Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Colorimetry and Intensity Mapping of Large Displays With Microscopic Spatial Resolution -A Novel Solution from CRAIC Technologies

Abstract:
The 20/20 XL™ is able to take spectra and images of microscopic features of large flat panel displays. With the ability to measure micron-sized features, the 20/20 XL™ is able to measure color and intensity of even individual pixels. This makes high spatial resolution color and intensity mapping possible for the largest displays.

Colorimetry and Intensity Mapping of Large Displays With Microscopic Spatial Resolution -A Novel Solution from CRAIC Technologies

San Dimas, CA | Posted on April 29th, 2011

CRAIC Technologies, the world's leading innovator of UV-visible-NIR microspectroscopy solutions, is proud to introduce the 20/20 XL™ UV-visible-NIR microspectrophotometer. The 20/20 XL™ microspectrophotometer is designed to non-destructively analyze microscopic features of very large displays by being capable of incorporating large scale sample handling. With a spectral range from the deep ultraviolet to the near infrared, analysis of samples can be done by absorbance, reflectance, luminescence and fluorescence with unparalleled speed and accuracy. The system can also be configured to image microscopic samples in the UV and NIR regions in addition to color imaging. Due to its flexible design which gives it the ability to analyze the largest displays, applications are numerous and include mapping color and intensity variations, film thickness measurements, and even scanning the surfaces of display components for defects. With the ability to spectral analyze and image microscopic features of very large devices, the 20/20 XL™ microspectrophotometer is the cutting-edge micro-analysis tool for laboratories and manufacturing facilities.

"CRAIC Technologies has been an innovator in the field of UV-visible-NIR microanalysis since its founding. We have helped to advance the field of microscale analysis with innovative instrumentation, software, research and teaching. The 20/20 XL™ microspectrophotometer was born out of demand from our industrial customers to be able to analyze microscopic features of very large displays" states Dr. Paul Martin, President of CRAIC Technologies. "As such, we have listened to our customers and created the 20/20 XL™, a system backed by years of experience in designing, building and the using of this type of instrumentation for spectroscopic and image analysis."

The 20/20 XL™ microspectrophotometer integrates an advanced spectrophotometer with a sophisticated UV-visible-NIR range microscope and powerful, easy-to-use software. This flexible instrument is designed to attach to large sample handling frames so that even the largest displays may be analyzed. It is able to acquire data from microscopic features of very large samples by absorbance, reflectance or even luminescence spectroscopy, in addition to microcolorimetry, film thickness measurements and even imaging in the UV, visible and NIR regions. Touch screen controls, sophisticated software, calibrated variable apertures and other innovations all point to a new level of sophistication for microanalysis. With high sensitivity, durable design, ease-of-use, multiple imaging and spectroscopic techniques, automation and the support of CRAIC Technologies, the 20/20 XL™ is more than just a quality control measurement tool…it is the solution to your analytical challenges.

####

About CRAIC Technologies, Inc.
CRAIC Technologies, Inc. is a global technology leader focused on innovations for microscopy and microspectroscopy in the ultraviolet, visible and near-infrared regions. CRAIC Technologies creates cutting-edge solutions, with the very best in customer support, by listening to our customers and implementing solutions that integrate operational excellence and technology expertise. CRAIC Technologies provides answers for customers in forensic sciences, biotechnology, semiconductor, geology, nanotechnology and materials science markets who demand quality, accuracy, precision, speed and the best in customer support.

For more information, please click here

Contacts:
CRAIC Technologies, Inc.

+1-310-573-8180

Copyright © CRAIC Technologies, Inc.

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Researchers engineer improvements of technology used in digital memory November 24th, 2014

Research reveals how our bodies keep unwelcome visitors out of cell nuclei November 24th, 2014

An Inside Job: UC-Designed Nanoparticles Infiltrate, Kill Cancer Cells From Within November 24th, 2014

Cooling with the coldest matter in the world November 24th, 2014

Imaging

Leica Microsystems Presents Universal Hybrid Detector for Single Molecule Detection and Imaging at SfN and ASCB: Leica HyD SMD - the Optimal Detector for Precise and Reliable SMD data November 20th, 2014

NRL Scientists Discover Novel Metamaterial Properties within Hexagonal Boron Nitride November 20th, 2014

Spectral Surface Mapping with Microscopic Resolution: CRAIC Technologies introduces Spectral Surface Mapping™ (S2M™) software November 18th, 2014

Two sensors in one: Nanoparticles that enable both MRI and fluorescent imaging could monitor cancer, other diseases November 18th, 2014

Announcements

Research reveals how our bodies keep unwelcome visitors out of cell nuclei November 24th, 2014

ASU, IBM move ultrafast, low-cost DNA sequencing technology a step closer to reality November 24th, 2014

An Inside Job: UC-Designed Nanoparticles Infiltrate, Kill Cancer Cells From Within November 24th, 2014

Cooling with the coldest matter in the world November 24th, 2014

Tools

Iranian Experts Clean Uranium-Contaminated Water by Nano-Particles November 23rd, 2014

Leica Microsystems Presents Universal Hybrid Detector for Single Molecule Detection and Imaging at SfN and ASCB: Leica HyD SMD - the Optimal Detector for Precise and Reliable SMD data November 20th, 2014

Nanometrics Announces Upcoming Investor Events November 19th, 2014

Spectral Surface Mapping with Microscopic Resolution: CRAIC Technologies introduces Spectral Surface Mapping™ (S2M™) software November 18th, 2014

Photonics/Optics/Lasers

NRL Scientists Discover Novel Metamaterial Properties within Hexagonal Boron Nitride November 20th, 2014

Penn engineers efficiently 'mix' light at the nanoscale November 17th, 2014

'Direct writing' of diamond patterns from graphite a potential technological leap November 5th, 2014

Outsmarting Thermodynamics in Self-assembly of Nanostructures: Berkeley Lab reports method for symmetry-breaking in feedback-driven self-assembly of optical metamaterials November 4th, 2014

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More












ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE