Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > WITec introduces “True Surface Microscopy”

An application example illustrating the working principle of True Surface Microscopy (Topographic Raman Image of a Pharmaceutical Tablet).
An application example illustrating the working principle of True Surface Microscopy (Topographic Raman Image of a Pharmaceutical Tablet).

Abstract:
Topographic Confocal Raman Imaging - The next evolutionary leap in cutting-edge microscope configurations

WITec introduces “True Surface Microscopy”

Ulm, Germany | Posted on December 8th, 2010

WITec, worldwide leader in nano-analytical microscopy systems, has launched the new True Surface Microscopy option. The core element of this revolutionary imaging mode is an integrated sensor for optical profilometry. Large-area topographic coordinates from the profilometer measurement can be precisely correlated with the large-area confocal Raman imaging data. This allows for the first time confocal Raman imaging along heavily inclined or very rough samples with the true surface held in constant focus while maintaining the highest confocality. With the new imaging mode, samples that had previously required extensive preparation in order to obtain a certain surface flatness can now be effortlessly and automatically characterized as they are. Complete system control as well as extensive data evaluation are integrated within the WITec Control and WITec Project software environment, guaranteeing renowned ease-of-use.

"The integrated combination of optical profilometry and large-area confocal Raman imaging is the next evolutionary leap in cutting-edge microscope configurations." says Dr. Olaf Hollricher, WITec managing director R&D. "Only an inherently modular instrument design can enable such a seamless incorporation of a groundbreaking and complementary imaging technique into the present product line of Raman-AFM systems."

The profilometry capabilities of True Surface Imaging mode allows scan ranges of up to 100x100 mm with a spatial resolution on the order of 100 nm vertically and 10 µm laterally. Measuring distances of 10 mm and more provide flexibility for variable sample size requirements. In combination with AFM, the profilometer can even be used as a pre-inspection tool to determine topographic features of interest for high-resolution AFM investigations on large samples. The overall performance and exceptionally accurate imaging capabilities of True Surface Microscopy are beneficial for many applications, including the characterization of micromechanical, medical, or semiconductor devices, the mapping of functionalized surfaces, or the imaging of bio-medical or pharmaceutical material surface properties.

####

About WITec GmbH
WITec is a manufacturer of high performance optical and scanning probe microscopy systems. A modular product line allows the combination of different microscopy techniques such as Raman, SNOM or AFM in a single instrument for flexible analysis of the optical, chemical and structural properties of a sample. The instruments are distributed worldwide and are used primarily in the fields of Materials Science, Life Science and Nanotechnology. WITec is based in Ulm, Germany with regional headquarters in Maryville, TN, USA and Singapore.

For more information, please click here

Contacts:
Harald Fischer
Marketing Director

Tel: +49 (0) 731 140 70-0

Copyright © WITec GmbH

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

A new product to help combat mouldy walls, thanks to technology developed at the ICN2 December 14th, 2017

Sandia researchers make solid ground toward better lithium-ion battery interfaces: Reducing the traffic jam in batteries December 13th, 2017

Perking up and crimping the 'bristles' of polyelectrolyte brushes December 13th, 2017

Columbia engineers create artificial graphene in a nanofabricated semiconductor structure: Researchers are the first to observe the electronic structure of graphene in an engineered semiconductor; finding could lead to progress in advanced optoelectronics and data processing December 13th, 2017

Announcements

A new product to help combat mouldy walls, thanks to technology developed at the ICN2 December 14th, 2017

Sandia researchers make solid ground toward better lithium-ion battery interfaces: Reducing the traffic jam in batteries December 13th, 2017

Perking up and crimping the 'bristles' of polyelectrolyte brushes December 13th, 2017

Columbia engineers create artificial graphene in a nanofabricated semiconductor structure: Researchers are the first to observe the electronic structure of graphene in an engineered semiconductor; finding could lead to progress in advanced optoelectronics and data processing December 13th, 2017

Tools

Perking up and crimping the 'bristles' of polyelectrolyte brushes December 13th, 2017

Untangling DNA: Researchers filter the entropy out of nanopore measurements December 8th, 2017

JPK Instruments announce partnership with Swiss company, Cytosurge AG. The partnership makes Cytosurge’s FluidFM® technology available on the JPK NanoWizard® AFM platform December 8th, 2017

Researchers advance technique to detect ovarian cancer: Rice, MD Anderson use fluorescent carbon nanotube probes to achieve first in vivo success November 30th, 2017

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project