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Home > Press > Nanometrics to Participate in the Goldman Sachs Midwest Small Cap Conference
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Abstract:
Nanometrics Incorporated (Nasdaq:NANO), a leading provider of advanced process control metrology systems, today announced that management will participate in the inaugural Goldman Sachs Midwest Small Cap One-on-One Conference to be held on May 18, 2011 in Chicago. Representing Nanometrics will be Dr. Timothy Stultz, president and chief executive officer, and Ronald Kisling, chief financial officer.
Nanometrics to Participate in the Goldman Sachs Midwest Small Cap Conference
Milpitas, CA | Posted on May 6th, 2011The investor presentation utilized by management at the conference will be made available on the investor page of Nanometrics' website, www.nanometrics.com.
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About Nanometrics Incorporated
Nanometrics is a leading provider of advanced, high-performance process control metrology systems used primarily in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics. Nanometrics’ automated and integrated metrology systems measure critical dimensions, device structures, overlay registration, topography and various thin film properties, including film thickness as well as optical, electrical and material properties. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics’ systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Select Global Market under the symbol NANO.
For more information, please click here
Contacts:
Headgate Partners LLC
Claire McAdams
530-265-9899 (Investor Relations)
fax: 530-265-9699
or
Nanometrics Incorporated
Ronald Kisling
CFO
408-545-6143
fax: 408-521-9490
Copyright © Nanometrics Incorporated
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