Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > New Cold Field Emission Gun Enhances Ultrahigh Atomic Level Resolution of JEOL ARM200F Aberration-Corrected S/TEM

Abstract:
JEOL USA is pleased to announce that a new Cold Field Emission Gun is now available for the atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM). The ARM200F, introduced in 2009, has set a new benchmark for advanced aberration-corrected S/TEM technology with the highest resolution commercially available in its class.

New Cold Field Emission Gun Enhances Ultrahigh Atomic Level Resolution of JEOL ARM200F Aberration-Corrected S/TEM

Peabody, MA | Posted on July 21st, 2010

Now outfitted with the optional and field-retrofittable Cold FEG, the ARM200F's ultrahigh imaging resolution is guaranteed at 78 picometers with an energy resolution of 0.3 eV. The higher brightness and smaller source size of the Cold FEG produce a smaller, sharper electron probe with a dramatically larger probe current, resulting in enhanced atom-by-atom imaging and chemical analysis. Additionally, the narrow energy spread of the electrons emitted from the Cold FEG enables atomic resolution analysis of EELS fine structures, which can be used to determine such things as electronic properties. Ultra-high vacuum near the electron source assures high stability of the electron probe current while high electrical system stability of 10-7 maintains the very narrow energy spread of the electron probe.

"The addition of a cold FEG to the ARM family adds another arrow to the JEOL quiver for atomic scale imaging and characterization. This enhancement makes it possible to perform sub-Angstrom imaging and atomic column chemistry with accuracy, speed and ease never seen before," said Dr. Thomas Isabell, Director of the TEM Product Division at JEOL USA.

The JEOL ARM200F electron column integrates the Cold FEG, S/TEM and Cs correction in an unparalleled, ultra-stable design. Superior shielding safeguards the ultrahigh-powered optics from airflow, vibration, acoustical, magnetic, electronic, and thermal interferences.

The first ARM200F with Cold FEG in the USA will be installed at Florida State University's Applied Superconductivity Center, housed in the National High Magnetic Field Laboratory.

####

About JEOL
JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.

JEOL USA, Inc., a wholly owned subsidiary of JEOL, Ltd., Japan, was incorporated in the United States in 1962. The company has 13 regional service centers that offer unlimited emergency service and support in the U.S.

For more information, please click here

Contacts:
Editorial Contact:
Patricia Corkum
Marketing Manager
978-536-2273


Pamela Mansfield
JEOL USA
11 Dearborn Road
Peabody, MA 01960
978-536-2309

Copyright © JEOL

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

CiQUS researchers design an artificial nose to detect DNA differentiation with single nucleotide resolution September 18th, 2014

Big Results Require Big Ambitions: Three young UCSB faculty receive CAREER awards from the National Science Foundation September 18th, 2014

FEI Opens New Technology Center in Czech Republic: FEI expands its presence in Brno with the opening of a new, larger facility September 18th, 2014

Biosensors Get a Boost from Graphene Partnership: $5 Million Investment Supports Dozens of Jobs and Development of 300mm Fabrication Process and Wafer Transfer Facility September 18th, 2014

Announcements

Wear-resistant ceramic powder maximises component lifespan in high-stress applications: Innovnano’s nanostructured 3YSZ offers improved tribological performance for manufacturing components September 18th, 2014

IEEE International Electron Devices Meeting To Celebrate 60th Anniversary as The Leading Technical Conference for Advanced Semiconductor Devices September 18th, 2014

FEI Opens New Technology Center in Czech Republic: FEI expands its presence in Brno with the opening of a new, larger facility September 18th, 2014

Biosensors Get a Boost from Graphene Partnership: $5 Million Investment Supports Dozens of Jobs and Development of 300mm Fabrication Process and Wafer Transfer Facility September 18th, 2014

Tools

IEEE International Electron Devices Meeting To Celebrate 60th Anniversary as The Leading Technical Conference for Advanced Semiconductor Devices September 18th, 2014

FEI Opens New Technology Center in Czech Republic: FEI expands its presence in Brno with the opening of a new, larger facility September 18th, 2014

New NPZ100-403 Piezo Stage from nPoint Inc. September 17th, 2014

Researchers Create World’s Largest DNA Origami September 11th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE