- About Us
- Nano-Social Network
- Nano Consulting
- My Account
Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM) announces its AFM in Biology Class to be held April 28-30 in Santa Barbara, California.
The class is open to all Atomic Force Microscopy users that want to increase their knowledge of AFM in biology and life sciences. This world-renowned class, now in its 11th session, combines lecture with hands-on sessions for personal instruction and interaction with the Asylum technical staff.
"We cover all the essential AFM topics that biologists need and want to learn aboutó from sample preparation to advanced imaging and force measurements," said Sophia Hohlbauch, Applications Scientist. "The breadth of AFM experience of our staff is unsurpassed -- both our President and CEO participate and class attendees have access to all of our scientific staff. The class is fun, with a good mix of lecture and equipment time."
Commented former student Dr. Xiaohui (Frank) Zhang, Chinese Academy of Sciences, Shanghai, "It was such a wonderful experience at AR! Many thanks again for all the help and courtesy extended to me. I will for sure send my students to future Asylum Bio classes."
Added Yael Dror, Oxford University "You all did a remarkable job in all areas! I am especially grateful for your sincere willingness to help each of us and the time and energy you spent with me to help, explain, guide and think together about my results. But above all you shared with us your love of the AFM, which couldn't possibly be ignored, and gave us an insight into a very special company."
The three day course is held twice a year. Topics include sample prep, force measurements, and imaging DNA, proteins, lipids and live cells. The Asylum Research MFP-3Dô AFM is used exclusively for the hands-on sessions. Class size is limited.
A PDF of the registration form can be downloaded from the Asylum Research web site at www.AsylumResearch.com/News/BioClassRegistration.pdf.
About Asylum Research
Asylum Research is the technology leader in atomic force and scanning probe microscopy (AFM/SPM) for both materials and bioscience applications. Founded in 1999, we are an employee owned company dedicated to innovative instrumentation for nanoscience and nanotechnology, with over 250 years combined AFM/SPM experience among our staff. Our instruments are used for a variety of nanoscience applications in material science, physics, polymers, chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on DNA, protein unfolding and polymer elasticity, as well as force measurements for biomaterials, chemical sensing, polymers, colloidal forces, adhesion, and more. Asylumís product line offers imaging and measurement capabilities for a wide range of samples, including advanced techniques such as electrical characterization (CAFM, KFM, EFM), high voltage piezoresponse force microscopy (PFM), thermal analysis, quantitative nanoindenting, and a wide range of environmental accessories and application-ready modules.
For more information, please click here
Terry Mehr, Director of Marketing Communications, or Monteith Heaton, EVP, Marketing/Business Development, Asylum Research, 6310 Hollister Avenue, Santa Barbara, CA 93117,
Copyright © Asylum ResearchIf you have a comment, please Contact us.
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
|Related News Press|
News and information
Oxford Nanoimaging report on how the Nanoimager, a desktop microscope delivering single molecule, super-resolution performance, is being applied at the MRC Centre for Molecular Bacteriology & Infection November 22nd, 2016
New Agricultural Research Center Debuts at UCF October 12th, 2016
Distinguishing truth under the surface: electrostatic or mechanic December 31st, 2016
Nanomechanics Inc. Continues Growth in Revenue and Market Penetration: Leading nanoindentation company reports continued growth in revenues and distribution channels on national and international scales December 27th, 2016