- About Us
- Career Center
- Nano-Social Network
- Nano Consulting
- My Account
Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative poster on nanotechnology measurement tips and techniques. A free copy of the poster, titled "Measurement Techniques for Characterizing Graphene, Carbon Nanotubes, and Nano-materials and Devices: Low Power, Low Voltage, Low Resistance" is available upon request from Keithley at: www.keithley.com/pr/086
The poster is divided into several topic areas:
Measurement Technique for Hall Voltage and Resistivity Measurements
Technique for Measuring Resistance as a Function of Gate Voltage
Circuit to Measure Drain Family of Curves on a Carbon Nanotube
Avoiding Sources of Error When Measuring Low Power Materials and Devices
Keithley instrumentation is helping advance the state of the art in a growing list of nanotechnology applications. Six decades of experience in designing ultra-sensitive measurement tools allow Keithley to provide university, corporate, and government labs around the world with solutions for investigating new material and device properties. Keithley partners with organizations like the Institute of Electrical and Electronics Engineers (IEEE), leading Nanotechnology Centers of Excellence, customers, and other leading nanotechnology measurement tool vendors to create more complete nano test solutions. The insight into emerging needs these working partnerships provide helps Keithley deliver new capabilities faster.
For More Information
To request a free copy of the poster, please visit www.keithley.com/pr/086. To learn more about Keithley, contact the company at:
Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891
About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test. In 2010, Keithley Instruments joined Tektronix as part of its test and measurement portfolio.
Products and company names listed are trademarks or trade names of their respective companies.
For more information, please click here
Keithley Instruments, Inc.
Ronald-Stéphane Gilbert, 440-498-2978
Reader Inquiries: 1-888-534-8453
Copyright © Business WireIf you have a comment, please Contact us.
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
|Related News Press|
Nuclear pores captured on film: Using an ultra fast-scanning atomic force microscope, researchers from the University of Basel have filmed 'living' nuclear pore complexes at work for the first time May 3rd, 2016
News and information
SUNY Poly, in Collaboration with the George Washington School of Medicine and Health Sciences and Stony Brook University, Demonstrates Pioneering Method to Visualize and Identify Engineered Nanoparticles in Tissue March 25th, 2016
Exploring phosphorene, a promising new material April 29th, 2016