Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Agilent Technologies’ New Nanoindentation Technique Enables Faster, Easier Evaluation of ‘Creep’ for Materials Science Applications

Abstract:
Agilent Technologies Inc. (NYSE: A) today announced a new method for evaluating the slow deformation of materials under small stresses (a phenomenon known as "creep") via the use of instrumented indentation.

Agilent Technologies’ New Nanoindentation Technique Enables Faster, Easier Evaluation of ‘Creep’ for Materials Science Applications

Santa Clara, CA | Posted on December 1st, 2011

Available exclusively on the Agilent Nano Indenter G200 platform, the new technique is simpler, faster and easier than uniaxial creep testing. It can be used to map the spatial distribution of creep capacity in complex materials and is insensitive to thermal drift.

"This innovative nanoindentation method further extends the already impressive utility of our Nano Indenter G200 platform," said Jeff Jones, general manager for Agilent's nano measurement facility in Chandler, Ariz. "The unique new capability will immediately improve testing protocols and increase the use and speed of measurement for our customers in materials research and development."

The experimentally robust test method allows researchers to measure strain-rate sensitivity, the most important quantification of creep. It overcomes problems associated with long testing times by imposing small strain rates only when the applied force is large. Values acquired on standard references with the new technique are in agreement with values obtained by others on similar materials utilizing both instrumented indentation and uniaxial creep testing. The easy-to-use method is implemented in the Agilent NanoSuite software package for the G200.

The world's most accurate, flexible and user-friendly instrument for nanoscale mechanical testing, the G200 utilizes electromagnetic actuation to achieve unparalleled dynamic range in force and displacement. The G200 enables measurement of Young's modulus and hardness in compliance with ISO 14577, as well as measurement of deformation over six orders of magnitude - from nanometers to millimeters.

Nanomechanical Systems from Agilent Technologies

Agilent Technologies offers high-precision, modular nanomeasurement solutions for research, industry and education. Exceptional worldwide support is provided by experienced application scientists and technical service personnel. Agilent's leading-edge R&D laboratories ensure the timely introduction and optimization of innovative and easy-to-use nanomechanical system technologies.

####

About Agilent Technologies Inc.
Agilent Technologies Inc. (NYSE: A) is the world’s premier measurement company and a technology leader in chemical analysis, life sciences, electronics and communications. The company’s 18,700 employees serve customers in more than 100 countries. Agilent had net revenues of $6.6 billion in fiscal 2011.

For more information, please click here

Contacts:
Janet Smith
Americas
+1 970 679 5397

Twitter: @JSmithAgilent

Joan Horwitz
nano measurement, Americas
+1 480 756 5905

Copyright © Agilent Technologies Inc.

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Oregon researchers glimpse pathway of sunlight to electricity: Collaboration with Lund University uses modified UO spectroscopy equipment to study 'maze' of connections in photoactive quantum dots December 19th, 2014

Instant-start computers possible with new breakthrough December 19th, 2014

Aculon Hires New Business Development Director December 19th, 2014

Iranian Scientists Use Nanotechnology to Increase Power, Energy of Supercapacitors December 18th, 2014

Software

Spectral Surface Mapping with Microscopic Resolution: CRAIC Technologies introduces Spectral Surface Mapping™ (S2M™) software November 18th, 2014

FEI Releases New Electronics Failure Analysis Applications for Helios NanoLab DualBeam Portfolio: Dx gas chemistry enables rapid delayering of ICs, while AutoLX advanced automation simplifies sample preparation for transmission electron microscopy November 3rd, 2014

QuantumWise guides the semiconductor industry towards the atomic scale October 24th, 2014

Strengthening thin-film bonds with ultrafast data collection October 23rd, 2014

Announcements

Oregon researchers glimpse pathway of sunlight to electricity: Collaboration with Lund University uses modified UO spectroscopy equipment to study 'maze' of connections in photoactive quantum dots December 19th, 2014

Instant-start computers possible with new breakthrough December 19th, 2014

Aculon Hires New Business Development Director December 19th, 2014

Iranian Scientists Use Nanotechnology to Increase Power, Energy of Supercapacitors December 18th, 2014

Tools

Oregon researchers glimpse pathway of sunlight to electricity: Collaboration with Lund University uses modified UO spectroscopy equipment to study 'maze' of connections in photoactive quantum dots December 19th, 2014

Switching to spintronics: Berkeley Lab reports on electric field switching of ferromagnetism at room temp December 17th, 2014

ORNL microscopy pencils patterns in polymers at the nanoscale December 17th, 2014

Unraveling the light of fireflies December 17th, 2014

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE