Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > inXitu’s Cost Effective XRD Now Available for Nanoengineered Materials

Abstract:
inXitu now offers a tailored product for particle size determination and phase confirmation/identification; free application note available

inXitu’s Cost Effective XRD Now Available for Nanoengineered Materials

Campbell, CA | Posted on December 29th, 2010

Nanotechnology and Nanoengineered Materials are being developed rapidly for a large number of applications in all kind of sectors and products, e.g. cosmetics, auto tires, building and construction materials, and pharmaceuticals. Their specific properties related to the small sizes, provide opportunities to develop new technologies with performance and characteristics that cannot be established with conventional materials and technologies. The ability to determine these performance parameters is made possible, in part, through characterization by x-ray diffraction (XRD). From particle size paremeters to phase identification and confirmation, XRD is playing a vital role in this emerging industry.

inXitu Inc. is a leader in benchtop and portable XRD based instrumentation specializing in developing the technologies required to enable the next generation of scientific instruments used for materials analysis including a recently introduced variant of its popular benchtop instrument, BTX II. The technology used in its portable rock and mineral analyzer received a prestigious R&D 100 award and was chosen to fly on the Mars Science Laboratory rover scheduled for launch in 2011. Now this technology can be found in use in industry with specific application to the novel field of nanoengineered materials.

The powder handling methods can dramatically improve the quality of XRD data while reducing the requirements for sample preparation. inXitu's patented technique makes possible quality XRD data to be collected regardless of the grain size of the sample. Grain sizes up to 400 um have been tested producing data normally obtained with micron size particles.

Incorporating key technologies from its portable XRD instrument and advanced sample handling techniques, inXitu has developed solutions targeted for identification and analysis in the areas of material analysis, pharmaceuticals, forensics, art and archaeological materials. This new line of instruments offers performance comparable to laboratory XRD systems with the benefit of ease of use, significantly reduced sample preparation and reduced cost of acquisition and operation.

####

For more information, please click here

Contacts:
inXitu
Brad Boyer
001 408 871 1911

Copyright © inXitu

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Raman Whispering Gallery Detects Nanoparticles September 1st, 2014

A new, tunable device for spintronics: An international team of scientists including physicist Jairo Sinova from the University of Mainz realises a tunable spin-charge converter made of GaAs August 29th, 2014

Nanoscale assembly line August 29th, 2014

New Vice President Takes Helm at CNSE CMOST: Catherine Gilbert To Lead CNSE Children’s Museum of Science and Technology Through Expansion And Relocation August 29th, 2014

Announcements

Raman Whispering Gallery Detects Nanoparticles September 1st, 2014

Nanoscale assembly line August 29th, 2014

New analytical technology reveals 'nanomechanical' surface traits August 29th, 2014

New Vice President Takes Helm at CNSE CMOST: Catherine Gilbert To Lead CNSE Children’s Museum of Science and Technology Through Expansion And Relocation August 29th, 2014

Tools

Raman Whispering Gallery Detects Nanoparticles September 1st, 2014

New analytical technology reveals 'nanomechanical' surface traits August 29th, 2014

Ultra-Low Frequency Vibration Isolation Stabilizes Scanning Tunneling Microscopy at UCLA’s Nano-Research Group August 28th, 2014

Measure Both Elastic and Viscous Properties with AFM Using Asylum Research’s Exclusive AM-FM Viscoelastic Mapping Mode August 28th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE