- About Us
- Nano-Social Network
- Nano Consulting
- My Account
JEOL offers a new point-and-shoot navigation system that makes finding precise locations on a sample both fast and easy for SEM and EPMA users. The Stage Navigation System combines Stage Navigation Software with an externally-mounted 3 Megapixel CMOS color digital Stage Navigation Camera that functions as a low magnification optical microscope. The external camera eliminates the need for a dedicated port on the electron column. The user simply records an image of the sample, sends the image to the SEM, places the sample on the sample stage, then clicks on the recorded image to specify the area of interest. The software automatically positions the stage with pixel-precision to the exact area of the sample to be examined.
The JEOL Stage Navigation Software, optional with any new generation JEOL tungsten, LaB6, or field emission SEM and EPMA system, makes it easy to select a precise area of a sample to image at high magnifications. It can be used in conjunction with a CCD camera, or with the standalone SNS Camera.
The externally-mounted SNS camera is secured on a camera base and can be located anywhere convenient to the lab. The docking stand simulates the JSM-6XX0 series and FEG Series stage and is dovetail holder-compatible. The camera features 3, 4. 5, and 6" selectable fields of view and uses a high frequency variable light source. A transmitted polarized illuminator for geological samples is also available. The camera functions between any combination of JEOL SEMs and EPMA systems with licensed software.
We are a leading supplier of scanning electron microscopes (SEMs), transmission electron microscopes (TEMs), scanning probe microscopes (SPMs), mass spectrometers, NMR spectrometers, and semiconductor tools for scientific and industrial purposes. We provide applications-specific solutions that advance our customers' diverse objectives — from routine analysis of organic and inorganic specimens to breakthroughs in nanotechnological development.
For more information, please click here
JEOL USA, Inc.
11 Dearborn Road
Peabody, MA 01960
Tel. (978) 535-5900
Fax (978) 536-2205
Copyright © JEOLIf you have a comment, please Contact us.
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
|Related News Press|
News and information
“Cysteine Rose” Wins 2016 Thermo Fisher Scientific Electron Microscopy Image Contest: Thermo Fisher honors Andrea Jacassi of the Italian Institute of Technology for image of cysteine crystals using focused ion beam techniques March 27th, 2017
Leti and HORIBA Scientific to Host Webinar on Ultrafast Characterization Tool: Plasma Profiling Time-of-Flight Mass Spectrometer Tool Cuts Optimization Time In Layer Deposition and Fabrication of Wide Range of Applications March 27th, 2017
Leti to Release Versatile SensiNact IoT Platform for Open-Source Development: Middleware Collects, Aggregates and Secures Scripting of Data From Multiple Devices via Virtually Any IoT Communication Protocol March 14th, 2017
Nanomechanics Inc. Continues Growth in Revenue and Market Penetration: Leading nanoindentation company reports continued growth in revenues and distribution channels on national and international scales December 27th, 2016
Companies Now Can Bring Fast and Accurate Nanoparticle Analysis In-House November 11th, 2016
SUN shares its latest achievements during the 3rd Annual Project Meeting November 1st, 2016
ATTOPSEMI Technology Joins FDXcelerator Program to Deliver Advanced Non-Volatile Memory IP to GLOBALFOUNDRIES 22 FDX® Technology Platform: Leading-edge I-fuse™ brings higher reliability, smaller cell size and ease of programmability for consumer, automotive, and IoT applications March 27th, 2017