Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > Cameca launches new field emission electron probe microanalyzer (FE-EPMA):SXFiveFE for Quantitative Microanalysis and X-Ray Imaging at High-Spatial Resolution

Abstract:
CAMECA--a world leader in scientific instrumentation and metrology solutions--has unveiled the SXFiveFE, a field emission electron probe microanalyzer (FE-EPMA) that is the latest addition to the CAMECA line of high-end microanalytical instruments.

Cameca launches new field emission electron probe microanalyzer (FE-EPMA):SXFiveFE for Quantitative Microanalysis and X-Ray Imaging at High-Spatial Resolution

Gennevilliers, France | Posted on May 23rd, 2011

"We are very proud to introduce the SXFiveFE microanalyzer, because we believe it represents a major advancement in microanalysis technology," comments Georges Antier, CAMECA Vice President and Business Unit Manager. "Developed for a wide range of micro and nanoanalytical applications, the SXFiveFE EPMA is CAMECA's fifth generation electron probe microanalyzer and the culmination of our more than 50 years experience in EPMA technology.

"This highly sophisticated instrument combines proven technology from our SIMS and other EPMA products with the latest developments in general purpose EPMA, including the addition of a field emission source," he adds.

"The SXFiveFE brings together all of the best features of CAMECA's earlier electron probe microanalyzers and incorporates a number of other features, including the unique combination of a field emission electron column and CAMECA's industry-leading high-sensitivity and resolution spectrometers, that we consider a major breakthrough in microanalysis," notes Mr. Antier.

"These features along with reliability improvements from our automated EPMA for the semiconductor industry, a novel field emission source and a redesigned electron column result in a highly versatile microanalyzer with unique capabilities for quantitative microanalysis and X-Ray imaging at the highest possible spatial resolution," he concludes.

The instrument is suitable for a diverse range of applications from geochronology, mineralogy and nuclear forensics to materials, thin films and semiconductor research.

Since introducing its first commercial EPMA to the market in 1958, CAMECA has brought continuous improvements to the technology. Hundreds of CAMECA EPMA instruments are installed at major corporations as well as in renowned universities and public research institutes across the world.
The newly delivered EPMA platform is available in two configurations: SXFive with W and LaB6 sources and SXFiveFE with FE source. CAMECA has optimized the performance of both instruments for challenging microanalytical applications at sub-micron spatial resolution, extending EPMA capabilities to smaller analyzed volumes. Equipped with high-precision spectrometers for greatest reproducibility, the instrument delivers highest quality minor and trace element analysis. In addition, it offers full automation for long-term unattended analysis.

####

About CAMECA
CAMECA has more than 50 years of experience in the design, manufacture and servicing of scientific instruments for material micro- and nanoanalysis. Since pioneering Electron Probe Microanalysis (EPMA) instrumentation in the 1950s, and Secondary Ion Mass Spectrometry (SIMS) in the 1960s, CAMECA has remained an undisputed world leader, while achieving numerous breakthrough innovations in such complementary techniques as Low-energy Electron induced X-ray Emissions Spectrometry (LEXES) and Atom Probe Tomography.

More recently CAMECA has evolved successfully from a provider of scientific instrumentation for the international research community to a provider of metrology solutions for the semiconductor industry. Headquartered near Paris, CAMECA has offices in China, Germany, India, Japan, Korea, Taiwan and the United States along with a global network of agents. Acquired in 2007 by AMETEK, Inc, a leading global manufacturer of electronic instrument and electromechanical products, CAMECA is now a unit of AMETEK’s Materials Analysis Division.

For more information, please click here

Contacts:
Marion Chopin +33 (1) 43 34 62 00
CAMECA Business Unit
AMETEK Materials Analysis Division

Copyright © CAMECA

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Two-dimensional melting of hard spheres experimentally unravelled after 60 years: First definitive experimental evidence of two-dimensional melting of hard spheres April 21st, 2017

National Conference on Nanomaterials, (NCN-2017) April 21st, 2017

NanoMONITOR shares its latest developments concerning the NanoMONITOR Software and the Monitoring stations April 21st, 2017

Nanomechanics, Inc. Unveils New Product at ICMCTF Show April 25th: Nanoindentation experts will launch the new Gemini that measures the interaction of two objects that are sliding across each other – not merely making contact April 21st, 2017

Imaging

Nanoparticles open new window for biological imaging: “Quantum dots” that emit infrared light enable highly detailed images of internal body structures April 10th, 2017

The Catholic University of Rome uses the JPK NanoWizard® AFM & CellHesion® systems to understand how cells sense and respond to mechanical stimuli April 5th, 2017

Tiny sensor lays groundwork for precision X-rays detection via endoscopy:Nanoscale fiber-integrated X-ray sensor opens new doors for medical imaging and radiotherapy March 29th, 2017

“Cysteine Rose” Wins 2016 Thermo Fisher Scientific Electron Microscopy Image Contest: Thermo Fisher honors Andrea Jacassi of the Italian Institute of Technology for image of cysteine crystals using focused ion beam techniques March 27th, 2017

Announcements

Two-dimensional melting of hard spheres experimentally unravelled after 60 years: First definitive experimental evidence of two-dimensional melting of hard spheres April 21st, 2017

National Conference on Nanomaterials, (NCN-2017) April 21st, 2017

NanoMONITOR shares its latest developments concerning the NanoMONITOR Software and the Monitoring stations April 21st, 2017

Nanomechanics, Inc. Unveils New Product at ICMCTF Show April 25th: Nanoindentation experts will launch the new Gemini that measures the interaction of two objects that are sliding across each other – not merely making contact April 21st, 2017

Tools

NanoMONITOR shares its latest developments concerning the NanoMONITOR Software and the Monitoring stations April 21st, 2017

Nanomechanics, Inc. Unveils New Product at ICMCTF Show April 25th: Nanoindentation experts will launch the new Gemini that measures the interaction of two objects that are sliding across each other – not merely making contact April 21st, 2017

MSP Corporation Announces a New Breakthrough in Monodisperse Droplet Generation April 19th, 2017

Researchers Succeed in Localizing Individual Atoms in Nanostructures Using First Cryo-Transfer LEAP Atom Probe April 19th, 2017

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project