Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Hitachi High-Technologies Launches New SU8000 Family of Field Emission Scanning Electron Microscopes

Abstract:
Hitachi High-Technologies has launched the SU8000 family of ultra high resolution field emission scanning electron microscopes (FESEMs) for investigating the fine surface structure of materials in a wide range of nanotechnology fields. The new SU8000 Series features a common, high performance electron optical platform to provide excellent imaging performance, and offers a variety of stages, chambers and signal detection systems to meet the wide variety of customer-specific needs for ultra high resolution microscopy.

Hitachi High-Technologies Launches New SU8000 Family of Field Emission Scanning Electron Microscopes

Maidenhead, UK | Posted on July 20th, 2011

The new SU8010, SU8020 and SU8030 join the existing SU8040 to form this comprehensive family of ultra high resolution microscopes. A high brightness cold cathode field emission source is used in combination with the latest generation of Hitachi's patented super ExB in-lens detection systems for energy filtering, charge suppression, and contrast control. All microscopes offer excellent imaging performance at low accelerating voltage to minimize sample damage, and enhanced electron deceleration technology has improved resolution at ultra low landing voltages to just 1.3nm at 1.0kV.

All members of the SU8000 family are equipped with specimen exchange chambers and lens-integrated liquid nitrogen traps as standard, guaranteeing high chamber vacuum and thus minimized contamination.

The SU8010 is the entry level model with dual (upper and lower) secondary electron detectors with secondary and backscattered electron signal mixing capabilities for versatile imaging. A 3-axis motorized stage is provided as standard, capable of accommodating samples up to 100 mm diameter.

The SU8020 offers the same sample handling capabilities using a 5-axis motorized stage as standard but benefits from Hitachi's unique triple detector system to extend the capability to collect secondary electrons and low energy backscattered electrons. This novel, ultra-sensitive detection system allows high efficiency, simultaneous multi-signal imaging and energy filtering even in beam deceleration mode, providing the capability to observe the absolute surface structure as well as properties such as surface potential contrast.



The SU8030 features a large chamber with large specimen stage for large or multiple samples. It can accommodate samples up to 150 mm in diameter. The SU8030 also benefits from the triple detector system.


The SU8040 is the top of the range model. In addition to the same detection system and chamber as used for the SU8030, the SU8040 features the "Regulus" stage which offers the extremely fine specimen stage control and repeatability that is needed for smooth operation at ultra-high magnifications, like navigation on advanced semiconductor devices.

The entire SU8000 family benefits from a user-friendly GUI, while a 24.1 inch monitor contributes to comfortable operation. A wide range of optional accessories is available to meet customer-specific needs. These include backscattered electron detectors, scanning transmission detectors, energy dispersive X-ray (EDX) analysis systems or cryogenic substages.

####

For more information, please click here

Contacts:
Press Enquiries:
In Press Public Relations Ltd
PO Box 24
Royston, Herts, SG8 6TT
Tel: +44 (0)1763 262621

www.inpress.co.uk

Other Enquiries:
Hitachi High-Technologies Corporation
Whitebrook Park, Lower Cookham Road
Maidenhead, Berkshire SL6 8YA
Tel: + 44 (0) 800 316 1500

Copyright © Hitachi High-Technologies Corporation

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Future flexible electronics based on carbon nanotubes: Study in Applied Physics Letters show how to improve nanotube transistor and circuit performance with fluoropolymers September 23rd, 2014

Nanotubes help healing hearts keep the beat: Rice University, Texas Children’s Hospital patch for defects enhances electrical connections between cells September 23rd, 2014

Immune system is key ally in cyberwar against cancer: Rice University study yields new two-step strategy for weakening cancer September 23rd, 2014

Los Alamos Researchers Uncover New Properties in Nanocomposite Oxide Ceramics for Reactor Fuel, Fast-Ion Conductors: Misfit dislocations are key to transport properties across material interfaces September 23rd, 2014

Imaging

IEEE International Electron Devices Meeting To Celebrate 60th Anniversary as The Leading Technical Conference for Advanced Semiconductor Devices September 18th, 2014

FEI Opens New Technology Center in Czech Republic: FEI expands its presence in Brno with the opening of a new, larger facility September 18th, 2014

New NPZ100-403 Piezo Stage from nPoint Inc. September 17th, 2014

New non-invasive technique could revolutionize the imaging of metastatic cancer September 17th, 2014

Announcements

Future flexible electronics based on carbon nanotubes: Study in Applied Physics Letters show how to improve nanotube transistor and circuit performance with fluoropolymers September 23rd, 2014

Nanotubes help healing hearts keep the beat: Rice University, Texas Children’s Hospital patch for defects enhances electrical connections between cells September 23rd, 2014

Immune system is key ally in cyberwar against cancer: Rice University study yields new two-step strategy for weakening cancer September 23rd, 2014

Los Alamos Researchers Uncover New Properties in Nanocomposite Oxide Ceramics for Reactor Fuel, Fast-Ion Conductors: Misfit dislocations are key to transport properties across material interfaces September 23rd, 2014

Tools

IEEE International Electron Devices Meeting To Celebrate 60th Anniversary as The Leading Technical Conference for Advanced Semiconductor Devices September 18th, 2014

FEI Opens New Technology Center in Czech Republic: FEI expands its presence in Brno with the opening of a new, larger facility September 18th, 2014

New NPZ100-403 Piezo Stage from nPoint Inc. September 17th, 2014

Researchers Create World’s Largest DNA Origami September 11th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE