Nanotechnology Now

Our NanoNews Digest Sponsors







Heifer International

Wikipedia Affiliate Button


Home > Press > DirectOverlay display & analysis software from JPK Instruments

An example of the power of DirectOverlay from JPK: A fluorescence image highlights three individual labelled DNA molecules while the 3D image zooms in to a high resolution 700nm AFM image. (Sample courtesy of Dr. M. Modesti, CNRS Marseilles)
An example of the power of DirectOverlay from JPK: A fluorescence image highlights three individual labelled DNA molecules while the 3D image zooms in to a high resolution 700nm AFM image. (Sample courtesy of Dr. M. Modesti, CNRS Marseilles)

Abstract:
JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, provides a unique software package to make the display of light microscopy images together with atomic force microscopy images a seamless exercise. This package is called DirectOverlay™.

DirectOverlay display & analysis software from JPK Instruments

Berlin, Germany | Posted on April 19th, 2011

Atomic force microscopy (AFM) is a powerful tool to investigate a huge variety of different samples with nanometre scale resolution under physiological conditions. As well as providing topographic measurements, information about interaction forces and mechanical properties like adhesion and elasticity can also be obtained. Perfect integration of AFM with an optical setup can increase the range of applications and opens up many possibilities for correlating structural information with optical information such as functionalized labelling of certain components.

To achieve the perfect combination of optics and AFM at the molecular scale, distortions must be prevented. This will result in two images, such as optical and AFM images, that do not perfectly overlay. Reasons for distortions include aberrations arising from the lenses and mirrors of the optics system. This nonlinear stretching, rotating and offsetting of optical images are present in nearly all types of optical setups.

To generate a seamless overlay of both techniques, JPK developed a cutting-edge calibration method, called DirectOverlay, which uses the accuracy of the AFM closed-loop scanning system to enable a true display of absolute angles and length coordinates. The calibration procedure is done automatically and uses the known positions and offsets of the cantilever to calibrate the optical image into the AFM coordinates. To generate a perfect match of the optical and AFM image, 25 or more points are used in the calibration algorithm. At each point, an optical image is acquired and the position of the cantilever tip is automatically detected in each optical image without needing input on cantilever angle, shape or magnification. The algorithm then performs a nonlinear conversion and, as a result, the optical image is corrected for any lens imperfections and converted into the linearized AFM length coordinates. This provides a perfect integration of optical and AFM data with sub-diffraction limit precision.

Finally, the calibrated optical image is transferred into the JPK SPM software, so that AFM scan regions can be selected within the optical image. Direct "in optical image" selection of AFM measurements (imaging, mapping and force spectroscopy) leads to more efficient experiments and reduces dramatically overview image scanning in AFM.

JPK develop, engineer and manufacture instrumentation in Germany to the world-recognized standards of German precision engineering, quality and functionality. For further details on the NanoWizard® 3 systems and other products in the JPK family of nanoscale characterization systems, please contact JPK on +49 30533112070 or visit the JPK web site, (www.jpk.com/nanowizard-3-directoverlay-tm.538.en.html).

####

About JPK Instruments (JPK)
JPK Instruments AG is a world-leading manufacturer of nanoanalytic instruments - particularly atomic force microscope (AFM) systems and optical tweezers - for a broad range of applications reaching from soft matter physics to nano-optics, from surface chemistry to cell and molecular biology. From its earliest days applying atomic force microscope (AFM) technology, JPK has recognized the opportunities provided by nanotechnology for transforming life sciences and soft matter research. This focus has driven JPK’s success in uniting the worlds of nanotechnology tools and life science applications by offering cutting-edge technology and unique applications expertise. Headquartered in Berlin and with direct operations in Dresden, Cambridge (UK), Singapore, Tokyo (Japan) and Paris (France), JPK maintains a global network of distributors and support centers and provides on the spot applications and service support to an ever-growing community of researchers.

For more information, please click here

Contacts:

+49 (0) 30 5331 12070

For further information
please contact either:
Jezz Leckenby
NetDyaLog Limited
T: +44 (0) 1799 521881
M: +44 (0) 7843 012997

or
Claudia Boettcher
JPK Instruments
T: +49 (0) 30 5331 12070

Copyright © JPK Instruments (JPK)

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Nanoparticle Harnesses Powerful Radiation Therapy for Cancer May 20th, 2013

Microneedle-Delivered Nanoparticles Boost Antitumor Vaccines May 20th, 2013

Competition in the Quantum World May 20th, 2013

Elsevier Business Intelligence (EBI) to Host 'IN3 Medical Device 360 Boston,' June 24-26, 2013 May 20th, 2013

Imaging

Penn engineers' nanoantennas improve infrared sensing May 20th, 2013

Kinks and curves at the nanoscale: New research shows 'perfect twin boundaries' are not so perfect May 20th, 2013

Beautiful "flowers" self-assemble in a beaker: Elaborate nanostructures blossom from a chemical reaction perfected at Harvard May 17th, 2013

Scientists capture first direct proof of Hofstadter butterfly effect May 17th, 2013

Software

Nanotechnology Products Displayed in Tehran Int'l Book Fair May 9th, 2013

Spectroscopy & Imaging Software Designed for Windows 8 from CRAIC Technologies: CRAIC Technologies introduces Auriga™ microspectroscopy & imaging software for Windows 8 ® May 1st, 2013

Raman Spectral Libraries Offered with CRAIC Technologies Raman Microspectrometers: CRAIC Technologies now offers searchable Raman spectral databases with its Apollo™ Raman microspectrometers January 7th, 2013

MS Spectral Overlap Evaluator - a new ipad app. for mass spectrometry December 11th, 2012

Announcements

Competition in the Quantum World May 20th, 2013

Elsevier Business Intelligence (EBI) to Host 'IN3 Medical Device 360 Boston,' June 24-26, 2013 May 20th, 2013

Penn engineers' nanoantennas improve infrared sensing May 20th, 2013

Researchers Perform Fastest Measurements Ever Made of Ion Channel Proteins May 20th, 2013

Tools

Penn engineers' nanoantennas improve infrared sensing May 20th, 2013

Kinks and curves at the nanoscale: New research shows 'perfect twin boundaries' are not so perfect May 20th, 2013

NanoInk, Inc. Assets To Be Sold May 18th, 2013

Beautiful "flowers" self-assemble in a beaker: Elaborate nanostructures blossom from a chemical reaction perfected at Harvard May 17th, 2013

NanoNews-Digest
The latest news from around the world, FREE





  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More












ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project








abbigliamento uomo
Computer Accessories
© Copyright 1999-2013 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE