Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > FEI and Nanonics Enter into Collaborative Agreement - Companies explore potential development and market opportunities for hybrid AFM/DualBeam system

Abstract:
FEI Company (NASDAQ: FEIC), a leading instrumentation company providing electron microscope systems for applications across many industries, announces that it has entered into an agreement to collaborate with Nanonics Imaging Ltd., based in Israel, to explore the feasibility of adding an atomic force microscope (AFM) to an FEI DualBeam™ focused ion beam (FIB)/scanning electron microscope (SEM) system.

FEI and Nanonics Enter into Collaborative Agreement - Companies explore potential development and market opportunities for hybrid AFM/DualBeam system

Hillsboro, OR | Posted on September 28th, 2010

The AFM is used for imaging, measuring and manipulating matter at the nanoscale. It uses a mechanical probe to measure the surface topography of a sample. The DualBeam is a FIB/SEM system that provides three dimensional (3D) imaging and analysis down to the nanoscale. The DualBeam uses an SEM to image FIB-milled cross sections, which reveal subsurface features.

####

About FEI Company
FEI (Nasdaq: FEIC) is a leading diversified scientific instruments company. It is a premier provider of electron- and ion-beam microscopes and tools for nanoscale applications across many industries: industrial and academic materials research, life sciences, semiconductors, data storage, natural resources and more. With more than 60 years of technological innovation and leadership, FEI has set the performance standard in transmission electron microscopes (TEM), scanning electron microscopes (SEM) and DualBeams™, which combine a SEM with a focused ion beam (FIB). FEI’s imaging systems provide 3D characterization, analysis and modification/prototyping with resolutions down to the sub-Ångström (one-tenth of a nanometer) level. FEI’s NanoPorts in North America, Europe and Asia provide centers of technical excellence where its world-class community of customers and specialists collaborate. FEI has approximately 1800 employees and sales and service operations in more than 50 countries around the world.

About Nanonics

Nanonics Imaging Ltd. is the market leader of combined near-field optical microscopes (commonly referred to as either NSOM or SNOM systems) and atomic force microscopes (AFM). Incorporated in 1997, Nanonics is the longest established and most experienced supplier of such systems in the market, whose products have won several awards. These awards have recognized innovations and pioneering developments in multiprobe atomic force microscopy and transparently integrated AFM Raman microspectroscopy. Nanonics platforms with their associated probe technologies have circumvented barriers that have prevented AFM from effective integration into electron optical and similar upright microscope geometries. More information can be found at: www.nanonics.co.il

FEI Safe Harbor Statement

This news release contains forward-looking statements that include statements regarding the performance capabilities and benefits of the AFM/DualBeam technologies. Factors that could affect these forward-looking statements include but are not limited to failure of the research to produce the anticipated results, the failure of any corresponding product or technology to perform as expected and achieve anticipated results, unexpected technology problems and our ability to manufacture, ship and deliver the tools or software as expected. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.

For more information, please click here

Contacts:
FEI Contacts:

Sandy Fewkes
Principal (media contact)
MindWrite Communications, Inc
+1 408 224 4024


FEI Company
Fletcher Chamberlin
(investors and analysts)
Investor Relations
+1 503 726 7710

Copyright © FEI

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Research reveals how our bodies keep unwelcome visitors out of cell nuclei November 24th, 2014

ASU, IBM move ultrafast, low-cost DNA sequencing technology a step closer to reality November 24th, 2014

An Inside Job: UC-Designed Nanoparticles Infiltrate, Kill Cancer Cells From Within November 24th, 2014

Cooling with the coldest matter in the world November 24th, 2014

Imaging

Leica Microsystems Presents Universal Hybrid Detector for Single Molecule Detection and Imaging at SfN and ASCB: Leica HyD SMD - the Optimal Detector for Precise and Reliable SMD data November 20th, 2014

NRL Scientists Discover Novel Metamaterial Properties within Hexagonal Boron Nitride November 20th, 2014

Spectral Surface Mapping with Microscopic Resolution: CRAIC Technologies introduces Spectral Surface Mapping™ (S2M™) software November 18th, 2014

Two sensors in one: Nanoparticles that enable both MRI and fluorescent imaging could monitor cancer, other diseases November 18th, 2014

Announcements

Research reveals how our bodies keep unwelcome visitors out of cell nuclei November 24th, 2014

ASU, IBM move ultrafast, low-cost DNA sequencing technology a step closer to reality November 24th, 2014

An Inside Job: UC-Designed Nanoparticles Infiltrate, Kill Cancer Cells From Within November 24th, 2014

Cooling with the coldest matter in the world November 24th, 2014

Tools

Iranian Experts Clean Uranium-Contaminated Water by Nano-Particles November 23rd, 2014

Leica Microsystems Presents Universal Hybrid Detector for Single Molecule Detection and Imaging at SfN and ASCB: Leica HyD SMD - the Optimal Detector for Precise and Reliable SMD data November 20th, 2014

Nanometrics Announces Upcoming Investor Events November 19th, 2014

Field-emission plug-and-play solution for microwave electron guns: To simplify the electron emission mechanism involved in microwave electron guns, a team of researchers has created and demonstrated a field-emission plug-and-play solution based on ultrananocrystalline diamond November 18th, 2014

Alliances/Partnerships/Distributorships

New research project supports internationalisation in nano-research: Launch of new “Baltic Sea Network” November 22nd, 2014

UO-industry collaboration points to improved nanomaterials: University of Oregon microscope puts spotlight on the surface structure of quantum dots for designing new solar devices November 20th, 2014

A novel method for identifying the body’s ‘noisiest’ networks November 19th, 2014

Field-emission plug-and-play solution for microwave electron guns: To simplify the electron emission mechanism involved in microwave electron guns, a team of researchers has created and demonstrated a field-emission plug-and-play solution based on ultrananocrystalline diamond November 18th, 2014

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More












ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE