - from nanometers to millimeters.

Nanomechanical Systems from Agilent Technologies

Agilent Technologies offers high-precision, modular nanomeasurement solutions for research, industry and education. Exceptional worldwide support is provided by experienced application scientists and technical service personnel. Agilent's leading-edge R&D laboratories ensure the timely introduction and optimization of innovative and easy-to-use nanomechanical system technologies.

####

About Agilent Technologies Inc.
Agilent Technologies Inc. (NYSE: A) is the world’s premier measurement company and a technology leader in chemical analysis, life sciences, electronics and communications. The company’s 18,700 employees serve customers in more than 100 countries. Agilent had net revenues of $6.6 billion in fiscal 2011.

For more information, please click here

Contacts:
Janet Smith
Americas
+1 970 679 5397

Twitter: @JSmithAgilent

Joan Horwitz
nano measurement, Americas
+1 480 756 5905

Copyright © Agilent Technologies Inc.

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Freeze-dried foam soaks up carbon dioxide: Rice University scientists lead effort to make novel 3-D material August 16th, 2017

Gold shines through properties of nano biosensors: Researchers discover that fluorescence in ligand-protected gold nanoclusters is an intrinsic property of the gold particles themselves August 16th, 2017

Two Scientists Receive Grants to Develop New Materials: Chad Mirkin and Monica Olvera de la Cruz recognized by Sherman Fairchild Foundation August 16th, 2017

Scientists from the University of Manchester and Diamond Light Source work with Deben to develop and test a new compression stage to study irradiated graphite at elevated temperatures August 15th, 2017

Software

Technology Companies Join Forces for TEM Imaging and Analysis August 3rd, 2017

Nanometrics Introduces SpectraProbe Analysis Software: Advanced software and algorithms enhancing Nanometrics metrology fleet capabilities fab-wide July 13th, 2017

Nanometrics Releases NanoDiffract 4: Latest software extends process control capabilities for advanced 3D devices July 11th, 2017

Learning with light: New system allows optical “deep learning”: Neural networks could be implemented more quickly using new photonic technology June 12th, 2017

Announcements

Freeze-dried foam soaks up carbon dioxide: Rice University scientists lead effort to make novel 3-D material August 16th, 2017

Gold shines through properties of nano biosensors: Researchers discover that fluorescence in ligand-protected gold nanoclusters is an intrinsic property of the gold particles themselves August 16th, 2017

Two Scientists Receive Grants to Develop New Materials: Chad Mirkin and Monica Olvera de la Cruz recognized by Sherman Fairchild Foundation August 16th, 2017

Scientists from the University of Manchester and Diamond Light Source work with Deben to develop and test a new compression stage to study irradiated graphite at elevated temperatures August 15th, 2017

Tools

Scientists from the University of Manchester and Diamond Light Source work with Deben to develop and test a new compression stage to study irradiated graphite at elevated temperatures August 15th, 2017

FRITSCH • Milling and Sizing! Innovations at POWTECH 2017 - Hall 2 • Stand 227 August 9th, 2017

New Quattro Field Emission ESEM Emphasizes Versatility and Ease of Use: Thermo Scientific Quattro ESEM allows materials science researchers to study nanoscale structure in almost any material under a range of environmental conditions August 8th, 2017

Thermo Fisher Scientific’s New Talos F200i S/TEM Delivers Flexible, High-Performance Imaging: New compact S/TEM can be configured to meet specific imaging and analytical requirements for materials characterization in research laboratories August 8th, 2017

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project