Nanotechnology Now





Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > BrightView Unveils In-line Process Control and Optimization Tool for Thin-Film Solar Cell Manufacturing

Abstract:
Solution Improves the Efficiency, Durability and Bankability of Photovoltaic Panels

BrightView Unveils In-line Process Control and Optimization Tool for Thin-Film Solar Cell Manufacturing

Israel | Posted on January 19th, 2010

BrightView Systems today unveiled the InSight M Series, the world's first in-line process control and optimization tool developed specifically to address the challenges faced by thin-film solar cell manufacturers. The Wide Area Metrology (WAM) system provides continuous monitoring and whole-panel mapping of critical material and process parameters at full production throughput and for 100% of manufactured panels. Easily integrated at key steps in any thin-film production line including single-junction and multi-junction silicon, the system allows panel producers to implement process optimization solutions that enhance average panel efficiency, improve line productivity and verify full compliance with the strictest durability and quality requirements.

The system architecture allows for easy integration into the design of new production lines or insertion into existing ones, including Gen 5 and Gen 8.5 lines. With its innovative True Cell™ technology, the InSight is able to measure and map critical layers on-the-fly within the actual product stack, providing continuous process fingerprinting that drives production improvement, excursion detection and line productivity.

The InSight M Series represents a systems approach to enhancing thin-film production. The BrightView tool is complemented by an intuitive operating interface and state-of-the-art software modules that allow easy implementation and customization of intelligent line monitoring recipes, spanning all production stages, from process integration, through pilot and multi-location volume manufacturing. The methodology provides customers with 24/7 visibility into their manufacturing process, allowing them to realize the value of in-line monitoring within days of InSight installation.

"By combining an in-line metrology technology and matching spatial data analysis solutions that are driven by in-depth knowledge of thin-film PV process and volume production, the InSight M Series is the integral solution for improving thin-film PV panel efficiency and long-term reliability," said Benny Shoham, CEO, BrightView Systems. "Thin-film manufacturers are now able to differentiate their products, and optimize their production lines in order to boost productivity, and profitability."

####

About BrightView Systems
BrightView delivers comprehensive process control and optimization solutions dedicated to thin-film solar panel manufacturing. With a profound understanding of photovoltaic cell physics, process development and mass production, BrightView's core technologies span in-line metrology, imaging and unique data analysis packages specifically designed for thin-film solar manufacturing. BrightView solutions improve the efficiency, durability and bankability of panels and provide integral solutions for improving thin-film PV productivity and profitability.

For more information, please click here

Contacts:
Sharon Hess
Marketing Director
tel: +972 3 929 1400 x443
mobile: +972 544 848 828


Copyright © BrightView Systems

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Basel physicists develop efficient method of signal transmission from nanocomponents May 23rd, 2015

This Slinky lookalike 'hyperlens' helps us see tiny objects: The photonics advancement could improve early cancer detection, nanoelectronics manufacturing and scientists' ability to observe single molecules May 23rd, 2015

Visualizing How Radiation Bombardment Boosts Superconductivity: Atomic-level flyovers show how impact sites of high-energy ions pin potentially disruptive vortices to keep high-current superconductivity flowing May 23rd, 2015

Conversion of Greenhouse Gases to Syngas in Presence of Nanocatalysts in Iran May 22nd, 2015

Thin films

Sandia researchers first to measure thermoelectric behavior by 'Tinkertoy' materials May 20th, 2015

Defects can 'Hulk-up' materials: Berkeley lab study shows properly managed damage can boost material thermoelectric performances May 20th, 2015

Efficiency record for black silicon solar cells jumps to 22.1 percent: Aalto University's researchers improved their previous record by over 3 absolute percents in cooperation with Universitat Politècnica de Catalunya May 18th, 2015

Science and Technology of Advanced Materials (STAM): Reported successes and failures aid hot pursuit of superconductivity May 15th, 2015

Announcements

Basel physicists develop efficient method of signal transmission from nanocomponents May 23rd, 2015

This Slinky lookalike 'hyperlens' helps us see tiny objects: The photonics advancement could improve early cancer detection, nanoelectronics manufacturing and scientists' ability to observe single molecules May 23rd, 2015

Visualizing How Radiation Bombardment Boosts Superconductivity: Atomic-level flyovers show how impact sites of high-energy ions pin potentially disruptive vortices to keep high-current superconductivity flowing May 23rd, 2015

New Antibacterial Wound Dressing in Iran Can Display Replacement Time May 22nd, 2015

Tools

This Slinky lookalike 'hyperlens' helps us see tiny objects: The photonics advancement could improve early cancer detection, nanoelectronics manufacturing and scientists' ability to observe single molecules May 23rd, 2015

Nanometrics Announces Live Webcast of Upcoming Investor and Analyst Day May 20th, 2015

Taking control of light emission: Researchers find a way of tuning light waves by pairing 2 exotic 2-D materials May 20th, 2015

DELMIC announces a workshop hosted by Phenom World on Integrated CLEM to be held on Wednesday June 24th at the Francis Crick Institute (Lincoln Inn Fields Laboratory). May 19th, 2015

Industrial

Wearables may get boost from boron-infused graphene: Rice U. researchers flex muscle of laser-written microsupercapacitors May 18th, 2015

ORNL demonstrates first large-scale graphene fabrication May 14th, 2015

Nano-policing pollution May 13th, 2015

ORNL superhydrophobic glass coating offers clear benefits May 11th, 2015

Solar/Photovoltaic

Efficiency record for black silicon solar cells jumps to 22.1 percent: Aalto University's researchers improved their previous record by over 3 absolute percents in cooperation with Universitat Politècnica de Catalunya May 18th, 2015

Wearables may get boost from boron-infused graphene: Rice U. researchers flex muscle of laser-written microsupercapacitors May 18th, 2015

Random nanowire configurations increase conductivity over heavily ordered configurations May 16th, 2015

ORNL demonstrates first large-scale graphene fabrication May 14th, 2015

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project