Home > Press > Small Spot Film Thickness, UV Microscopy and Raman Microspectroscopy of Large Scale Devices- The 20/20 XL™ from CRAIC Technologies
Abstract:
The 20/20 XL™ is designed to work with large scale samples, such as 300 mm wafers, to measure thin film thickness as well as the Raman spectra of microscopic sampling areas. The 20/20 XL™ also offers UV microscopy, a full spectroscopy suite as well as either manual or automated operation. Because of the flexible instrument design, the is no upper limit to the sample size which makes this instrument perfect for everything from quality control of the largest flat panel displays to film thickness of 300 mm wafers.
CRAIC Technologies has developed a new solution for the semiconductor industry: the 20/20 XL™ Film Thickness Measurement Tool. The 20/20 XL™ is a microspectrophotometer is designed to non-destructively analyze microscopic areas of very large samples. This system offers the ability to measure the thickness of thin films in both transmission and reflectance. If also offers the ability to measure the Raman spectra of microscopic samples, along with Ultraviolet and Near Infrared microscopy of semiconductor and other types of samples. Due to its flexible design, which gives it the ability to analyze the largest samples, applications are numerous and include mapping thin film thickness of large devices, locating and identifying contaminants, measuring strain in silicon and much more. With the ability to spectrally analyze and image microscopic samples or microscopic areas on large devices, the 20/20 XL™ microspectrophotometer is the cutting-edge micro-analysis tool for anufacturing facilities.
"CRAIC Technologies has been an innovator in the field of UV-visible-NIR microanalysis since its founding. We have helped to advance the field of microscale analysis with innovative instrumentation, software, research and teaching. The 20/20 XL™ microspectrophotometer was born out of demand from our industrial customers to be able to microscopic features of very large devices by small spot film thickness measurement, Raman microspectroscopy and spectral imaging from the deep UV to the near IR" states Dr. Paul Martin, President of CRAIC Technologies. "As such, we have listened to our customers and created the 20/20 XL™, a system backed by years of experience in designing, building and the using of this type of instrumentation for spectroscopic and image analysis."
The 20/20 XL™ microspectrophotometer offers an advanced film thickness measurement unit, a Raman spectrometer, a sophisticated UV-visible-NIR range microscope, high-resolution digital imaging and powerful, easy-to-use software. This flexible instrument is designed to attach to large frames that can accomodate large scale samples. It is able to acquire data from microscopic features of very large samples by absorbance, reflectance or even luminescence spectroscopy. By including high-resolution digital imaging, the user is also able to use the instrument as a ultraviolet or infrared microscope. Additionally, CRAIC Apollo™ Raman spectroscopy modules may be added so the user may also acquire small spot Raman spectra. Touch screen controls, sophisticated software, calibrated variable apertures and other innovations all point to a new level of sophistication for microanalysis. With high sensitivity, durable design, ease-of-use, multiple imaging and spectroscopic techniques, automation and the support of CRAIC Technologies, the 20/20 XL™ is more than just a quality control measurement tool…it is the solution to your analytical challenges.
For more information on the 20/20 XL Film ™ Thickness Measurement Tool and the Perfect Vision for Science™, visit www.microspectra.com.
####
About CRAIC Technologies
CRAIC Technologies, Inc. is a global technology leader focused on innovations for microscopy and microspectroscopy in the ultraviolet, visible and near-infrared regions. CRAIC Technologies creates cutting-edge solutions, with the very best in customer support, by listening to our customers and implementing solutions that integrate operational excellence and technology expertise. CRAIC Technologies provides answers for customers in forensic sciences, biotechnology, semiconductor, geology, nanotechnology and materials science markets who demand quality, accuracy, precision, speed and the best in customer support.
For more information, please click here
Contacts:
CRAIC Technologies, Inc.
+1-310-573-8180
Copyright © CRAIC Technologies, Inc.
If you have a comment, please Contact us.Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
Related News Press |
News and information
Simulating magnetization in a Heisenberg quantum spin chain April 5th, 2024
NRL charters Navy’s quantum inertial navigation path to reduce drift April 5th, 2024
Discovery points path to flash-like memory for storing qubits: Rice find could hasten development of nonvolatile quantum memory April 5th, 2024
Imaging
Nanoscale CL thermometry with lanthanide-doped heavy-metal oxide in TEM March 8th, 2024
The USTC realizes In situ electron paramagnetic resonance spectroscopy using single nanodiamond sensors November 3rd, 2023
Observation of left and right at nanoscale with optical force October 6th, 2023
Chip Technology
Discovery points path to flash-like memory for storing qubits: Rice find could hasten development of nonvolatile quantum memory April 5th, 2024
Utilizing palladium for addressing contact issues of buried oxide thin film transistors April 5th, 2024
HKUST researchers develop new integration technique for efficient coupling of III-V and silicon February 16th, 2024
Announcements
NRL charters Navy’s quantum inertial navigation path to reduce drift April 5th, 2024
Discovery points path to flash-like memory for storing qubits: Rice find could hasten development of nonvolatile quantum memory April 5th, 2024
Tools
Ferroelectrically modulate the Fermi level of graphene oxide to enhance SERS response November 3rd, 2023
The USTC realizes In situ electron paramagnetic resonance spectroscopy using single nanodiamond sensors November 3rd, 2023
The latest news from around the world, FREE | ||
Premium Products | ||
Only the news you want to read!
Learn More |
||
Full-service, expert consulting
Learn More |
||