Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Nanometrics Announces Multi-System Integrated Metrology Order from Leading Foundry: Optical CD Solution for 22nm Gate Etch Control includes Integrated Systems and Complete NanoCD Suite

Abstract:
Nanometrics Incorporated (Nasdaq: NANO), a leading supplier of advanced process control metrology systems used primarily in the manufacturing and packaging of semiconductors, solar photovoltaics and high-brightness LEDs, today announced a multi-system order from a leading semiconductor foundry for its Integrated Metrology (IM) and NanoCD™ suite solutions. The systems will be delivered in the fourth quarter of this year for optical critical dimension (OCD) metrology on 22nm gate etch applications.

Nanometrics Announces Multi-System Integrated Metrology Order from Leading Foundry: Optical CD Solution for 22nm Gate Etch Control includes Integrated Systems and Complete NanoCD Suite

Milpitas, CA | Posted on November 2nd, 2009

"Nanometrics' IM systems and our industry leading NanoCD suite were chosen by a leading foundry partner to support advanced 22nm gate patterning process control," commented Steve Bradley, Director of Nanometrics' Integrated Metrology Business Unit. "The IM systems will be fully integrated onto advanced etch process systems from two leading etch equipment suppliers at multiple steps in the gate formation loop. The customer will deploy our 9010T IM systems combined with our NanoDiffract™ OCD software and NanoGen™ cluster computing hardware, enabling complex 3D gate metrology and rigorous real-time analysis to allow rapid information turns in a dynamic technology development factory."

Beyond etch integrations, Nanometrics' IM solutions are available in configurations to support control of other key fab processes, including CMP, lithography and CVD for both thin film and OCD applications. Nanometrics' IM can also be combined with Nanometrics' Lynx platform to provide superior measurement capability at a low cost of ownership. Nanometrics' customers can deploy integrated metrology in conjunction with standalone systems, the Lynx Cluster Metrology Platform and the NanoCD suite for a complete fab-wide metrology process control solution.

####

About Nanometrics Incorporated
Nanometrics is a leader in the design, manufacture and marketing of high-performance process control metrology systems used primarily in the manufacturing of semiconductors, advanced wafer-scale packaging, solar photovoltaics and high-brightness LEDs, as well as by customers in the silicon wafer and data storage industries. Nanometrics standalone and integrated metrology systems measure various thin film properties, critical dimensions, overlay control, topography, and optical, electrical and material properties, including the structural composition of silicon, compound semiconductor and photovoltaic devices, during various steps of the manufacturing process, from front end of line substrate manufacturing through die preparation for advanced packaging. These systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Market under the symbol NANO.

For more information, please click here

Contacts:
Company Contact:
Kevin Heidrich
Nanometrics Incorporated
408.545.6000
408.317.1346 fax


Investor Relations Contact:
Claire McAdams
Headgate Partners LLC
530.265.9899
530.265.9699 fax

Copyright © Nanometrics Incorporated

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Harris & Harris Group to Host Conference Call on Second-Quarter 2014 Financial Results on August 15, 2014 July 23rd, 2014

UCF Nanotech Spinout Developing Revolutionary Battery Technology: Power the Next Generation of Electronics with Carbon July 23rd, 2014

Deadline Announced for Registration in 7th Int'l Nanotechnology Festival in Iran July 23rd, 2014

A Crystal Wedding in the Nanocosmos July 23rd, 2014

Chip Technology

A Crystal Wedding in the Nanocosmos July 23rd, 2014

Nanometrics Announces Upcoming Investor Events July 22nd, 2014

Penn Study: Understanding Graphene’s Electrical Properties on an Atomic Level July 22nd, 2014

NUS scientists use low cost technique to improve properties and functions of nanomaterials: By 'drawing' micropatterns on nanomaterials using a focused laser beam, scientists could modify properties of nanomaterials for effective applications in photonic and optoelectric applicat July 22nd, 2014

Announcements

Harris & Harris Group to Host Conference Call on Second-Quarter 2014 Financial Results on August 15, 2014 July 23rd, 2014

UCF Nanotech Spinout Developing Revolutionary Battery Technology: Power the Next Generation of Electronics with Carbon July 23rd, 2014

Deadline Announced for Registration in 7th Int'l Nanotechnology Festival in Iran July 23rd, 2014

A Crystal Wedding in the Nanocosmos July 23rd, 2014

Tools

Hysitron is Awarded TWO R&D 100 Awards for Highly Innovative Technology Developments in the Areas of Extreme Environments and Biological Mechanical Property Testing July 23rd, 2014

EPFL Research on the use of AFM based nanoscale IR spectroscopy for the study of single amyloid molecules wins poster competition at Swiss Physics Society meeting July 22nd, 2014

The Hiden EQP Plasma Diagnostic with on-board MCA July 22nd, 2014

Nanometrics Announces Upcoming Investor Events July 22nd, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE