Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > New Keithley Online Tutorial Provides Information On Ultra-Fast I-V Measurement Applications

Abstract:
Keithley Instruments, Inc. (KEI 6.52, +0.03, +0.46%), a world leader in advanced electrical test instruments and systems, has created an interactive applications overview that provides instruction and insight into a variety of semiconductor measurement applications that require ultra-fast I-V measurements. The new overview, titled "Ultra-Fast I-V Applications," can be viewed online at www.keithley.com/data?asset=52837.

New Keithley Online Tutorial Provides Information On Ultra-Fast I-V Measurement Applications

Cleveland, OH | Posted on March 24th, 2010

Ultra-fast I-V sourcing and measurement have become increasingly critical capabilities for many semiconductor technologies. Using pulsed I-V signals to characterize devices rather than DC signals makes it possible to study or eliminate the effects of self-heating (joule heating) or to minimize current drifting in measurements due to trapped charge.

The applications overview includes sections on integrated high speed sourcing and measurement; a discussion of voltage, current, and timing parameter ranges; a description of the built-in interactive software provided in Keithley's ultra-fast I-V test solution; and a detailed discussion of ultra-fast I-V applications. Built-in links provide easy navigation, and many of the schematics and other diagrams enlarge automatically when scrolled over to allow easier reading.

Ultra-fast I-V testing is appropriate for a growing range of semiconductor test applications, including:

-- CMOS device characterization (charge pumping, self-heating, and charge trapping)

-- NBTI and PBTI characterization, modeling, and monitoring

-- Testing non-volatile memory devices such as PCRAMs

-- Testing of compound semiconductor devices and materials (laser diodes and thermal impedance measurements), and

-- Characterization of nanotechnology, MEMs devices, and solar cells.

####

About Keithley Instruments
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.

Products and company names listed are trademarks or trade names of their respective companies.

For more information, please click here

Contacts:
Telephone:
800-688-9951
440-248-0400
FAX: 440-248-6168


Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891

Copyright © Keithley Instruments

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Novel 'converter' heralds breakthrough in ultra-fast data processing at nanoscale: Invention bagged four patents and could potentially make microprocessor chips work 1,000 times faster October 20th, 2017

Strange but true: turning a material upside down can sometimes make it softer October 20th, 2017

Leti Coordinating Project to Develop Innovative Drivetrains for 3rd-generation Electric Vehicles: CEA Techís Contribution Includes Litenís Knowhow in Magnetic Materials and Simulation And Letiís Expertise in Wide-bandgap Semiconductors October 20th, 2017

MIPT scientists revisit optical constants of ultrathin gold films October 20th, 2017

Chip Technology

Novel 'converter' heralds breakthrough in ultra-fast data processing at nanoscale: Invention bagged four patents and could potentially make microprocessor chips work 1,000 times faster October 20th, 2017

MIPT scientists revisit optical constants of ultrathin gold films October 20th, 2017

Bringing the atomic world into full color: Researchers turn atomic force microscope measurements into color images October 19th, 2017

Spin current detection in quantum materials unlocks potential for alternative electronics October 15th, 2017

Nanoelectronics

Nanometrics Announces Preliminary Results for the Third Quarter of 2017: Quarterly Results Impacted by Delays in Revenue Recognition on Multiple Systems into Japan October 12th, 2017

Seeing the next dimension of computer chips: Researchers image perfectly smooth side-surfaces of 3-D silicon crystals with a scanning tunneling microscope, paving the way for smaller and faster computing devices October 11th, 2017

Columbia engineers invent breakthrough millimeter-wave circulator IC October 6th, 2017

Tungsten offers nano-interconnects a path of least resistance: Crystalline tungsten shows insight and promise in addressing the challenges of electrical interconnects that have high resistivity at the nanoscale October 4th, 2017

Announcements

Novel 'converter' heralds breakthrough in ultra-fast data processing at nanoscale: Invention bagged four patents and could potentially make microprocessor chips work 1,000 times faster October 20th, 2017

Strange but true: turning a material upside down can sometimes make it softer October 20th, 2017

Leti Coordinating Project to Develop Innovative Drivetrains for 3rd-generation Electric Vehicles: CEA Techís Contribution Includes Litenís Knowhow in Magnetic Materials and Simulation And Letiís Expertise in Wide-bandgap Semiconductors October 20th, 2017

MIPT scientists revisit optical constants of ultrathin gold films October 20th, 2017

Tools

Bringing the atomic world into full color: Researchers turn atomic force microscope measurements into color images October 19th, 2017

Nanometrics Announces Preliminary Results for the Third Quarter of 2017: Quarterly Results Impacted by Delays in Revenue Recognition on Multiple Systems into Japan October 12th, 2017

Seeing the next dimension of computer chips: Researchers image perfectly smooth side-surfaces of 3-D silicon crystals with a scanning tunneling microscope, paving the way for smaller and faster computing devices October 11th, 2017

Quorum announces new customer support and demonstration facilities for users worldwide October 10th, 2017

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project