Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > CEA-Leti to Present 2 Invited Papers at May 23-26 Conference on Frontiers of Characterization and Metrology for Nanoelectronics

Abstract:
CEA-Leti researchers will present two invited papers at the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics 2011 (IC-FCMN 2011), May 23-26 in Grenoble.

CEA-Leti to Present 2 Invited Papers at May 23-26 Conference on Frontiers of Characterization and Metrology for Nanoelectronics

Grenoble, France | Posted on May 2nd, 2011

The 8th annual conference, which is being held for the first time outside the United States, will attract participants from around the world to examine the latest advances in characterization and metrology that will help shape the future of the nanoelectronics industry.

CEA-Leti's presentations are among more than two-dozen invited papers. A Leti paper titled "State-of-the-art Semiconductor Characterization in an Aberration-corrected Transmission Electron Microscope" will show how a TEM has been used to develop and apply new techniques to characterize the latest generations of nanometer-scale devices.

The other Leti invited paper, "Hybrid Metrology and 3D-AFM Enhancement for CD Metrology Dedicated to 28nm Node-and-below Requirements," discusses a new potential CD metrology solution called hybrid CD metrology that smartly tuned various morphological data coming from different CD metrology techniques.

IC-FCMN 2011, on the MINATEC Innovation Campus, will allow extended interaction between characterization and metrology experts and users from industry and R&D labs. The conference also will facilitate new research partnerships and help establish a common vision for meeting nanoelectronics characterization and metrology challenges.

####

About CEA-Leti
CEA is a French research and technology organisation, with activities in four main areas: energy, information technologies, healthcare technologies and defence and security. Within CEA, the Laboratory for Electronics & Information Technology (CEA-Leti) works with companies in order to increase their competitiveness through technological innovation and transfers. CEA-Leti is focused on micro and nanotechnologies and their applications, from wireless devices and systems, to biology and healthcare or photonics. Nanoelectronics and microsystems (MEMS) are at the core of its activities. As a major player in MINATEC campus, CEA-Leti operates 8,000-m≤ state-of-the-art clean rooms, on 24/7 mode, on 200mm and 300mm wafer standards. With 1,200 employees, CEA-Leti trains more than 190 Ph.D. students and hosts 200 assignees from partner companies. Strongly committed to the creation of value for the industry, CEA-Leti puts a strong emphasis on intellectual property and owns more than 1,700 patent families. For more information, visit www.leti.fr.

For more information, please click here

Contacts:
CEA-Leti
Thierry Bosc
+33 4 38 78 31 95


Agency
Amťlie Ravier
+33 1 58 18 59 30

Copyright © CEA-Leti

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Bosch announces high-performance MEMS acceleration sensors for wearables June 27th, 2017

Nanometrics to Participate in the 9th Annual CEO Investor Summit 2017: Accredited investor and publishing research analyst event held concurrently with SEMICON West and Intersolar 2017 in San Francisco June 27th, 2017

NMRC, University of Nottingham chooses the Quorum Q150 coater for its reliable and reproducible film thickness when coating samples with iridium June 27th, 2017

Picosunís ALD solutions enable novel high-speed memories June 27th, 2017

New TriboLab CMP Provides Cost-Effective Characterization of Chemical Mechanical Wafer Polishing Processes: Bruker Updates Industry-Standard CP-4 Platform for Most Flexible and Reliable Testing June 27th, 2017

Imaging

NMRC, University of Nottingham chooses the Quorum Q150 coater for its reliable and reproducible film thickness when coating samples with iridium June 27th, 2017

Nanoelectronics

Research accelerates quest for quicker, longer-lasting electronics: UC Riverside-led research makes topological insulators magnetic well above room temperatures June 25th, 2017

GLOBALFOUNDRIES on Track to Deliver Leading-Performance 7nm FinFET Technology: New 7LP technology offers 40 percent performance boost over 14nm FinFET June 13th, 2017

Seeing the invisible with a graphene-CMOS integrated device June 6th, 2017

IBM Research Alliance Builds New Transistor for 5nm Technology: Less than two years since announcing a 7nm test chip, scientists have achieved another breakthrough June 5th, 2017

Announcements

Bosch announces high-performance MEMS acceleration sensors for wearables June 27th, 2017

Nanometrics to Participate in the 9th Annual CEO Investor Summit 2017: Accredited investor and publishing research analyst event held concurrently with SEMICON West and Intersolar 2017 in San Francisco June 27th, 2017

NMRC, University of Nottingham chooses the Quorum Q150 coater for its reliable and reproducible film thickness when coating samples with iridium June 27th, 2017

Picosunís ALD solutions enable novel high-speed memories June 27th, 2017

Tools

Nanometrics to Participate in the 9th Annual CEO Investor Summit 2017: Accredited investor and publishing research analyst event held concurrently with SEMICON West and Intersolar 2017 in San Francisco June 27th, 2017

NMRC, University of Nottingham chooses the Quorum Q150 coater for its reliable and reproducible film thickness when coating samples with iridium June 27th, 2017

New TriboLab CMP Provides Cost-Effective Characterization of Chemical Mechanical Wafer Polishing Processes: Bruker Updates Industry-Standard CP-4 Platform for Most Flexible and Reliable Testing June 27th, 2017

Researchers developed nanoparticle based contrast agent for dual modal imaging of cancer June 21st, 2017

Events/Classes

Bosch announces high-performance MEMS acceleration sensors for wearables June 27th, 2017

Nanometrics to Participate in the 9th Annual CEO Investor Summit 2017: Accredited investor and publishing research analyst event held concurrently with SEMICON West and Intersolar 2017 in San Francisco June 27th, 2017

Letiís Autonomous-Vehicle System Embedded in Infineonís AURIX Platform: Letiís Low-Power, Multi-Sensor System that Transforms Distance Data into Clear Information About the Driving Environment Will Be Demonstrated at ITS Meeting in Strasbourg, June 19-22 June 20th, 2017

Nanomechanics to Host High-Speed Nanoindentation Webinar June 21: Leading nanomechanical technology provider will host educational webinar focused on high-speed nanoindentation and mechanical properties mapping June 12th, 2017

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project