Home > Press > Keithley Publishes Free Tutorial Poster on Nanotechnology Measurement Techniques
Abstract:
Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative poster on nanotechnology measurement tips and techniques. A free copy of the poster, titled "Measurement Techniques for Characterizing Graphene, Carbon Nanotubes, and Nano-materials and Devices: Low Power, Low Voltage, Low Resistance" is available upon request from Keithley at: www.keithley.com/pr/086
Keithley Publishes Free Tutorial Poster on Nanotechnology Measurement Techniques
Cleveland, OH | Posted on March 25th, 2011
The poster is divided into several topic areas:
Measurement Technique for Hall Voltage and Resistivity Measurements
Technique for Measuring Resistance as a Function of Gate Voltage
Circuit to Measure Drain Family of Curves on a Carbon Nanotube
Avoiding Sources of Error When Measuring Low Power Materials and Devices
Keithley instrumentation is helping advance the state of the art in a growing list of nanotechnology applications. Six decades of experience in designing ultra-sensitive measurement tools allow Keithley to provide university, corporate, and government labs around the world with solutions for investigating new material and device properties. Keithley partners with organizations like the Institute of Electrical and Electronics Engineers (IEEE), leading Nanotechnology Centers of Excellence, customers, and other leading nanotechnology measurement tool vendors to create more complete nano test solutions. The insight into emerging needs these working partnerships provide helps Keithley deliver new capabilities faster.
For More Information
To request a free copy of the poster, please visit www.keithley.com/pr/086. To learn more about Keithley, contact the company at:
Telephone: 888-534-8453
440-248-0400
FAX: 440-248-6168
E-mail:
Internet:
www.keithley.com
Address:
Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891
####
About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test. In 2010, Keithley Instruments joined Tektronix as part of its test and measurement portfolio.
Products and company names listed are trademarks or trade names of their respective companies.
For more information, please click here
Contacts:
Keithley Instruments, Inc.
Ronald-Stéphane Gilbert, 440-498-2978
Twitter: www.twitter.com/keithleyinst
Reader Inquiries: 1-888-534-8453
Copyright © Business Wire
If you have a comment, please
Contact us.
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
Bookmark:
Imaging
JPK reports on single molecule research at IISER Pune in India using AFM and CellHesion techniques May 21st, 2013
News and information
JPK reports on single molecule research at IISER Pune in India using AFM and CellHesion techniques May 21st, 2013
Imec and GLOBALFOUNDRIES collaborate to advance high-density memory technology: STT-MRAM offers enhanced performance and scalability for embedded and standalone applications May 21st, 2013
International survey supports need for built-in water protection on smartphones and tablets May 21st, 2013
Rice unveils method for tailoring optical processors: Arranging nanoparticles in geometric patterns allows for control of light with light May 21st, 2013
Academic/Education
Inaugural Baccalaureate Class Among CNSE Graduates to Pursue Opportunities in New York: Half of undergrads from pioneering class to seek graduate degrees at CNSE; majority of master’s and doctoral degree recipients land high-tech jobs in state’s emerging nanotech industry May 16th, 2013
Anasys reports on University of Illinois study of near-field behavior of semiconductor plasmonic microparticles using AFM-IR published in APL May 14th, 2013
The University of Wyoming uses Nanoparticle Tracking Analysis to characterize nanoparticles in natural environments May 14th, 2013
Nanotechnology Pioneer Named 'Entrepreneur of the Year': Royal Society of Chemistry honors Chad Mirkin for commercializing innovations May 10th, 2013
Announcements
JPK reports on single molecule research at IISER Pune in India using AFM and CellHesion techniques May 21st, 2013
Imec and GLOBALFOUNDRIES collaborate to advance high-density memory technology: STT-MRAM offers enhanced performance and scalability for embedded and standalone applications May 21st, 2013
International survey supports need for built-in water protection on smartphones and tablets May 21st, 2013
Rice unveils method for tailoring optical processors: Arranging nanoparticles in geometric patterns allows for control of light with light May 21st, 2013
Tools
Xmark Media announces the 2013 Vacuum Expo & Vacuum Symposium, Ricoh Arena - Coventry 16-17 October May 21st, 2013
JPK reports on single molecule research at IISER Pune in India using AFM and CellHesion techniques May 21st, 2013
Penn engineers' nanoantennas improve infrared sensing May 20th, 2013
Kinks and curves at the nanoscale: New research shows 'perfect twin boundaries' are not so perfect May 20th, 2013