Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Int’l Workshop for Scanning Probe Microscopy for Energy Applications — Call for Abstracts

Abstract:
Abstracts for contributed talks and posters are now being accepted for the International Workshop for Scanning Probe Microscopy (SPM) for Energy Applications.

Int’l Workshop for Scanning Probe Microscopy for Energy Applications — Call for Abstracts

Santa Barbara, CA | Posted on June 29th, 2010

Co-organized by Oak Ridge National Laboratory (ORNL) and Asylum Research, the workshop will held at ORNL September 15-17, 2010. Deadline for abstract submission is August 13. The program will include invited and contributed talks covering recent advances in characterization of energy-relevant materials systems using SPM/AFM techniques, as well as the state of the art in energy dissipation and transformation measurements by SPM/AFM. The three-day meeting will also include a poster session, as well as an equipment lab and hands-on tutorials for demonstration of recently developed dynamic and multi-spectral SPM/AFM modes on Asylum's Cypher™ and MFP-3D™ SPM/AFMs. The keynote talk will be on "Local Probing of Carrier Dynamics in Polymer Photovoltaic Materials" by David Ginger of the University of Washington.

Detailed information on abstract submission, agenda, etc. can be found at www.asylumresearch.com/Energy. Abstracts can be submitted on the following topics (but are not limited to):

• Mapping of carrier dynamics and photoinduced behavior of photovoltaic materials
• Micro Raman and NSOM imaging of energy-related materials
• Local ionic and electronic transport in fuel cells and Li-ion batteries
• Energy harvesting by nanostructured piezoelectric and ferroelectric systems
• Novel advances in functional probes - microwave, thermal, and conductive
• Imaging energy dissipation by multimodal and Band Excitation SPM/AFM
• Bias-induced phase transitions

####

About Asylum Research
Asylum Research is the technology leader in atomic force and scanning probe microscopy (AFM/SPM) for both materials and bioscience applications. Founded in 1999, we are an employee owned company dedicated to innovative instrumentation for nanoscience and nanotechnology, with over 250 years combined AFM/SPM experience among our staff. Our instruments are used for a variety of nanoscience applications in material science, physics, polymers, chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on DNA, protein unfolding and polymer elasticity, as well as force measurements for biomaterials, chemical sensing, polymers, colloidal forces, adhesion, and more. Asylum’s product line offers imaging and measurement capabilities for a wide range of samples, including advanced techniques such as electrical characterization (CAFM, KFM, EFM), high voltage piezoresponse force microscopy (PFM), thermal analysis, quantitative nanoindenting, and a wide range of environmental accessories and application-ready modules.

Asylum’s MFP-3D set the standard for AFM technology, with unprecedented precision and flexibility. The MFP-3D is the first AFM with true independent piezo positioning in all three axes, combined with low noise closed-loop feedback sensor technology. The MFP-3D offers both top and bottom sample viewing and easy integration with most commercially-available inverted optical microscopes.

Asylum’s new Cypher AFM is the world’s first new small sample AFM/SPM in over a decade, and sets the new standard as the world’s highest resolution AFM. Cypher provides low-drift closed loop atomic resolution for the most accurate images and measurements possible today, rapid AC imaging with small cantilevers, Spot-On™ automated laser alignment for easy setup, integrated thermal, acoustic and vibration control, and broad support for all major AFM/SPM scanning modes and capabilities.

Asylum Research offers the lowest cost of ownership of any AFM company. Ask us about our industry-best 2-year warranty, our legendary product and applications support, and our exclusive 6-month money-back satisfaction guarantee. We are dedicated to providing the most technically advanced AFMs for researchers who want to take their experiments to the next level. Asylum Research also distributes third party cantilevers from Olympus, Nanoworld/Nanosensors, and our own MFM and iDrive™ tips.

About the Center for Nanophase Materials Sciences at Oak Ridge National Laboratory
The Center for Nanophase Materials Sciences at Oak Ridge National Laboratory is one of the five DOE Nanoscale Science Research Centers (NSRCs), premier national user facilities for interdisciplinary research at the nanoscale, supported by the DOE Office of Science. Together the NSRCs comprise a suite of complementary facilities that provide researchers with state-of-the-art capabilities to fabricate, process, characterize and model nanoscale materials, and constitute the largest infrastructure investment of the National Nanotechnology Initiative. The NSRCs are located at DOE's Argonne, Brookhaven, Lawrence Berkeley, Oak Ridge, Sandia and Los Alamos National Laboratories. For more information about the DOE NSRCs, please visit nano.energy.gov.

For more information, please click here

Contacts:
Terry Mehr, Director of Marketing Communications, or Monteith Heaton, EVP, Marketing/Business Development, Asylum Research, 6310 Hollister Avenue, Santa Barbara, CA 93117
805-696-6466x224/227

Copyright © Asylum Research

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

East China University of Science and Technology Purchases Nanonex Advanced Nanoimprint Tool NX-B200 July 30th, 2014

Watching Schrödinger's cat die (or come to life): Steering quantum evolution & using probes to conduct continuous error correction in quantum computers July 30th, 2014

From Narrow to Broad July 30th, 2014

FLAG-ERA and TNT2014 join efforts: Graphene Networking at its higher level in Barcelona: Encourage the participation in a joint transnational call July 30th, 2014

Academic/Education

University of Manchester selects Anasys AFM-IR for coatings and corrosion research July 30th, 2014

Haydale Announces Collaboration Agreement with Swansea University’s Welsh Centre for Printing and Coatings (WCPC) July 12th, 2014

STFC takes delivery of the 100th Hitachi Tabletop SEM in the UK July 3rd, 2014

Innovation Management and the Emergence of the Nanobiotechnology Industry July 1st, 2014

Tools

New imaging agent provides better picture of the gut July 30th, 2014

Nanometrics Reports Second Quarter 2014 Financial Results July 30th, 2014

New Objective Focusing Nanopositioner from nPoint July 30th, 2014

University of Manchester selects Anasys AFM-IR for coatings and corrosion research July 30th, 2014

Events/Classes

FLAG-ERA and TNT2014 join efforts: Graphene Networking at its higher level in Barcelona: Encourage the participation in a joint transnational call July 30th, 2014

FEI Unveils New Solutions for Faster Time-to-Analysis in Metals Research July 30th, 2014

WITec to host the 11th Confocal Raman Imaging Symposium from September 29th - October 1st in Ulm, Germany July 28th, 2014

FEI adds Phase Plate Technology and Titan Halo TEM to its Structural Biology Product Portfolio: New solutions provide the high-quality imaging and contrast necessary to analyze the 3D structure of molecules and molecular complexes July 28th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE