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Nanometrics Incorporated (Nasdaq: NANO), a leading provider of advanced process control metrology systems, today announced that Dr. Timothy Stultz, the company's president and chief executive officer, is scheduled to present at the 13th Annual Needham Growth Conference.
The 13th Annual Needham Growth Conference will take place at the New York Palace Hotel in New York January 11 - 13, 2011. Nanometrics is scheduled to present on Thursday, January 13th at 2:50 p.m. EST.
The investor presentation slides, as well as a live and subsequently archived webcast of the presentation, will be made available on the investor page of Nanometrics' website, www.nanometrics.com.
Nanometrics is a leading provider of advanced, high-performance process control metrology systems used primarily in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics. Nanometrics’ automated and integrated metrology systems measure critical dimensions, device structures, overlay registration, topography and various thin film properties, including film thickness as well as optical, electrical and material properties. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics’ systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Market under the symbol NANO.
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Jim Moniz, CFO
Headgate Partners LLC
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