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Home > Press > Surface Characterisation in the Semiconductor Industry

Abstract:
A new white paper on Surface Characterisation in the Semiconductor Industry, by Dr. Alan Brown, CERAM's Director of Development; available as a free download.

Surface Characterisation in the Semiconductor Industry

Posted on September 15th, 2010

The paper:

* Outlines advantages of employing a range of modern surface characterisation techniques to obtain quantitative chemical and physical information on the structure and composition of semiconductor materials
* Demonstrates how data gained from these techniques can be used by process engineers, designers and failure analysts to optimise production yields, reduce failure rates and improve semiconductor device design.

Dr. Alan Brown explains: "Semiconductor device technology is continually being scaled to smaller dimensions which results in greater device density and higher switching speeds. With this advancement there has been a demand for new materials to counteract the effects of these shrinking dimensions. At the same time, developments in solar research and optoelectronics have also produced a new range of compound semiconductor-based devices with complex thin layer structures. Techniques that facilitate an analysis of surface composition and an understanding of their functionality are proving to be vital in supporting these technological developments."

To download the full white paper, visit www.ceram.com/semiconductor

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