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The brand new SU1510 variable pressure SEM utilises many of Hitachi's key VP-SEM technologies in a more compact and affordable instrument, ensuring even more microscopists can benefit from Hitachi's advanced optics and detection systems.
A novel configuration and a host of automated functions ensure that this powerful microscope can produce high quality images and accurate elemental analyses with the minimum of effort. The microscope can be used to image a range of different foodstuffs, including, metals, plastics, composites, foods, textiles, glass and paper, as well as hydrated samples in the life sciences.
This compact and affordable SEM is just 55 cm wide but doesn't compromise on performance or capability. An oil-free, clean turbomolecular pumping system provides fast pump-down and specimen exchange. A new high sensitivity BSE detector, combined with Hitachi's patented ‘Quad-Bias' electron beam control gives superior imaging at low accelerating voltages. Quad-Bias can increase emission current at low accelerating voltage without changing the probe size or compromising filament life-time or resolution. The versatile sample chamber can accept a number of optional accessories, including 2 EDX detectors simultaneously on opposite sides of the chamber, for fast EDX mapping with reduced shadowing effects, cryo systems, EBSD, cathodoluminescence and variable pressure secondary electron detectors.
The SU1510 is extraordinarily easy to operate. ‘One-point advice' software also helps guide less experienced users to the optimum conditions for the sample and preset conditions can be used for various sample types. A host of automatic functions help optimise image quality, with just a single mouse click to set filament saturation, beam alignment, focus, brightness & contrast.
The variable pressure mode enables observation of non-conductive or hydrated samples (utilising the optional coolstage) without the need for sample preparation, such as metal coating.
To further prove that this instrument isn't simply a cut down, basic SEM, the optional 3D-View software allows surface roughness, depth and angle measurements to be made and exported, along with the reconstruction of an interactive 3D image of the sample.
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