Nanotechnology Now







Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > Thin Film Thickness Measurements With the New 20/20 Film™ From CRAIC Technologies

Abstract:
The 20/20 Film™ is designed to measure thin film thickness of microscopic sample areas

Thin Film Thickness Measurements With the New 20/20 Film™ From CRAIC Technologies

Los Angeles, CA | Posted on May 22nd, 2010

CRAIC Technologies, the leading manufacturer of UV-visible-NIR microscopes and microspectrometers, is pleased to announce the 20/20 Film™ microspectrophotometer. The 20/20 Film™ solution is designed to measure the thickness of thin films of even sub-micron sampling areas rapidly and non-destructively. Able to analyze films of many materials on both transparent and opaque substrates, the 20/20 Film™ enables the user to determine thin film thickness on everything from semiconductors to MEMS devices to hard disk drives to flat panel displays. When combined with CRAIC Technologies proprietary contamination imaging capabilities, the 20/20 Film™ represents a major step forward in capabilities and flexibility for the semiconductor, flat panel display and the hard disk drive markets.

"Many of our customers want to measure the thickness of thin films of smaller and smaller sampling areas for rapid quality control of their products. The 20/20 Film™ microspectrophotometer was built in response to customer requests for a powerful, flexible film thickness tool that can measure sub-micron areas on both transparent and opaque substrates." says Dr. Paul Martin, President of CRAIC Technologies. "This tool can also do a lot more than just measure thin film thickness. It can also be configured for contamination analysis, concentration and relative intensity mapping and much more."

The complete 20/20 Film™ solution combines advanced microspectroscopy with sophisticated software to enable the user to measure film thickness by either transmission or reflectance of many types of films and substrates. Due to the flexibility of the CRAIC Technologies design, sampling areas can range from over 100 microns across to less than a micron. Designed for the production environment, it incorporates a number of easily modified processing recipes, the ability to create new film recipes and sophisticated tools for analyzing data as well as options for automation including touchscreen control. The ability to directly image and analyze films with ultraviolet, visible and NIR microscopy can also be added to this instrument.

For more information about 20/20 Film™ microspectrophotometer and its applications, visit www.microspectra.com.

####

About CRAIC Technologies
CRAIC Technologies, Inc. is a global technology leader focused microimaging and microspectroscopy in the ultraviolet, visible and near-infrared regions. CRAIC Technologies creates innovative solutions, with the very best in customer support, by listening to our customers and implementing solutions that integrate operational excellence and technology expertise. CRAIC Technologies provides solutions for customers in forensic sciences, health sciences, semiconductor, geology, nanotechnology and materials science markets whose applications demand accuracy, precision, speed and the best in customer support.

For more information, please click here

Contacts:
310-573-8180
Fax: 310-573-8182

Copyright © CRAIC Technologies

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

onic Present breakthrough in CMOS-based Transceivers for mm-Wave Radar Systems March 1st, 2015

Graphene Shows Promise In Eradication Of Stem Cancer Cells March 1st, 2015

Novel Method to Determine Optical Purity of Drug Components March 1st, 2015

Scientific breakthrough in rechargeable batteries: Researchers from Singapore and Québec Team Up to Develop Next-Generation Materials to Power Electronic Devices and Electric Vehicles February 28th, 2015

Display technology/LEDs/SS Lighting/OLEDs

New nanowire structure absorbs light efficiently: Dual-type nanowire arrays can be used in applications such as LEDs and solar cells February 25th, 2015

QD Vision Named Edison Award Finalist for Innovative Color IQ™ Quantum Dot Technology February 23rd, 2015

JunPus launched high-performance thermal grease for LED February 20th, 2015

Thin films

Researchers enable solar cells to use more sunlight February 25th, 2015

Detecting defects at the nanoscale will profit solar panel production: Researcher Mohamed Elrawemi develops new technologies for defects in thin films, vital in products as printed electronics and solar panels February 24th, 2015

MEMS

MEMS/Sensors Drive IoT/E Innovation in Europe: MEMS Executive Congress Europe Speakers Explore Internet of Things/Everything in Automotive, Consumer, Industrial Markets, 9-10, March in Copenhagen February 9th, 2015

STMicroelectronics Leads European Research Project to Develop Next-Generation Optical MEMS: Extension to a project launched in 2013 builds on current efforts to enable technologies for next-generation applications February 4th, 2015

Entegris Launches Dispense System Optimized for 3D and MEMS Applications: New IntelliGen® MV system delivers process efficiencies and defect reduction in dispensing mid-viscosity fluids February 3rd, 2015

CNSE's Smart System Technology & Commercialization Center Successfully Recertifies as ISO 9001:2008 January 12th, 2015

Chip Technology

onic Present breakthrough in CMOS-based Transceivers for mm-Wave Radar Systems March 1st, 2015

New nanowire structure absorbs light efficiently: Dual-type nanowire arrays can be used in applications such as LEDs and solar cells February 25th, 2015

SUNY Poly CNSE Researchers and Corporate Partners to Present Forty Papers at Globally Recognized Lithography Conference: SUNY Poly CNSE Research Group Awarded Both ‘Best Research Paper’ and ‘Best Research Poster’ at SPIE Advanced Lithography 2015 forum February 25th, 2015

Ultra-thin nanowires can trap electron 'twisters' that disrupt superconductors February 24th, 2015

Memory Technology

Insight into inner magnetic layers: Measurements at BESSY II have shown how spin filters forming within magnetic sandwiches influence tunnel magnetoresistance -- results that can help in designing spintronic component- February 17th, 2015

Dance of the nanovortices February 2nd, 2015

Nano - "Green" metal oxides ... January 13th, 2015

Quantum optical hard drive breakthrough January 8th, 2015

Nanoelectronics

New nanowire structure absorbs light efficiently: Dual-type nanowire arrays can be used in applications such as LEDs and solar cells February 25th, 2015

Ultra-thin nanowires can trap electron 'twisters' that disrupt superconductors February 24th, 2015

Improved fire detection with new ultra-sensitive, ultraviolet light sensor February 17th, 2015

Nanotechnology facility planned in Lund, Sweden: A production facility for start-ups in the field of nanotechnology may be built in the Science Village in Lund, a world-class research and innovation village that is also home to ESS, the European Spallation Source February 15th, 2015

Announcements

onic Present breakthrough in CMOS-based Transceivers for mm-Wave Radar Systems March 1st, 2015

Graphene Shows Promise In Eradication Of Stem Cancer Cells March 1st, 2015

Novel Method to Determine Optical Purity of Drug Components March 1st, 2015

Scientific breakthrough in rechargeable batteries: Researchers from Singapore and Québec Team Up to Develop Next-Generation Materials to Power Electronic Devices and Electric Vehicles February 28th, 2015

Tools

Hiden CATLAB Microreactor System at ARABLAB 2015 | Visit us on Booth 1011 February 26th, 2015

Renishaw and Bruker team up for a workshop on TERS and co-localised AFM Raman February 26th, 2015

Maximum Precision in 3D Printing: New complete solution makes additive manufacturing standard for microfabrication February 26th, 2015

Real-time observation of bond formation by using femtosecond X-ray liquidography February 26th, 2015

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2015 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE