Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > New JEOL Large Angle Energy Dispersive Spectrometer (EDS) for Ultrafast Elemental Mapping of S/TEM Samples

Abstract:
JEOL has developed a new generation of Energy Dispersive Spectrometer (EDS) for ultrafast, ultrasensitive collection of X-rays through analysis with its Scanning Transmission Electron Microscopes (S/TEM). Centurio from JEOL is a novel Silicon Drift Detector (SDD) EDS that collects X-rays from samples at an unprecedented large solid angle of up to 0.98 steradians from a detection area of 100mm2. The larger the solid angle of measurement, the more data the EDS collects to construct detailed analytical maps of the elements in the sample.

New JEOL Large Angle Energy Dispersive Spectrometer (EDS) for Ultrafast Elemental Mapping of S/TEM Samples

Peabody, MA | Posted on July 7th, 2011

With the ability to efficiently collect x-rays at very high count rates, Centurio speeds elemental mapping and improves element detection sensitivity without loss of energy resolution. Large pixel number EDS maps can be made at rates ten times faster than with previous EDS designs, with excellent signal-to-noise ratio. Combined with the large probe currents in small probe sizes attainable with aberration-corrected STEM, fast, efficient atomic resolution EDS analysis is possible.



The automatically retractable side entry design allows fast repositioning to avoid irradiation from back-scattered electrons.



Centurio exponentially expands the elemental mapping capability for the JEOL 200kV and higher TEMs, including the JEM-ARM200F atomic resolution TEM with optional cold Field Emission Gun, and the new JEM-2800 automated, high throughput, nano-area analysis TEM.

www.jeolusa.com/PRODUCTS/ElectronOptics/TransmissionElectronMicroscopesTEM/Analytical/Centuriooption/tabid/811/Default.aspx

####

About JEOL USA, Inc.
JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.

JEOL USA, Inc., a wholly owned subsidiary of JEOL, Ltd., Japan, was incorporated in the United States in 1962. The company has 13 regional service centers that offer unlimited emergency service and support in the U.S.

For more information, please click here

Contacts:
JEOL USA, Inc.
11 Dearborn Road
Peabody, MA 01960
978-535-5900

Patricia Corkum
978-536-2273

Copyright © JEOL USA, Inc.

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

'Stealth' nanoparticles could improve cancer vaccines October 1st, 2014

Stressed Out: Research Sheds New Light on Why Rechargeable Batteries Fail October 1st, 2014

New Absorber Will Lead to Better Biosensor: Biosensors are more sensitive and able to detect smaller changes in the environment October 1st, 2014

Graphene chips are close to significant commercialization October 1st, 2014

Imaging

Stressed Out: Research Sheds New Light on Why Rechargeable Batteries Fail October 1st, 2014

Announcements

'Stealth' nanoparticles could improve cancer vaccines October 1st, 2014

Stressed Out: Research Sheds New Light on Why Rechargeable Batteries Fail October 1st, 2014

New Absorber Will Lead to Better Biosensor: Biosensors are more sensitive and able to detect smaller changes in the environment October 1st, 2014

Graphene chips are close to significant commercialization October 1st, 2014

Tools

Stressed Out: Research Sheds New Light on Why Rechargeable Batteries Fail October 1st, 2014

Yale University and Leica Microsystems Partner to Establish Microscopy Center of Excellence: Yale Welcomes Scientists to Participate in Core Facility Opening and Super- Resolution Workshops October 20 Through 31, 2014 September 30th, 2014

Park Systems Announces Outsourced Analytical Services Including AFM Surface Imaging, Data Analysis and Interpretation September 30th, 2014

Iranian Scientists Determine Grain Size, Minimize Time of Nanocomposite Synthesis September 29th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE